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2009 IEEE Behavioral Modeling and Simulation Workshop最新文献

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Fast and waveform independent characterization of current source models 快速和波形独立的电流源模型表征
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338883
Christoph Knoth, V. Kleeberger, P. Nordholz, Ulf Schlichtmann
{"title":"Fast and waveform independent characterization of current source models","authors":"Christoph Knoth, V. Kleeberger, P. Nordholz, Ulf Schlichtmann","doi":"10.1109/BMAS.2009.5338883","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338883","url":null,"abstract":"A fast characterization method for current source models (CSM) is proposed. It analyses the given transistor netlist of CMOS logic cells to determine both static and dynamic CSM parameters in the same DC simulation. To account for the influence of parasitic elements in large logic cells, an additional low pass filter is inserted to the CSMs. AC analysis is employed to efficiently define its parameters. The characterization is therefore independent of user specified input waveforms. CSMs of industrial gates have been integrated into a standard SPICE simulator, showing high accuracy also for noisy input waveforms. Used in path based timing analysis of ISCAS85 circuits, average errors of 3% have been observed while simulation times could be reduced by a factor of 100.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132643555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Analysis and extraction of parametric variation effects on microelectrofluidics-based biochips 微电流体生物芯片参数变化效应分析与提取
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338886
Bao Liu
{"title":"Analysis and extraction of parametric variation effects on microelectrofluidics-based biochips","authors":"Bao Liu","doi":"10.1109/BMAS.2009.5338886","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338886","url":null,"abstract":"Microfluidic biochips require continued online test to ensure their functionality, performance, and reliability in the presence of runtime parametric variation and system wear-out. Previous techniques locate catastrophic defects which guide subsequent droplet scheduling and routing procedures. However, a significant number of defects on a microfluidic biochip are parametric variations, taking them as catastrophic defects leads to incorrectly identified defect locations, which compromises droplet scheduling and routing. This paper presents the first characterization method for continous droplet movement after passing a faulty cell on a microfluidic biochip in the presence of parametric variations, and the first microfluidic biochip parametric variation extraction method locating the critical cells which originate un-recoverable droplet speed loss. The proposed techniques provide better characterization of parametric variations in droplet movement, and enable performance optimization in droplet scheduling and routing on a microfluidic biochip.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121248435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An enhanced macromodeling approach for differential output drivers 差分输出驱动的增强宏建模方法
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338889
Ting Zhu, P. Franzon
{"title":"An enhanced macromodeling approach for differential output drivers","authors":"Ting Zhu, P. Franzon","doi":"10.1109/BMAS.2009.5338889","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338889","url":null,"abstract":"This paper presents an approach for building new compact macromodels of differential output drivers. Composed of enhanced physical-based elements, the new models are capable of capturing the important intrinsic nonlinear and dynamic characteristics of the drivers. We demonstrate the approach with two typical digital drivers, low-voltage differential signaling (LVDS) driver and pre-emphasis driver. The obtained macromodels achieve excellent accuracy in capturing behaviors at various input patterns, loading conditions and supply voltages.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124897168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Virtual skin: a behavioral approach helps verification 虚拟皮肤:一种有助于验证的行为方法
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338897
B. Nicolle, Arnaud Legendre, L. Ferrero, L. Zastrow
{"title":"Virtual skin: a behavioral approach helps verification","authors":"B. Nicolle, Arnaud Legendre, L. Ferrero, L. Zastrow","doi":"10.1109/BMAS.2009.5338897","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338897","url":null,"abstract":"The aim of this study is to develop a new kind of R&D methodology through a VHDL-AMS functional virtual prototype (FVP) applied to cosmetic industries. Cosmetic firms are in the process of improving R&D methodologies with more formal methods. These studies are mostly based on functional models and less laboratory testing. Hence, in cooperation with Lancaster firm, we have built for the first time a unique dynamic model of biophysical and chemical phenomenons linked to human skin and sun spectrum. Human health can be strongly influenced by exposure to solar radiation. Relevant interactions regarding to helth take place mainly in the skin. So, the optics of human skin is of the utmost importance with reflection and absorption properties. By combining a sun emission light model and a bio-optical human skin model, we can copute the effects of the sun radiations on various species including free radicals generation.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116534627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
VHDL-AMS Statistical Analysis for marginal probabilities 边际概率的VHDL-AMS统计分析
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338879
J. Haase, C. Sohrmann
{"title":"VHDL-AMS Statistical Analysis for marginal probabilities","authors":"J. Haase, C. Sohrmann","doi":"10.1109/BMAS.2009.5338879","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338879","url":null,"abstract":"The impact of parameter variations on components' and systems' characteristics, especially in the area of IC design, has been discussed for several years. To investigate the influence of parameter variations on system characteristics, standard Monte Carlo simulation is often used when exact results cannot be obtained using a deterministic algorithm. However, this procedure may require a huge number of simulation runs if marginal probabilities are estimated. This paper shows how importance sampling as a variance reduction technique can be used for estimating small probabilities in simulation experiments based on the SAE J 2748 VHDL-AMS Statistical Analysis Package. Furthermore, application examples are presented to show how the use of parameter sensitivities can help creating random variable distributions for importance sampling.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129664841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
AMS static voltage level check AMS静态电压电平检查
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338888
Marcelo Silva
{"title":"AMS static voltage level check","authors":"Marcelo Silva","doi":"10.1109/BMAS.2009.5338888","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338888","url":null,"abstract":"This paper and presentation describes a methodology for checking multi voltage levels on multiple power domains for analog and mixed signal circuits. Traditional AMS verification does not account for electrical characteristics such as voltage levels in any connection between two discrete ports. Such flows only focus on the functionality aspect of the verification. That leaves a major hole in the verification process, the result of which can lead to a non-functional chip or future reliability problems with that chip. With proper AMS discipline planning, AMSDesigner Block Discipline Resolution (BDR) can be applied to check for voltage mismatches statically (zero time simulation) at elaboration time. It is a very efficient and easy to add additional step to the functional verification approach. This step increases the coverage and serves as an important tool to help address voltage mismatch and reach silicon success first time round.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115494224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mixed-signal test development using open standard modeling and description languages 混合信号测试开发使用开放标准的建模和描述语言
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338885
Ping-Chuan Lu, D. Glaser, G. Uygur, Susanne Weichslgartner, K. Helmreich, A. Lechner
{"title":"Mixed-signal test development using open standard modeling and description languages","authors":"Ping-Chuan Lu, D. Glaser, G. Uygur, Susanne Weichslgartner, K. Helmreich, A. Lechner","doi":"10.1109/BMAS.2009.5338885","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338885","url":null,"abstract":"A novel virtual platform is presented, providing CAD/CAT support for efficient test development and attempting to bridge the gap between design and test. The platform, which models and simulates the entire test environment, provides methodologies, model libraries and tool sets to enable design, debug and verification of all test relevant processes including fault analysis, test algorithm, load board and test program development concurrently with IC design and fabrication phase and later smoothly apply the results to various test systems. One major idea of our work is adopting the open standards approach to guarantee interoperability. In addition, modeling methodologies for virtual tester and virtual silicon are proposed to further enhance interoperability between virtual and real test. To give an insight on how such environment seamlessly integrates into the test development flow, an ADC test which is performed both on the virtual platform and the real tester is described. The simulation environment is built using SystemC/-AMS libraries.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128851487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Behavioral modeling of solute tracking in microfluidics 微流体中溶质跟踪的行为建模
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338896
Yi Zeng, F. Azizi, C. Mastrangelo
{"title":"Behavioral modeling of solute tracking in microfluidics","authors":"Yi Zeng, F. Azizi, C. Mastrangelo","doi":"10.1109/BMAS.2009.5338896","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338896","url":null,"abstract":"We present a general behavioral simulation method for the approximate solution of lumped, pressure-driven, static and time-dependent solute and solvent transport in large microfluidic chips. The method is based on a one-dimensional discretization of the convection-diffusion equation that tracks solvent and solute transport using four dual-branch nodal quantities. A comparison of static and transient behavior of microfluidic dilution networks and a PCM signal generator indicates that the simulation results are in good agreement with the model simulations.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126665051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simulation-based hierarchical sizing and biasing of analog firm IPs 模拟公司ip的基于仿真的分层规模和偏差
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338891
F. Javid, R. Iskander, M. Louërat
{"title":"Simulation-based hierarchical sizing and biasing of analog firm IPs","authors":"F. Javid, R. Iskander, M. Louërat","doi":"10.1109/BMAS.2009.5338891","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338891","url":null,"abstract":"This paper presents a simulation-based hierarchical sizing and biasing tool for analog integrated circuits design. The tool allows the designer to express the sizing procedure in terms of sizing and biasing operators. These operators are technology independent, hence the documented procedure can be easily ran over different technologies. A procedure has been proposed for a single-ended two-stage operational amplifier and evaluated over 130nm, 65nm and 45nm technologies. The results prove the efficiency of the proposed tool.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132359174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Analog behavior refinement in system centric modeling 以系统为中心建模中的模拟行为细化
2009 IEEE Behavioral Modeling and Simulation Workshop Pub Date : 2009-11-20 DOI: 10.1109/BMAS.2009.5338893
Yaseen Zaidi, C. Grimm, Jan Haase
{"title":"Analog behavior refinement in system centric modeling","authors":"Yaseen Zaidi, C. Grimm, Jan Haase","doi":"10.1109/BMAS.2009.5338893","DOIUrl":"https://doi.org/10.1109/BMAS.2009.5338893","url":null,"abstract":"SoC designs consisting of analog, digital, mixed signal, RF and software blocks are commonplace. SystemC AMS offers the potential for a unified modeling approach for such systems through executable specification. SystemC AMS uses different Models of Computation to gain simulation performance, most notably by abstracting timing information which demands the simulator solvers to be fast, fair and simple. In this paper we present a method to fortify SystemC AMS extensions with commercial analog solvers while maintaining adequate simulation speed for an overall system simulation. These solvers are more exact to describe specific circuit behavior in nonlinear conditions and wide time ranges. An example system is also presented that implements the proposed scheme.","PeriodicalId":169567,"journal":{"name":"2009 IEEE Behavioral Modeling and Simulation Workshop","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115431684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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