2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)最新文献_第6页

Modeling and analysing operation processes for dependability 建模和分析操作过程的可靠性

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575337

Xiwei Xu, Liming Zhu, J. Li, L. Bass, Q. Lu, Min Fu

引用次数: 3

Security implications of memory deduplication in a virtualized environment 虚拟化环境下内存重复数据删除的安全问题

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575349

Jidong Xiao, Zhang Xu, Hai Huang, Haining Wang

引用次数: 64

Manipulating semantic values in kernel data structures: Attack assessments and implications 操纵内核数据结构中的语义值:攻击评估和影响

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575344

Aravind Prakash, Eknath Venkataramani, Heng Yin, Zhiqiang Lin

{"title":"Manipulating semantic values in kernel data structures: Attack assessments and implications","authors":"Aravind Prakash, Eknath Venkataramani, Heng Yin, Zhiqiang Lin","doi":"10.1109/DSN.2013.6575344","DOIUrl":"https://doi.org/10.1109/DSN.2013.6575344","url":null,"abstract":"Semantic values in kernel data structures are critical to many security applications, such as virtual machine introspection, malware analysis, and memory forensics. However, malware, or more specifically a kernel rootkit, can often directly tamper with the raw kernel data structures, known as DKOM (Direct Kernel Object Manipulation) attacks, thereby significantly thwarting security analysis. In addition to manipulating pointer fields to hide certain kernel objects, DKOM attacks may also mutate semantic values, which are data values with important semantic meanings. Prior research efforts have been made to defeat pointer manipulation attacks and thus identify hidden kernel objects. However, the space and severity of Semantic Value Manipulation (SVM) attacks have not received sufficient understanding. In this paper, we take a first step to systematically assess this attack space. To this end, we devise a new fuzz testing technique, namely - duplicate-value directed semantic field fuzzing, and implement a prototype called MOSS. Using MOSS, we evaluate two widely used operating systems: Windows XP and Ubuntu 10.04. Our experimental results show that the space of SVM attacks is vast for both OSes. Our proof-of-concept kernel rootkit further demonstrates that it can successfully evade all the security tools tested in our experiments, including recently proposed robust signature schemes. Moreover, our duplicate value analysis implies the challenges in defeating SVM attacks, such as an intuitive cross checking approach on duplicate values can only provide marginal detection improvement. Our study motivates revisiting of existing security solutions and calls for more effective defense against kernel threats.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121728291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 26

Improving SSD reliability with RAID via Elastic Striping and Anywhere Parity 通过弹性条带和任意奇偶校验提高RAID的SSD可靠性

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575359

Jaeho Kim, Jongmin Lee, Jongmoo Choi, Donghee Lee, S. Noh

{"title":"Improving SSD reliability with RAID via Elastic Striping and Anywhere Parity","authors":"Jaeho Kim, Jongmin Lee, Jongmoo Choi, Donghee Lee, S. Noh","doi":"10.1109/DSN.2013.6575359","DOIUrl":"https://doi.org/10.1109/DSN.2013.6575359","url":null,"abstract":"While the move from SLC to MLC/TLC flash memory technology is increasing SSD capacity at lower cost, it is being done at the cost of sacrificing reliability. An approach to remedy this loss is to employ the RAID architecture with the chips that comprise SSDs. However, using the traditional RAID approach may result in negative effects as the total number of writes may increase due to the parity updates, consequently leading to increased P/E cycles and higher bit error rates. Using a technique that we call Elastic Striping and Anywhere Parity (eSAP), we develop eSAP-RAID, a RAID scheme that significantly reduces parity writes while providing reliability better than RAID-5. We derive performance and lifetime models of SSDs employing RAID-5 and eSAP-RAID that show the benefits of eSAP-RAID. We also implement these schemes in SSDs using DiskSim with SSD Extension and validate the models using realistic workloads. Our results show that eSAP-RAID improves reliability considerably, while limiting its wear. Specifically, the expected lifetime of eSAP-RAID employing SSDs may be as long as current ECC based SSDs, while its reliability level can be maintained at the level of the early stages of current ECC based SSDs throughout its entire lifetime.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127805607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 58

An adaptive approach to dependable circuits for a digital power control 一种数字功率控制可靠电路的自适应方法

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575333

Aromhack Saysanasongkham, K. Imai, M. Arai, S. Fukumoto, K. Wada

引用次数: 0

Fault detection and localization in distributed systems using invariant relationships 基于不变关系的分布式系统故障检测与定位

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575304

Abhishek B. Sharma, Haifeng Chen, Min Ding, K. Yoshihira, Guofei Jiang

引用次数: 49

State-of-the-practice in data center virtualization: Toward a better understanding of VM usage 数据中心虚拟化的实践现状:更好地理解虚拟机的使用

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575350

R. Birke, Andrej Podzimek, L. Chen, E. Smirni

{"title":"State-of-the-practice in data center virtualization: Toward a better understanding of VM usage","authors":"R. Birke, Andrej Podzimek, L. Chen, E. Smirni","doi":"10.1109/DSN.2013.6575350","DOIUrl":"https://doi.org/10.1109/DSN.2013.6575350","url":null,"abstract":"Hardware virtualization is the prevalent way to share data centers among different tenants. In this paper we present a large scale workload characterization study that aims to a better understanding of the state-of-the-practice, i.e., how data centers in the private cloud are used by their customers, how physical resources are shared among different tenants using virtualization, and how virtualization technologies are actually employed. Our study focuses on all corporate data centers of a major infrastructure provider that are geographically dispersed across the entire globe and reports on their observed usage across a 19-day period. We especially focus on how virtual machines are deployed across different physical resources with an emphasis on processors and memory, focusing on resource sharing and usage of physical resources, virtual machine life cycles, and migration patterns and frequencies. Our study illustrates that there is a huge tendency in over provisioning resources while being conservative to the several possibilities opened up by virtualization (e.g., migration and co-location), showing tremendous potential for the development of policies aiming to reduce data center operational costs.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"158 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123130629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 57

Evaluating Xilinx SEU Controller Macro for fault injection 评估Xilinx SEU控制器宏的故障注入

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575336

J. Nunes, J. Cunha, R. Barbosa, M. Z. Rela

引用次数: 5

Stress balancing to mitigate NBTI effects in register files 压力平衡以减轻寄存器文件中的NBTI影响

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575315

H. Amrouch, T. Ebi, J. Henkel

{"title":"Stress balancing to mitigate NBTI effects in register files","authors":"H. Amrouch, T. Ebi, J. Henkel","doi":"10.1109/DSN.2013.6575315","DOIUrl":"https://doi.org/10.1109/DSN.2013.6575315","url":null,"abstract":"Negative Bias Temperature Instability (NBTI) is considered one of the major reliability concerns of transistors in current and upcoming technology nodes and a main cause of their diminished lifetime. We propose a new means to mitigate the effects of NBTI on SRAM-based register files, which are particularly vulnerable due to their small structure size and are under continuous voltage stress for prolonged intervals. The conducted results from our technology simulator demonstrate the severity of NBTI effects on the SRAM cells - especially when process variation is taken into account. Based on the presented analysis, we show that NBTI stress in different registers needs to be tackled using different strategies corresponding to their access patterns. To this end, we propose to selectively increase the resilience of individual registers against NBTI. Our technique balances the gate voltage stress of the two PMOS transistors of an SRAM cell such that both are under stress for approximately the same amount of time during operation - thereby minimizing the deleterious effects of NBTI. We present mitigation implementations in both hardware and in software along with the incurred overhead. Through a wide range of applications we can show that our technique reduces the NBTI-induced reliability degradation by 35% on average. This is 22% better than current State-of-the-Art.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116353601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 35

Error detector placement for soft computation 用于软计算的错误检测器位置

2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) Pub Date : 2013-06-24 DOI: 10.1109/DSN.2013.6575353

Anna Thomas, K. Pattabiraman

{"title":"Error detector placement for soft computation","authors":"Anna Thomas, K. Pattabiraman","doi":"10.1109/DSN.2013.6575353","DOIUrl":"https://doi.org/10.1109/DSN.2013.6575353","url":null,"abstract":"The scaling of Silicon devices has exacerbated the unreliability of modern computer systems, and power constraints have necessitated the involvement of software in hardware error detection. At the same time, emerging workloads in the form of soft computing applications, (e.g., multimedia applications) can tolerate most hardware errors as long as the erroneous outputs do not deviate significantly from error-free outcomes. We term outcomes that deviate significantly from the error-free outcomes as Egregious Data Corruptions (EDCs). In this study, we propose a technique to place detectors for selectively detecting EDC causing errors in an application. We performed an initial study to formulate heuristics that identify EDC causing data. Based on these heuristics, we developed an algorithm that identifies program locations for placing high coverage detectors for EDCs using static analysis.We evaluate our technique on six benchmarks to measure the EDC coverage under given performance overhead bounds. Our technique achieves an average EDC coverage of 82%, under performance overheads of 10%, while detecting 10% of the Non-EDC and benign faults.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127494172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 60