{"title":"过程控制系统软件的可靠性增长模型","authors":"A. Pasquini","doi":"10.1109/ISSRE.1994.341396","DOIUrl":null,"url":null,"abstract":"Reliability growth models are the most widely known and used in practical applications. Nevertheless, the performances of these models limit their applicability to the control and assessment of the attainment of very low reliability levels. One of the reasons for their insufficient predictive quality is the scarcity of information they use for reliability estimation. They do not take into account information that could be easily collected from code observation, such as the code complexity, or during testing such as the coverage obtained. The paper analyzes the problems encountered using reliability growth models for the evaluation of software used in a measurement equipment control system.<<ETX>>","PeriodicalId":171359,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability growth modelling of software for process control systems\",\"authors\":\"A. Pasquini\",\"doi\":\"10.1109/ISSRE.1994.341396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliability growth models are the most widely known and used in practical applications. Nevertheless, the performances of these models limit their applicability to the control and assessment of the attainment of very low reliability levels. One of the reasons for their insufficient predictive quality is the scarcity of information they use for reliability estimation. They do not take into account information that could be easily collected from code observation, such as the code complexity, or during testing such as the coverage obtained. The paper analyzes the problems encountered using reliability growth models for the evaluation of software used in a measurement equipment control system.<<ETX>>\",\"PeriodicalId\":171359,\"journal\":{\"name\":\"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering\",\"volume\":\"86 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSRE.1994.341396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.1994.341396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability growth modelling of software for process control systems
Reliability growth models are the most widely known and used in practical applications. Nevertheless, the performances of these models limit their applicability to the control and assessment of the attainment of very low reliability levels. One of the reasons for their insufficient predictive quality is the scarcity of information they use for reliability estimation. They do not take into account information that could be easily collected from code observation, such as the code complexity, or during testing such as the coverage obtained. The paper analyzes the problems encountered using reliability growth models for the evaluation of software used in a measurement equipment control system.<>