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Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering最新文献

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Putting assertions in their place 将断言放在合适的位置
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341367
J. Voas, K. Miller
{"title":"Putting assertions in their place","authors":"J. Voas, K. Miller","doi":"10.1109/ISSRE.1994.341367","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341367","url":null,"abstract":"Assertions that are placed at each statement in a program can automatically monitor the internal computations of a program execution. However, the advantages of universal assertions come at a cost. A program with such extensive internal instrumentation will be slower than the same program without the instrumentation. Some of the assertions may be redundant. The task of instrumenting the code with correct assertions at each location is burdensome, and there is no guarantee that the assertions themselves will be correct. We advocate a middle ground between no assertions at all (the most common practice) and the theoretical ideal of assertions at every location. Our compromise is to place assertions only at locations where traditional testing is unlikely to uncover software faults. One type of testability measurement, sensitivity analysis, identifies locations where testing is unlikely to be effective.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124939896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 57
Reliability growth modelling of software for process control systems 过程控制系统软件的可靠性增长模型
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341396
A. Pasquini
{"title":"Reliability growth modelling of software for process control systems","authors":"A. Pasquini","doi":"10.1109/ISSRE.1994.341396","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341396","url":null,"abstract":"Reliability growth models are the most widely known and used in practical applications. Nevertheless, the performances of these models limit their applicability to the control and assessment of the attainment of very low reliability levels. One of the reasons for their insufficient predictive quality is the scarcity of information they use for reliability estimation. They do not take into account information that could be easily collected from code observation, such as the code complexity, or during testing such as the coverage obtained. The paper analyzes the problems encountered using reliability growth models for the evaluation of software used in a measurement equipment control system.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114619034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A process for software requirements safety analysis 软件需求安全分析的过程
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341347
R. Mojdehbakhsh, S. Subramanian, R. V. Vishnuvajjala, W. Tsai, L. Elliott
{"title":"A process for software requirements safety analysis","authors":"R. Mojdehbakhsh, S. Subramanian, R. V. Vishnuvajjala, W. Tsai, L. Elliott","doi":"10.1109/ISSRE.1994.341347","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341347","url":null,"abstract":"We introduce a detailed process for software requirements safety analysis. The approach for identification of safety faults in this process is based on fault tree analysis. This process consists of four main steps: software requirements fault tree generation; software requirements fault tree verification and validation; software safety requirements generation and safety fault mitigation; and software requirements safety verification and validation. We have defined a set of rules that can automatically generate the software requirements fault tree given the software requirements specified in Statemate, and the software fault tree top events identified in the system safety analysis. Statemate CASE tool is used in this process for specification of software requirements, and execution and analysis of the software requirements to verify and validate safety. Essential tree analysis is introduced as a method for dependency analysis of the software fault tree top event. The outcome of essential tree analysis is captured in an essential tree which we introduce as a graphical representation of the dependencies and their interrelations.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"352 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122843871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
An automated environment for software testing and reliability estimation 用于软件测试和可靠性评估的自动化环境
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341394
Staffan Pernler, Niclas Ståhl
{"title":"An automated environment for software testing and reliability estimation","authors":"Staffan Pernler, Niclas Ståhl","doi":"10.1109/ISSRE.1994.341394","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341394","url":null,"abstract":"We present the automated testing performed at Ericsson Telecom, Transport Network Systems, and how we intend to combine it with a test analyser to estimate the software reliability of our products. The test analyser will also provide a basis for test management decisions, e.g. resource allocation, as well as feedback to system design.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"258 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116194743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The relationship between test coverage and reliability 测试覆盖率和可靠性之间的关系
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341373
Y. Malaiya, Michael Naixin Li, J. Bieman, R. Karcich, Bob Skibbe
{"title":"The relationship between test coverage and reliability","authors":"Y. Malaiya, Michael Naixin Li, J. Bieman, R. Karcich, Bob Skibbe","doi":"10.1109/ISSRE.1994.341373","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341373","url":null,"abstract":"Models the relationship between testing effort, coverage and reliability, and presents a logarithmic model that relates testing effort to test coverage: statement (or block) coverage, branch (or decision) coverage, computation use (c-use) coverage, or predicate use (p-use) coverage. The model is based on the hypothesis that the enumerables (like branches or blocks) for any coverage measure have different detectability, just like the individual defects. This model allows us to relate a test coverage measure directly to the defect coverage. Data sets for programs with real defects are used to validate the model. The results are consistent with the known inclusion relationships among block, branch and p-use coverage measures. We show how the defect density controls the time-to-next-failure. The model can eliminate variables like the test application strategy from consideration. It is suitable for high-reliability applications where automatic (or manual) test generation is used to cover enemerables which have not yet been tested.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121348903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 115
Applying various learning curves to hyper-geometric distribution software reliability growth model 各种学习曲线在超几何分布软件可靠性增长模型中的应用
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341342
R. Hou, S. Kuo, Yi-Ping Chang
{"title":"Applying various learning curves to hyper-geometric distribution software reliability growth model","authors":"R. Hou, S. Kuo, Yi-Ping Chang","doi":"10.1109/ISSRE.1994.341342","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341342","url":null,"abstract":"The hyper-geometric distribution software reliability growth model (HGDM) has been shown to be able to estimate the number of faults initially resident in a program at the beginning of the test-and-debug phase. A key factor of the HGDM is the \"sensitivity factor\", which represents the number of faults discovered and rediscovered at the application of a test instance. The learning curve incorporated in the sensitivity factor is generally assumed to be linear in the literature. However, this assumption is apparently not realistic in many applications. We propose two new sensitivity factors based on the exponential learning curve and the S-shaped learning curve, respectively. Furthermore, the growth curves of the cumulative number of discovered faults for the HGDM with the proposed learning curves are investigated. Extensive experiments have been performed based on two real test/debug data sets, and the results show that the HGDM with the proposed learning curves estimates the number of initial faults better than previous approaches.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123247200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 40
Methodology of independent software nuclear safety analysis 独立软件核安全分析方法学
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341356
E. Addy
{"title":"Methodology of independent software nuclear safety analysis","authors":"E. Addy","doi":"10.1109/ISSRE.1994.341356","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341356","url":null,"abstract":"Independent software nuclear safety analysis provides a methodology to ensure that software does not cause or contribute to a violation of the nuclear safety standards established by the Department of Defense, and that nuclear safety-critical software is not adversely affected by interfacing software or by operator action. This methodology is a systematic approach to examine a specific aspect of software system safety in nuclear weapon systems. The paper describes the methodology of independent software nuclear safety analysis, and discusses its extension to other application areas.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125732042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Testing applications using domain based testing and Sleuth 使用基于域的测试和侦查来测试应用程序
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341375
A. Andrews, J. Walls, R. Mraz
{"title":"Testing applications using domain based testing and Sleuth","authors":"A. Andrews, J. Walls, R. Mraz","doi":"10.1109/ISSRE.1994.341375","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341375","url":null,"abstract":"Domain-based testing (DBT) is a test generation method based on two concepts from software reuse: domain analysis and domain modeling. Instead of using domain models for reuse, they serve as a structure to generate tests. In general, domain-based testing forms a family of test generation methods. Each member of the family defines a specialized domain analysis and domain model for each problem domain or class of software. To demonstrate these principles, we define a domain analysis and a domain model for systems with a command language interface. The analysis exploits information from the command language, and the domain model stores the syntactic and semantic information needed for test case generation. We develop a four-part test generation process model to support automated test generation. We also describe an interactive test generation tool called Sleuth. Sleuth supports domain-based testing, follows our test process model, and provides utilities to reuse test cases.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126001963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 33
Software trustability 软件trustability
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1900-01-01 DOI: 10.1109/ISSRE.1994.341366
W. Howden, Yudong Huang
{"title":"Software trustability","authors":"W. Howden, Yudong Huang","doi":"10.1109/ISSRE.1994.341366","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341366","url":null,"abstract":"A measure of software dependability called trustability is described. A program p has trustability T if we are at least T confident that p is free of faults. Trustability measurement depends on detectability. The detectability of a method is the conditional probability that it will detect faults. The trustability model characterizes the kind of information needed to justify a given level of trustability. When the required information is available, the trustability approach can be used to determine strategies in which methods are combined for maximum effectiveness. It can be used to determine the minimum amount of resources needed to guarantee a required degree of trustability, and the maximum trustability that is achievable with a given amount of resources.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129072160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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