F. Bas, S. Alcaide, Ruben Lorenzo, Guillem Cabo, Guillermo Gil, Oriol Sala, Fabio Mazzocchetti, David Trilla, J. Abella
{"title":"SafeDE: a flexible Diversity Enforcement hardware module for light-lockstepping","authors":"F. Bas, S. Alcaide, Ruben Lorenzo, Guillem Cabo, Guillermo Gil, Oriol Sala, Fabio Mazzocchetti, David Trilla, J. Abella","doi":"10.1109/IOLTS52814.2021.9486715","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486715","url":null,"abstract":"Safety-related systems, such as those in automotive, avionics and space, impose the existence of appropriate safety measures to meet the safety requirements of the system. In the case of the highest integrity level functionalities (e.g. ASIL-D in automotive), diverse redundancy must be deployed to avoid unreasonable risk of a single fault leading the system to a failure (e.g. using lockstepped cores). However, existing lockstep solutions are either (1) highly intrusive and inflexible coupling two cores with hardware means, or (2) costly in terms of execution time and monitoring if a software monitor thread checks that cores running redundantly preserve sufficient staggering. This paper presents SafeDE, a Diversity Enforcement hardware module providing light-lockstep support by means of a non-intrusive and flexible hardware module that preserves staggering across cores running redundant threads, thus bringing time diversity. SafeDE reconciles the lightness and flexibility of software-only solutions, even allowing using the cores without any lockstepping, as well as the tighter staggering of hardware-only solutions that allow using staggering values of few cycles, instead of hundreds of microseconds, as for software-only solutions. Our integration of SafeDE in a RISC-V FPGA-based space multicore from Cobham Gaisler shows that staggering is effectively preserved, and SafeDE overheads are negligible in terms of area and performance due to staggering.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123290866","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IOLTS 2021 Organizing Committee","authors":"","doi":"10.1109/iolts52814.2021.9486683","DOIUrl":"https://doi.org/10.1109/iolts52814.2021.9486683","url":null,"abstract":"","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125669472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Integrating an Interconnect BIST with Crosstalk Avoidance Hardware","authors":"Mahsa Akhsham, Z. Navabi","doi":"10.1109/IOLTS52814.2021.9486702","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486702","url":null,"abstract":"An online interconnect BIST for detecting and avoiding interconnect faults is proposed in this paper. This BIST structure is built upon a new shielding method, the required hardware of which is reutilized in transmitting redundant test data across the interconnect for testing it. Together, BIST and the shielding parts, provide an integrated and novel interconnect testing and crosstalk fault-avoidance platform that share the same hardware. Our proposed integrated technique is modeled in SPICE to evaluate its functionality in terms of avoiding crosstalk faults, and online detection of those that cannot be avoided. We show that faults due to crosstalk are reduced by 49%, and those that still remain are 100% detected.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134304769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Saraswatula, Santosh Yachareni, Shidong Zhou, Narendra Pulipati, Joy Chen, Teja Masina
{"title":"Robust Adaptive Read Scheme for 7nm Configuration SRAMs","authors":"S. Saraswatula, Santosh Yachareni, Shidong Zhou, Narendra Pulipati, Joy Chen, Teja Masina","doi":"10.1109/IOLTS52814.2021.9486712","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486712","url":null,"abstract":"This paper presents a new Adaptive Read scheme for Configuration SRAMs with a feedback mechanism to eliminate Read-Disturb, enhancing Read Margin, yield and performance. The proposed scheme is implemented on TSMC 7nm FinFETs for Configuration SRAMs in Xilinx FPGAs, and this idea is applicable to any distributed SRAM structures. The design has an intrinsic dynamic feedback mechanism to adjust the read address voltage effectively, based on the process, voltage and temperature (PVT), by using a special replica memory cell that emulates actual memory cells. The proposed Op-Amp based design with a memory cell emulating circuit in the negative feedback is shown to be working on silicon, which tunes pass-gate (PG) address voltage during read, with 2.7x improvement in read margin, and also avoids read-disturb.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130488669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Oriol Sala, S. Alcaide, Guillem Cabo, F. Bas, Ruben Lorenzo, Pedro Benedicte, David Trilla, Guillermo Gil, Fabio Mazzocchetti, J. Abella
{"title":"SafeTI: a Hardware Traffic Injector for MPSoC Functional and Timing Validation","authors":"Oriol Sala, S. Alcaide, Guillem Cabo, F. Bas, Ruben Lorenzo, Pedro Benedicte, David Trilla, Guillermo Gil, Fabio Mazzocchetti, J. Abella","doi":"10.1109/IOLTS52814.2021.9486689","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486689","url":null,"abstract":"Functional and timing validation of safety-related MPSoCs requires testing specific traffic patterns in the on-chip interconnects. Generally, testing needs to be performed by using software tests whose degree of control on the traffic generated is indirect, and limited to behavior that can be triggered by software, thus often unable to produce traffic generated by peripherals. Therefore, untested traffic scenarios can be abundant and, to a large extent, it is hard to know what traffic scenarios have been effectively tested. This paper presents the safe traffic injector, SafeTI, which allows injecting programmable traffic in AMBA AHB interconnects with high flexibility and degree of control, thus easing achieving high coverage in terms of traffic scenarios tested, and mitigating the uncertainty due to the difficulties to relate software tests with actual traffic scenarios tested. We also integrate successfully the SafeTI in an industrial MPSoC for the space domain proving the effectiveness of the proposed traffic injector.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129782833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Memristive Architecture for Process Variation Aware Gas Sensing and Logic Operations","authors":"S. Khandelwal, M. Ottavi, E. Martinelli, A. Jabir","doi":"10.1109/IOLTS52814.2021.9486691","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486691","url":null,"abstract":"We propose novel memristive gas sensor architectures that can significantly reduce process and parametric variations in a predictable manner, while improving accuracy and overall power consumption. The proposed architecture can also be configured to realize multifunction logic operations as well as Complementary Resistive Switch with low hardware overhead in the absence of gasses. Our results show that the proposed architecture is significantly immune to process and parametric effects compared to a single sensor and almost unaffected by wire resistance, while offering much higher accuracy and much lower power consumption compared to existing techniques.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121059488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Appello, H. H. Chen, M. Sauer, I. Polian, P. Bernardi, M. Reorda
{"title":"System-Level Test: State of the Art and Challenges","authors":"D. Appello, H. H. Chen, M. Sauer, I. Polian, P. Bernardi, M. Reorda","doi":"10.1109/IOLTS52814.2021.9486708","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486708","url":null,"abstract":"System-level test (SLT) is gaining in importance in modern test flows. This paper summarizes recent industrial findings from three companies and discusses some of the still open questions. The first two reports focus on the optimization potentials due to defect coverage overlaps between SLT and other test insertions. Results observed on approximately 20 million manufactured 28nm and 40nm automotive system-on-chip (SoC) designs are reported. Costs and benefits of SLT are discussed and the potentials of a test results analytics platform are identified. The third report explores the role of marginalities among SLT fails. The post-silicon investigation of a CPU block in a 7nm 5G mobile SoC product aims at achieving a better understanding, whose fails are due to random variations versus systematic factors.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"244 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115854218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Saha, Adewale Adetomi, X. Zhai, Server Kasap, Shoaib Ehsan, T. Arslan, K. Mcdonald-Maier
{"title":"EnSuRe: Energy & Accuracy Aware Fault-tolerant Scheduling on Real-time Heterogeneous Systems","authors":"S. Saha, Adewale Adetomi, X. Zhai, Server Kasap, Shoaib Ehsan, T. Arslan, K. Mcdonald-Maier","doi":"10.1109/IOLTS52814.2021.9486707","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486707","url":null,"abstract":"This paper proposes an energy efficient real-time scheduling strategy called EnSuRe, which (i) executes real-time tasks on low power consuming primary processors to enhance the system accuracy by maintaining the deadline and (ii) provides reliability against a fixed number of transient faults by selectively executing backup tasks on high power consuming backup processor. Simulation results reveal that EnSuRe consumes nearly 25% less energy, compared to existing techniques, while satisfying the fault tolerance requirements. EnSuRe is also able to achieve 75% system accuracy with 50% system utilisation. Further, the obtained simulation outcomes are validated on benchmark tasks via a fault injection framework on Xilinx ZYNQ APSoC heterogeneous dual core platform.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122142368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dynamic Verification of Approximate Computing Circuits using Coverage-based Grey-box Fuzzing","authors":"Kazuki Yoshisue, Yutaka Masuda, T. Ishihara","doi":"10.1109/IOLTS52814.2021.9486690","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486690","url":null,"abstract":"Approximate computing (AC) has recently emerged as a promising approach to the energy-efficient design of digital systems. For realizing the practical AC design, we need to verify whether the designed circuit can operate correctly under various operating conditions. Namely, the verification needs to efficiently find fatal logic errors or timing errors that violate the constraint of computational quality. This paper proposes a novel dynamic verification methodology of the AC circuit. The key idea of the proposed methodology is to incorporate a quality assessment capability into the Coverage-based Grey-box Fuzzing (CGF). CGF is one of the most promising techniques in the research field of software security testing. By repeating (1) mutation of test patterns, (2) execution of the program under test (PUT), and (3) aggregation of coverage information and feedback to the next test pattern generation, CGF can explore the verification space quickly and automatically. On the other hand, CGF originally cannot consider the computational quality by itself. For overcoming this quality unawareness in CGF, the proposed methodology additionally embeds the Design Under Test (DUT) mechanisms into the calculation part of computational quality. Thanks to the integration of CGF and DUT mechanism, the proposed framework realizes the quality-aware feedback loop in CGF and thus quickly enhances the verification coverage for test patterns that violate the quality constraint. In this work, we quantitatively compared the verification coverage of the approximate arithmetic circuits between the proposed methodology and the random test. In a case study of an approximate multiply-accumulate (MAC) unit, we experimentally confirmed that the proposed methodology achieves the target coverage three times faster than the random test.","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127925657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Addressing Soft Error and Security Threats in DNNs Using Learning Driven Algorithmic Checks","authors":"C. Amarnath, Md Imran Momtaz, A. Chatterjee","doi":"10.1109/IOLTS52814.2021.9486685","DOIUrl":"https://doi.org/10.1109/IOLTS52814.2021.9486685","url":null,"abstract":"The reliability of Deep Neural Networks (DNNs) is of great concern due to their widespread use in safety-critical applications. Prior research has focused on adaptation of algorithm based fault tolerance schemes for error detection in the dot product (linear) computations of DNNs. In this research, we show that compact machine-learned algorithmic checks inspired by prior work on linear checksums but adapted to the overall nonlinear nature of DNN computations can be used to detect both soft errors and image-triggered trojans in real-time. Experiments indicate that the method incurs low computation overhead (4%-20%), while achieving high coverage (up to 90% for soft errors and 99% for image-triggered attacks).","PeriodicalId":185642,"journal":{"name":"2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"373 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115988018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}