2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)最新文献

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Invited: Ultra low power integrated transceivers for near-field IoT 诚邀:近场物联网超低功耗集成收发器
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2907024
M. Sanduleanu, I. Elfadel
{"title":"Invited: Ultra low power integrated transceivers for near-field IoT","authors":"M. Sanduleanu, I. Elfadel","doi":"10.1145/2897937.2907024","DOIUrl":"https://doi.org/10.1145/2897937.2907024","url":null,"abstract":"In this paper, we propose mm-Waves for Near-Field IoT, ultra-low power transceivers. With small footprint and no external components, the transceivers could be integrated with the sensors, with the wireless sensor nodes organized in a Master-Slave, asymmetrical network. With low complexity and high energy efficiency, the slave nodes benefit from a minimalist design approach with integrated antennas and integrated resonators for absolute frequency accuracy. Two designs are presented. The first is a K-band, super-regenerative, logarithmic-mode, OOK receiver achieving a peak energy efficiency of 200pJ/bit at 4Mb/s and a BER of 10-3. With 800μW peak and 8μW average power, the sensitivity of the receiver is -60dBm for the same data and bit-error rates. Realized in a 65nm CMOS process from GF, the active area of the receiver is 740×670μm2. The second design is a 100Kb/s, V-band transceiver with integrated antenna. It achieves 20pJ/bit energy efficiency (Rx mode) and it provides means for 1/f noise mitigation.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"24 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116693070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Dot-product engine for neuromorphic computing: Programming 1T1M crossbar to accelerate matrix-vector multiplication 神经形态计算的点积引擎:编程1T1M交叉栏加速矩阵向量乘法
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898010
Miao Hu, J. Strachan, Zhiyong Li, E. M. Grafals, N. Dávila, Catherine E. Graves, Sity Lam, Ning Ge, Jianhua Joshua Yang, R. Williams
{"title":"Dot-product engine for neuromorphic computing: Programming 1T1M crossbar to accelerate matrix-vector multiplication","authors":"Miao Hu, J. Strachan, Zhiyong Li, E. M. Grafals, N. Dávila, Catherine E. Graves, Sity Lam, Ning Ge, Jianhua Joshua Yang, R. Williams","doi":"10.1145/2897937.2898010","DOIUrl":"https://doi.org/10.1145/2897937.2898010","url":null,"abstract":"Vector-matrix multiplication dominates the computation time and energy for many workloads, particularly neural network algorithms and linear transforms (e.g, the Discrete Fourier Transform). Utilizing the natural current accumulation feature of memristor crossbar, we developed the Dot-Product Engine (DPE) as a high density, high power efficiency accelerator for approximate matrix-vector multiplication. We firstly invented a conversion algorithm to map arbitrary matrix values appropriately to memristor conductances in a realistic crossbar array, accounting for device physics and circuit issues to reduce computational errors. The accurate device resistance programming in large arrays is enabled by close-loop pulse tuning and access transistors. To validate our approach, we simulated and benchmarked one of the state-of-the-art neural networks for pattern recognition on the DPEs. The result shows no accuracy degradation compared to software approach (99 % pattern recognition accuracy for MNIST data set) with only 4 Bit DAC/ADC requirement, while the DPE can achieve a speed-efficiency product of 1,000× to 10,000× compared to a custom digital ASIC.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"618 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120932828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 547
Strategy without tactics: Policy-agnostic hardware-enhanced control-flow integrity 没有策略的策略:与策略无关的硬件增强的控制流完整性
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898098
Dean Sullivan, Orlando Arias, Lucas Davi, Per Larsen, A. Sadeghi, Yier Jin
{"title":"Strategy without tactics: Policy-agnostic hardware-enhanced control-flow integrity","authors":"Dean Sullivan, Orlando Arias, Lucas Davi, Per Larsen, A. Sadeghi, Yier Jin","doi":"10.1145/2897937.2898098","DOIUrl":"https://doi.org/10.1145/2897937.2898098","url":null,"abstract":"Control-flow integrity (CFI) is a general defense against codereuse exploits that currently constitute a severe threat against diverse computing platforms. Existing CFI solutions (both in software and hardware) suffer from shortcomings such as (i) inefficiency, (ii) security weaknesses, or (iii) are not scalable. In this paper, we present a generic hardware-enhanced CFI scheme that tackles these problems and allows to enforce diverse CFI policies. Our approach fully supports multi-tasking, shared libraries, prevents various forms of code-reuse attacks, and allows CFI protected code and legacy code to co-exist. We evaluate our implementation on SPARC LEON3 and demonstrate its high efficiency.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125117801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 57
Serial T0: Approximate bus encoding for energy-efficient transmission of sensor signals 串行T0:用于传感器信号节能传输的近似总线编码
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898089
D. J. Pagliari, E. Macii, M. Poncino
{"title":"Serial T0: Approximate bus encoding for energy-efficient transmission of sensor signals","authors":"D. J. Pagliari, E. Macii, M. Poncino","doi":"10.1145/2897937.2898089","DOIUrl":"https://doi.org/10.1145/2897937.2898089","url":null,"abstract":"Off-chip serial buses are common in embedded systems, and due to the long physical lines, can contribute significantly to their energy consumption. However, these buses are often connected to analog sensors, whose data is inherently affected by noise and A/D errors. Thus, communication can tolerate small approximations, without a significant impact on the system outputs quality. In this paper we propose an energy-efficient approximate serial encoding for sensors data, inspired by the T0 technique for parallel buses. Despite its small encoder/decoder overheads, this method is capable of significantly reducing dynamic power (> 90%) in off-chip serial lines, with negligible average error (<;1%) on decoded data.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116096376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Precise error determination of approximated components in sequential circuits with model checking 时序电路中近似元件的精确误差测定
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898069
Arun Chandrasekharan, Mathias Soeken, Daniel Große, R. Drechsler
{"title":"Precise error determination of approximated components in sequential circuits with model checking","authors":"Arun Chandrasekharan, Mathias Soeken, Daniel Große, R. Drechsler","doi":"10.1145/2897937.2898069","DOIUrl":"https://doi.org/10.1145/2897937.2898069","url":null,"abstract":"Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several approximated candidates in design exploration. Precisely determining the error of an approximated circuit is a hard problem since the errors accumulate over time depending on the composition and nature of individual components. In this paper, we present methods based on model checking to precisely determine error behavior in sequential circuits that contain approximated combinational components. Our experiments show that such an analysis is very significant and crucial to properly deduce the effects of approximations.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122757330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Efficient transistor-level timing yield estimation via line sampling 有效的晶体管级时序良率估计通过线路采样
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898016
H. Awano, Takashi Sato
{"title":"Efficient transistor-level timing yield estimation via line sampling","authors":"H. Awano, Takashi Sato","doi":"10.1145/2897937.2898016","DOIUrl":"https://doi.org/10.1145/2897937.2898016","url":null,"abstract":"Yield estimation has been and will continue to be the integral part in design flow, particularly under large process variability in advanced technology nodes. This paper proposes an efficient method that accelerates transistor-level statistical timing simulations which are intensively conducted in various design stages, such as in final timing verification, while considering thousands of random variables. The proposed method utilizes line sampling (LS), in which integration of randomly generated lines, not the random points, are evaluated. Numerical experiments show that the proposed method achieves 14 x to 300 x speed-up compared to the fastest one that has ever reported.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117309272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A probabilistic scheduling framework for mixed-criticality systems 混合临界系统的概率调度框架
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2897971
Alejandro Masrur
{"title":"A probabilistic scheduling framework for mixed-criticality systems","authors":"Alejandro Masrur","doi":"10.1145/2897937.2897971","DOIUrl":"https://doi.org/10.1145/2897937.2897971","url":null,"abstract":"We propose a probabilistic scheduling framework for the design and development of mixed-criticality systems, i.e., where tasks with different levels of criticality need to be scheduled on a shared resource. Whereas highly critical tasks normally require hard real-time guarantees, less or non-critical ones may be degraded or even temporarily discarded at runtime. We hence propose giving probabilistic {instead of deterministic) real-time guarantees on low-criticality tasks. This simplifies the analysis and reduces conservativeness on the one hand. On the other hand, probabilistic guarantees can be tuned by the designer to reach a desired level of assurance. We illustrate these and other benefits of our framework based on extensive simulations.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129805864","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Comprehensive optimization of scan chain timing during late-stage IC implementation 集成电路后期实现中扫描链时序的全面优化
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2897998
K. Chung, A. Kahng, Jiajia Li
{"title":"Comprehensive optimization of scan chain timing during late-stage IC implementation","authors":"K. Chung, A. Kahng, Jiajia Li","doi":"10.1145/2897937.2897998","DOIUrl":"https://doi.org/10.1145/2897937.2897998","url":null,"abstract":"Scan chain timing is increasingly critical to test time and product cost. However, hold buffer insertions (e.g., due to large clock skew) limit scan timing improvement. Dynamic voltage drop (DVD) during scan shift further degrades scan shift timing, inducing “false failures” in silicon. Hence, new optimizations are needed in late stages of implementation when accurate (skew, DVD) information is available. We propose skew-aware scan ordering to minimize hold buffers, and DVD-aware gating insertion to improve scan shift timing slacks. Our optimizations at the post-CTS and postrouting stages reduce hold buffers by up to 82%, and DVD-induced timing degradation by up to 58%, with negligible area and power overheads.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129946065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Lattice-based encryption over standard lattices in hardware 在硬件标准格之上的基于格的加密
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898037
James Howe, C. Rafferty, Máire O’Neill, F. Regazzoni, T. Güneysu, Kevin Beeden
{"title":"Lattice-based encryption over standard lattices in hardware","authors":"James Howe, C. Rafferty, Máire O’Neill, F. Regazzoni, T. Güneysu, Kevin Beeden","doi":"10.1145/2897937.2898037","DOIUrl":"https://doi.org/10.1145/2897937.2898037","url":null,"abstract":"Lattice-based cryptography has gained credence recently as a replacement for current public-key cryptosystems, due to its quantum-resilience, versatility, and relatively low key sizes. To date, encryption based on the learning with errors (LWE) problem has only been investigated from an ideal lattice standpoint, due to its computation and size efficiencies. However, a thorough investigation of standard lattices in practice has yet to be considered. Standard lattices may be preferred to ideal lattices due to their stronger security assumptions and less restrictive parameter selection process. In this paper, an area-optimised hardware architecture of a standard lattice-based cryptographic scheme is proposed. The design is implemented on a FPGA and it is found that both encryption and decryption fit comfortably on a Spartan-6 FPGA. This is the first hardware architecture for standard lattice-based cryptography reported in the literature to date, and thus is a benchmark for future implementations. Additionally, a revised discrete Gaussian sampler is proposed which is the fastest of its type to date, and also is the first to investigate the cost savings of implementing with A/2-bits of precision. Performance results are promising compared to the hardware designs of the equivalent ring-LWE scheme, which in addition to providing stronger security proofs; generate 1272 encryptions per second and 4395 decryptions per second.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128244204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
Hybrid STT-CMOS designs for reverse-engineering prevention 用于逆向工程预防的STT-CMOS混合设计
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC) Pub Date : 2016-06-05 DOI: 10.1145/2897937.2898099
Theodore Winograd, H. Salmani, H. Mahmoodi, K. Gaj, H. Homayoun
{"title":"Hybrid STT-CMOS designs for reverse-engineering prevention","authors":"Theodore Winograd, H. Salmani, H. Mahmoodi, K. Gaj, H. Homayoun","doi":"10.1145/2897937.2898099","DOIUrl":"https://doi.org/10.1145/2897937.2898099","url":null,"abstract":"This paper presents a rigorous step towards design-for-assurance by introducing a new class of logically reconfigurable design resilient to design reverse engineering. Based on the non-volatile spin transfer torque (STT) magnetic technology, we introduce a basic set of non-volatile reconfigurable Look-Up-Table (LUT) logic components (NV-STT-based LUTs). STT-based LUT with significantly different set of characteristics compared to CMOS provides new opportunities to enhance design security yet makes it challenging to remain highly competitive with custom CMOS or even SRAM-based LUT in terms of power, performance and area. To address these challenges, we propose several algorithms to select and replace custom CMOS gates with reconfigurable STT-based LUTs during design implementation such that the functionality of STT-based components and therefore the entire design cannot be determined in any manageable time, rendering any design reverse engineering attack ineffective. Our study conducted on a large number of standard circuit benchmarks concludes significant resiliency of hybrid STT-CMOS circuits against various types of attacks. Furthermore, the selection algorithms on average have a small impact of less than 3%, 8%, and 3% on design parametric constraints including performance, power and area, respectively.","PeriodicalId":185271,"journal":{"name":"2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129260336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 43
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