Xiwei Xu, Liming Zhu, J. Li, L. Bass, Q. Lu, Min Fu
{"title":"建模和分析操作过程的可靠性","authors":"Xiwei Xu, Liming Zhu, J. Li, L. Bass, Q. Lu, Min Fu","doi":"10.1109/DSN.2013.6575337","DOIUrl":null,"url":null,"abstract":"Application dependability issues depend on increasingly sophisticated activities during operation time for deployment, upgrade, scaling out/in and reactions to various failures. Traditional approaches to improving application dependability focus on artifact-oriented troubleshooting and improvements. In this paper, we present an approach using process models to represent and analyze operations with considerations of exception handlings and fault-proneness. Our goal is to reduce diagnosis and repair time for application failures that occur during operation activities such as deployment and upgrade.","PeriodicalId":163407,"journal":{"name":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"138 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Modeling and analysing operation processes for dependability\",\"authors\":\"Xiwei Xu, Liming Zhu, J. Li, L. Bass, Q. Lu, Min Fu\",\"doi\":\"10.1109/DSN.2013.6575337\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Application dependability issues depend on increasingly sophisticated activities during operation time for deployment, upgrade, scaling out/in and reactions to various failures. Traditional approaches to improving application dependability focus on artifact-oriented troubleshooting and improvements. In this paper, we present an approach using process models to represent and analyze operations with considerations of exception handlings and fault-proneness. Our goal is to reduce diagnosis and repair time for application failures that occur during operation activities such as deployment and upgrade.\",\"PeriodicalId\":163407,\"journal\":{\"name\":\"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)\",\"volume\":\"138 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSN.2013.6575337\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2013.6575337","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling and analysing operation processes for dependability
Application dependability issues depend on increasingly sophisticated activities during operation time for deployment, upgrade, scaling out/in and reactions to various failures. Traditional approaches to improving application dependability focus on artifact-oriented troubleshooting and improvements. In this paper, we present an approach using process models to represent and analyze operations with considerations of exception handlings and fault-proneness. Our goal is to reduce diagnosis and repair time for application failures that occur during operation activities such as deployment and upgrade.