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Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering最新文献

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Adjusting measured field failure intensity for operational profile variation 根据操作剖面变化调整实测的现场故障强度
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341398
J. Musa
{"title":"Adjusting measured field failure intensity for operational profile variation","authors":"J. Musa","doi":"10.1109/ISSRE.1994.341398","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341398","url":null,"abstract":"Failure intensity depends on the operational profile used in executing a system. Operational profiles can change, so we would like to determine the new failure intensity without the expense of actually reexecuting the system under the new operational profile. We derive a transformation for adjusting the failure intensity to the value it would have under the new operational profile. This transformation does not require that we measure operation failure intensities in the field, a requirement that would often be impractical to meet. It is only necessary to know the operational profile used in test; this information is used to estimate the operation failure intensities. The old and new field operational profiles and the estimated operation failure intensities are employed to determine the overall target failure intensity.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123128633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Empirical studies of predicate-based software testing 基于谓词的软件测试的实证研究
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341348
M. Vouk, K. Tai, A. Paradkar
{"title":"Empirical studies of predicate-based software testing","authors":"M. Vouk, K. Tai, A. Paradkar","doi":"10.1109/ISSRE.1994.341348","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341348","url":null,"abstract":"We report the results of three empirical studies of fault detection and stability performance of the predicate-based BOR (Boolean Operator) testing strategy. BOR testing is used to develop test cases based on formal software specification, or based on the implementation code. We evaluated the BOR strategy with respect to some other strategies by using Boolean expressions and actual software. We applied it to software specification cause-effect graphs of a safety-related real-time control system, and to a set of N-version programs. We found that BOR testing is very effective at detecting faults in predicates, and that BOR-based approach has consistently better fault detection performance than branch testing, thorough (but informal) functional testing, simple state-based testing, and random testing. Our results indicate that BOR test selection strategy is practical and effective for detection of faulty predicates and is suitable for generation of safety-sensitive test-cases.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126095752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 31
Using formal methods to validate C programs 使用形式化方法验证C程序
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341383
C. Antoine, P. Baudin, J. Collart, J. Raguideau, A. Trotin
{"title":"Using formal methods to validate C programs","authors":"C. Antoine, P. Baudin, J. Collart, J. Raguideau, A. Trotin","doi":"10.1109/ISSRE.1994.341383","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341383","url":null,"abstract":"Presents the CAVEAT project. The purpose of this project is to develop a tool designed to assist a user in the verification of C programs. Such a verification is required for safety applications in a pragmatic approach. The tool enables a user to verify the global or local properties of these applications. The context in which a property is to be verified is defined in terms of hypotheses. Most of the steps of the verification process, in particular the rewriting steps, are executed automatically. The proof process, however, may be partially interactive, and the interface therefore allows easy communication.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"114 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116486886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimating the software reliability of smoothly degrading systems 平滑退化系统的软件可靠性估计
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341370
Alberto Avritzer, E. Weyuker
{"title":"Estimating the software reliability of smoothly degrading systems","authors":"Alberto Avritzer, E. Weyuker","doi":"10.1109/ISSRE.1994.341370","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341370","url":null,"abstract":"Presents the application of a domain-based reliability measure to systems that can be represented by Markov chains. A load testing algorithm is presented, and the measure is applied to assess the reliability of these systems after they have been tested. Data are presented for three industrial telecommunications systems that had been tested using the load testing algorithm, tracking the reliability as a function of the degree of system degradation experienced.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126239610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Experimental analysis of models for correlation in multiversion software 多版本软件中相关模型的实验分析
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341346
J. Dugan
{"title":"Experimental analysis of models for correlation in multiversion software","authors":"J. Dugan","doi":"10.1109/ISSRE.1994.341346","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341346","url":null,"abstract":"Two different classes of models for correlation in multiversion systems have been proposed in the literature. One considers that the version failures are statistically correlated, and the other defines additional failure types to account for related failures. We investigate these two model types, and apply them to several different sets of experimental data available in the literature. Both models provide a good fit for the available data, and thus both seem appropriate for models of multiversion systems. The models which explicitly consider correlation appear better suited to the analysis of software in isolation from the rest of the system, while those models which propose additional failure types are better suited for system-level models that consider hardware as well as software.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"11 23","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113963680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
CLAIRE: an event-driven simulation tool for testing software 克莱儿:测试软件的事件驱动模拟工具
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341384
J. Raguideau, D. Schoen, J. Henry, Jacques Boulc'h
{"title":"CLAIRE: an event-driven simulation tool for testing software","authors":"J. Raguideau, D. Schoen, J. Henry, Jacques Boulc'h","doi":"10.1109/ISSRE.1994.341384","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341384","url":null,"abstract":"CLAIRE is a tool developed at CEA, the French nuclear research institute, for testing software involved in the information and control systems of nuclear plants. The tool is based purely on software simulation: the environment of the code is modelled and, at simulation time, exchanges information with the code under validation. Verification of safety properties can be performed with this tool. Several binary codes can be included in the same simulation to validate distributed real-time applications. The solutions adopted for the tool make it possible to use it to validate specifications, so that the verification of properties could be performed very early in the application life-cycle. The results of the simulation can be managed either online, at simulation time, or off-line after the end of the simulation.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131011799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Some effects of fault recovery order on software reliability models 故障恢复顺序对软件可靠性模型的影响
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341400
M. Hoppa, L. Wilson
{"title":"Some effects of fault recovery order on software reliability models","authors":"M. Hoppa, L. Wilson","doi":"10.1109/ISSRE.1994.341400","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341400","url":null,"abstract":"Since traditional approaches to software reliability modeling allow the user to formulate predictions using data from one realization of the debugging process, it is necessary to understand the influence of the fault recovery order on predictive performance. We introduce an experimental methodology using a data structure called the debugging graph and use it to analyze the effects of various fault recovery orders on the predictive accuracy of four well-known software reliability algorithms. Further we note fault interactions and their potential effects on the predictive process. Based on our experiment, we conjecture that the accuracy of a reliability prediction is affected by the fault recovery order as well as by fault interactions.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124122429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Identifying risk using ODC based growth models 使用基于ODC的增长模型识别风险
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341388
R. Chillarege, S. Biyani
{"title":"Identifying risk using ODC based growth models","authors":"R. Chillarege, S. Biyani","doi":"10.1109/ISSRE.1994.341388","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341388","url":null,"abstract":"The paper uses the relative growth of defects, classified using orthogonal defect classification to get a finer insight into dynamics of the software development process during later parts of testing. This is particularly useful to help identify management actions to better use people resources (both skill and staffing levels) to respond to difficulties experienced with the product in test. Specifically, the technique helps to: identify the reasons for instability in the product demonstrated by growth modelling. Evaluate the relative stability of specific aspects of the product, such as design, code, etc. Guide the choice of resource levels and skills necessary to respond to difficulties faced in the development process.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115259479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Software reliability: to use or not to use? 软件可靠性:用还是不用?
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341350
Michael R. Lyu
{"title":"Software reliability: to use or not to use?","authors":"Michael R. Lyu","doi":"10.1109/ISSRE.1994.341350","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341350","url":null,"abstract":"Research activities in software reliability engineering have been vigorous in the past two decades since Z. Jelinski and P.B. Moranda (1972) proposed the first software reliability model. Since then, numerous software reliability models and measurement procedures have been proposed for the prediction, estimation, and engineering of software reliability. However, there seems to be a gap among the software engineering practitioners regarding the use of software reliability. Believers advocate the use of software reliability and promote the stories of success, while skeptics doubt the adequacy, validity, and consistency of software reliability both in terms of its concept and in terms of its practicality.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133380973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Fault modeling using the program dependence graph 基于程序依赖图的故障建模
Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering Pub Date : 1994-11-06 DOI: 10.1109/ISSRE.1994.341362
K. Tewary, M. J. Harrold
{"title":"Fault modeling using the program dependence graph","authors":"K. Tewary, M. J. Harrold","doi":"10.1109/ISSRE.1994.341362","DOIUrl":"https://doi.org/10.1109/ISSRE.1994.341362","url":null,"abstract":"We present a fault classification scheme and a fault seeding method that is based on the manifestation of faults in the program dependence graph (PDG). We enhance the domain/computation fault classification scheme to further characterize faults as structural and statement level, depending on the differences between the PDG for the original program and the PDG for the faulty program. Structural faults correspond to differences in the control dependence or data dependence information in the PDGs, whereas statement level faults correspond to differences in the information within PDG nodes. We perform transformations on the PDG to produce the different types of faults described in our PDG-based fault classification scheme. To demonstrate the usefulness of our technique, we implemented a fault seeder to embed faults into C programs. We are using our fault seeder to experiment with the effectiveness of unit testing techniques, and are investigating the application of our fault seeder for formulating a fault based testing method.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115055924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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