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2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)最新文献

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Multiclass Diabetes Detection Using Random Forest Classification 基于随机森林分类的多类糖尿病检测
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2023-05-22 DOI: 10.1109/JEEIT58638.2023.10185679
Amjed Al-mousa, Laith AlKhdour, Hatem Bishawi, Fares AlShubeliat
{"title":"Multiclass Diabetes Detection Using Random Forest Classification","authors":"Amjed Al-mousa, Laith AlKhdour, Hatem Bishawi, Fares AlShubeliat","doi":"10.1109/JEEIT58638.2023.10185679","DOIUrl":"https://doi.org/10.1109/JEEIT58638.2023.10185679","url":null,"abstract":"Detecting diabetes at an early stage can help save lives and improve the patients quality of life significantly. Diabetes can be detected with the assistance of information regarding the patient's lifestyle and health. This work aims to predict diabetic patients using different machine-learning classification algorithms and a dataset about diabetic and healthy patients. The work employs a data balancing technique to handle the data imbalance issue, as well as using cross-validation. In addition, it compares these machine-learning algorithms according to several performance indicators like accuracy, precision, recall, and Fl-score. Accordingly, the Random Forest classifier proved to produce the best results with accuracy, precision, recall, and an Fl-score, all equal to 89%.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131718266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analyzing and Forecasting the Weather Conditions in Jordan using Machine Learning Techniques 利用机器学习技术分析和预测约旦的天气状况
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2023-05-22 DOI: 10.1109/JEEIT58638.2023.10185800
Laith O. Bani Khaled, Gheith A. Abandah
{"title":"Analyzing and Forecasting the Weather Conditions in Jordan using Machine Learning Techniques","authors":"Laith O. Bani Khaled, Gheith A. Abandah","doi":"10.1109/JEEIT58638.2023.10185800","DOIUrl":"https://doi.org/10.1109/JEEIT58638.2023.10185800","url":null,"abstract":"Weather forecasting is an important research field due to its impact on a wide variety of life aspects. The traditional way of weather forecasting is based on complex physical models that describe the hydrodynamic behavior of the atmosphere. This way is costly, time consuming, often inaccurate and requires supercomputers to make predictions. In this paper, we investigated the performance of machine learning algorithms in predicting the weather conditions in Jordan for a short period. We start by analyzing the used dataset of the weather conditions of the 12 Jordanian governorates over past 13 years, where the long-term trend shows 0.3−°C rise in the average temperature and 10-mm decrease in the average annual precipitation. We propose a prediction model based on encoder-decoder architecture and bidirectional long short-term memory cells (ED-BiLSTM). We carefully tune and train this model and show the importance of integrating the data of nearby locations to the target location's data to improve the model accuracy. Also, we show that the model accuracy improves significantly when adding training instances of other locations. The proposed tuned model trained on the train data of 16 locations and accepting regional weather conditions at the input has very low mean squared error of 1.78×10−6 in predicting Amman's weather for the next 24 hours.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129274728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Impact of Using STATCOM for PV Farms Connected with Grid 使用STATCOM对并网光伏电站的影响
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2023-05-22 DOI: 10.1109/JEEIT58638.2023.10185902
Tasneem. T. Al-Daboubi, H. D. Al-Majali
{"title":"The Impact of Using STATCOM for PV Farms Connected with Grid","authors":"Tasneem. T. Al-Daboubi, H. D. Al-Majali","doi":"10.1109/JEEIT58638.2023.10185902","DOIUrl":"https://doi.org/10.1109/JEEIT58638.2023.10185902","url":null,"abstract":"Solar energy is now playing a vital role in electrical distribution networks due to its strong financial benefits. However, the integration of photovoltaic systems can cause issues such as power losses by altering the way power flows through the network. To study the impact of PV penetration, an IEEE 14 bus system is used as a distribution network model. In this study, an IEEE 14 bus Simulink model was created and the reactive power was compensated using STATCOM to minimize overall network losses. Two optimization methods were evaluated, with the AGWO algorithm suggested as the best STATCOM control method. The suggested method first determined the optimal allocation and number of STATCOMs to add, then calculated the appropriate reactive power for each STATCOM using power flow analysis in the MATLAB-Simulink environment. Ultimately, the results showed that using the AGWO algorithm in combination with STATCOMs produced better results than the other technique.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125834637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tuning the Parameters of Cutting Machines Using Particle Swarm Optimization: A Comparison Study 基于粒子群优化的切割机参数整定的比较研究
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2023-05-22 DOI: 10.1109/JEEIT58638.2023.10185775
A. Sheta, Malik Braik, A. Baareh
{"title":"Tuning the Parameters of Cutting Machines Using Particle Swarm Optimization: A Comparison Study","authors":"A. Sheta, Malik Braik, A. Baareh","doi":"10.1109/JEEIT58638.2023.10185775","DOIUrl":"https://doi.org/10.1109/JEEIT58638.2023.10185775","url":null,"abstract":"In this study, we conducted experiments to model the temperature of two manufacturing processes using various metaheuristic search algorithms. The two processes adopted were the P05 horny steel tool and the AISI304 stainless steel castings machines. Our approach involves building a data-driven model, as traditional search methods for modeling manufac-turing problems often need help finding the global optimum when faced with a complex objective function and numerous decision variables. Bio-inspired metaheuristic search algorithms have shown promising performance in handling multi-model optimization functions, and efficiently exploring the search space to attain more global results. We applied several metaheuristic search algorithms to find the optimal tuning parameters of a temperature-based model. The results from the case studies demonstrate that Particle Swarm Optimization (PSO) provided the best performance in tuning model parameters, resulting in minimum modeling error.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121733761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fine-Tashkeel: Fine-Tuning Byte-Level Models for Accurate Arabic Text Diacritization 精细tashkeel:微调精确阿拉伯文本变音符的字节级模型
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2023-03-25 DOI: 10.1109/JEEIT58638.2023.10185725
Bashar Al-Rfooh, Gheith A. Abandah, Rami Al-Rfou
{"title":"Fine-Tashkeel: Fine-Tuning Byte-Level Models for Accurate Arabic Text Diacritization","authors":"Bashar Al-Rfooh, Gheith A. Abandah, Rami Al-Rfou","doi":"10.1109/JEEIT58638.2023.10185725","DOIUrl":"https://doi.org/10.1109/JEEIT58638.2023.10185725","url":null,"abstract":"Most of previous work on learning diacritization of the Arabic language relied on training models from scratch. In this paper, we investigate how to leverage pre-trained language models to learn diacritization. We fine-tune token-free pre-trained multilingual models (ByT5) to learn to predict and insert missing diacritics in Arabic text, a complex task that requires understanding the sentence semantics and the morphological structure of the tokens. We achieve state-of-the-art accuracy on the dia-critization task with minimal amount of training and no feature engineering, reducing WER (word error rate) by 40%. We release our fine-tuned models for the greater benefit of the researchers in the community.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-03-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117115826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Welcome Message 欢迎信息
2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT) Pub Date : 2019-07-01 DOI: 10.1109/HLDVT.2016.7748242
P. Varma, M. Velev
{"title":"Welcome Message","authors":"P. Varma, M. Velev","doi":"10.1109/HLDVT.2016.7748242","DOIUrl":"https://doi.org/10.1109/HLDVT.2016.7748242","url":null,"abstract":"On behalf of the conference organizing committee, it gives me a great pleasure to welcome you to the 2023 IEEE Jordan International joint conference on Electrical Engineering and Information Technology (JEEIT). I am honored to be the General Chair of the organizing team of such an important and interesting event, which is taking place in Landmark Hotel, Amman, Jordan, during May 22-24, 2023. JEEIT 2023 is organized by IEEE – Jordan Section and Jordan Engineers Association. JEEIT 2023 merges the following two conferences in one big conference with one organizing committee, one program and one proceedings.","PeriodicalId":177556,"journal":{"name":"2023 IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology (JEEIT)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127769822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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