Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)最新文献_第3页

The HASS development process HASS的开发过程

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816339

D. Rahe

引用次数: 1

Improvements in reliability assessment and prediction methodology 可靠性评估和预测方法的改进

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816304

B. Johnson, L. Gullo

引用次数: 13

Modeling of common-mode failures in digital embedded systems 数字嵌入式系统的共模故障建模

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816333

L. M. Kaufman, S. Bhide, B.W. Johnson

引用次数: 23

Modeling and analysis for multiple stress-type accelerated life data 多应力型加速寿命数据建模与分析

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816297

A. Mettas

{"title":"Modeling and analysis for multiple stress-type accelerated life data","authors":"A. Mettas","doi":"10.1109/RAMS.2000.816297","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816297","url":null,"abstract":"This paper describes a model for multiple stress-type accelerated life data. In addition, the use of an algorithm, which was specifically developed for this model is illustrated. The model is based on the widely known log-linear model (1990) and is formulated for the Weibull and lognormal distributions for a variety of censoring schemes using likelihood theory. An algorithm has been developed for the solution of this model, and implemented in a recently released software package, ALTA Pro/sup TM/, specific to accelerated life data analysis. The algorithm has been specifically designed to be very flexible and has the capability of simultaneously solving for up to eight different stress-types. The advantage of this formulation is that it combines in one model most of the known life-stress relationships for one or two types of stresses (such as the temperature-nonthermal model), as well as the multivariable proportional hazards model. This yields a single general likelihood function (for a given distribution) whose solution is independent of both the chosen life-stress relationship and the number of stress-types. In addition, this model allows for simultaneous analysis of continuous, categorical and indicator variables. The solution to this model provides the engineers with an opportunity to expand their selection of types of stresses and test conditions when testing products.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123317813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 31

Advisory board - tools for reliability and maintainability practitioners 咨询委员会。可靠性和可维护性从业人员的工具

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816318

W. Kuo, C. S. Carlson, F. D. Gregory, T. Mitrou, M. Shooman, G. Vassiliades

引用次数: 0

Bivariate failure modeling 二元失效模型

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816322

Sang-Chin Yang, J. Kobza, J. A. Nachlas

{"title":"Bivariate failure modeling","authors":"Sang-Chin Yang, J. Kobza, J. A. Nachlas","doi":"10.1109/RAMS.2000.816322","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816322","url":null,"abstract":"Issues related to the construction of bivariate reliability models and their application to maintenance planning are discussed. The distinction between bivariate failure models and models of first passage time to a failure threshold clarifies the motivation for the development of bivariate models. The authors present a taxonomy of model classes and identify two classes as their focus. The model classes examined here are those in which the two variables are related by a stochastic function and those in which the variables are simply correlated. Examples of the models of each of the two classes are defined. The general approach to model formulation is explained so that the reader may construct alternate forms. The sometimes subtle aspects of model analysis are discussed with particular emphasis on the interpretation of bivariate failure probabilities and on the calculating of numerical results. Associated issues related to the construction of renewal models that can be used in maintenance planning are also discussed. For each of the topics addressed, example calculations are provided or else the technical roadblocks to continuing analysis are identified. In the authors' view, the types of bivariate models described here provide a new way to study the reliability of equipment for which univariate measures are incomplete. Thus, a new area of reliability research is identified. The definitions they offer may be modified, and the approach to model formulation they present may be used to define other models. They raise several open questions concerning the model construction and analysis. Both conceptual definitions and analytical methods warrant further exploration.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"35 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129424139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Optimal-maintenance modeling on finite time with technology replacement and changing repair costs 有限时间下技术更新和维修成本变化的最优维修建模

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816320

J. Rupe

{"title":"Optimal-maintenance modeling on finite time with technology replacement and changing repair costs","authors":"J. Rupe","doi":"10.1109/RAMS.2000.816320","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816320","url":null,"abstract":"The authors explore maintenance models for finite time missions. Motivated by real world applications, and models which are lacking in literature, they include exponential cost forms that allow for net present value analysis, and explore replacing obsolete equipment with new. In this paper, they demonstrate through mathematical modeling that: by using simple search methods, one can find optimal replacement intervals for systems under a general finite time mission; under Weibull hazard functions, one can express the optimal replacement rate simply; by allowing for special exponential cost function forms, one can find local cost minima for exponentially growing costs, or include the time value of money; for systems in use, one can monitor the marginal cost, and replace the system when this marginal cost equals the expected average cost for the replacing system; when replacing one technology with a new, there are conditions under which the optimal replacement cycles are completely interrelated, and other conditions where one can calculate one from an independent calculation of another; and in budget constrained times, use present value estimates such as the ones we provide. To apply optimal replacement planning in industry, one must consider finite time missions, net present value of costs, and replacing obsolete equipment with new technology.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129561132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Thermodynamic extensions of Miner's rule to chemical cells 米纳定律在化学细胞中的热力学扩展

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816331

A. Feinberg, A. Widom

引用次数: 3

Enhancing the predictive performance of the Goel-Okumoto software reliability growth model 提高Goel-Okumoto软件可靠性增长模型的预测性能

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816292

P.A. Keiller, T. Mazzuchi

引用次数: 11

A review of plastic-encapsulated-microcircuit reliability-prediction models 塑料封装微电路可靠性预测模型综述

Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) Pub Date : 2000-01-24 DOI: 10.1109/RAMS.2000.816307

Yin-Liong Mok, L. Ten

{"title":"A review of plastic-encapsulated-microcircuit reliability-prediction models","authors":"Yin-Liong Mok, L. Ten","doi":"10.1109/RAMS.2000.816307","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816307","url":null,"abstract":"This paper reviews available plastic encapsulated microcircuit (PEM) reliability prediction models including the CNET, Thomson-CSF and RAC model. We examine the RAC (Reliability Analysis Center) model in detail, as it is the only usable model that considers the accelerating effects of temperature and humidity on PEM failures. Our intention is to provide constructive criticisms and propose amendments. We agreed with the assumptions made by the RAC model: types of packaging do not affect PEM failure rate; and a single activation energy of 0.8 eV may be adequate for different IC logic families. However, we feel that the RAC model should incorporate a term for EOS/ESD failures as they constitutes a high percentage (up to 43%) of IC failures. The RAC model should set an upper limit of 130/spl deg/C and 99% RH when using Peck's model to model temperature/humidity acceleration so as to avoid violating physics-of-failure considerations. It should consider treating microprocessor and memories as two different classes of devices due to the vast differences in their reliability as indicated by some literatures. We question if the reliability growth rate can be projected without restrictions. There should also be clearer indications of what constitutes \"best commercial practices\"-a prerequisite to apply the model.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127508036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2