NCSL International Workshop & Symposium Conference Proceedings 2016最新文献_第3页

System for Traceable Calibration of Nanonewton Forces and Force vs. Deformation Curves 纳米牛顿力和力与变形曲线的可追溯校准系统

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.26

J. Schleichert

{"title":"System for Traceable Calibration of Nanonewton Forces and Force vs. Deformation Curves","authors":"J. Schleichert","doi":"10.51843/wsproceedings.2016.26","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.26","url":null,"abstract":"The paper discusses a system for the measurement and calibration of nanonewton forces and force vs. deformation curves of micro force sensors such as AFM Cantilevers. The system bases on an electromagnetic compensated microbalance whereas its control loop was modified to generate and measure the force at the same time without the need of an additional actuator. Thus, the concept is similar to the NIST Electrostatic Force Balance where the force is generated and measured based on a capacitor. To probe the micro force sensor under calibration, the balance pan is moved by feeding a defined current through the balance internal coil. Thereby the current is proportional to the acting force which was calibrated with milligram mass artifacts before. The movement of the balance pan as well as the position of the micro force sensor under test is measured with a special triple beam interferometer. Hence, the calibration of forces and force vs. deformation curves is traceable to the SI units mass and length. To compare our concept of force generation to the concept of PTB and KRISS an additional piezo actuator was integrated in the setup. Thus, we can alternatively push the micro force sensor under test onto the balance pan using the piezo. Measurement and calibration results will be presented and discussed. A standard deviation of < 1 nN is achieved for the measurement of constant forces. The stiffness (force vs. deformation curve) of a contact mode AFM cantilever was calibrated to be 0.26 N/m with a repeatability of 0.25 %. Thereby linearity deviations of < 1 nN were observed for this measurement. Due to the uncertainty of the contact parameters (contact angle and position as well as friction) between the AFM tip and the stylus mounted on the balance pan the combined uncertainty of the calibration is in the range 3 %.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130181942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Design of Digital Controllers for Electromagnetic Force Compensated Balances Focused on the Disturbance Transfer Function 基于扰动传递函数的电磁力补偿天平数字控制器设计

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.24

N. Rogge

{"title":"Design of Digital Controllers for Electromagnetic Force Compensated Balances Focused on the Disturbance Transfer Function ","authors":"N. Rogge","doi":"10.51843/wsproceedings.2016.24","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.24","url":null,"abstract":"The main objective of the paper is to propose a new possible design process for controllers in electromagnetic force compensated balances (EMFC). Controllers used in EMFC balances demand a high precision of the measured and generated electrical quantities. Regarding to the achievable uncertainty in static measurements, EMFC balances are state of the art, but in future applications the importance of dynamic applications will probably increase. Therefore the controlled system should possess a high measurement bandwidth to reduce the measurement time in dynamic applications. For digital controller concepts this results in ambitious requirements on the controller hardware especially on the digital-to-analog and analog-to-digital converters. The paper will illuminate the limitations caused by commercial off-the-shelf standard hardware and propose a possible alternative hardware concept. A design process will be presented, which is strongly focused on the disturbance transfer function of the control loop. This can be achieved by building a detailed model of the balance behavior, in particular by modeling the disturbance sensitivity. Based on the consideration of these additional system characteristics in the controller design process, the measurement time of the balance is reduced significantly compared to conventional PID controllers. By using a specially developed controller hardware environment, this is also achievable with a low static uncertainty of the controlled balance.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126439730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Assessing Your Laboratories Technical Competence in Regards to the Requirements of ISO/IEC 17025:2005, Section 5 根据ISO/IEC 17025:2005第5部分的要求评估你们实验室的技术能力

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.40

M. J. Kramer

{"title":"Assessing Your Laboratories Technical Competence in Regards to the Requirements of ISO/IEC 17025:2005, Section 5","authors":"M. J. Kramer","doi":"10.51843/wsproceedings.2016.40","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.40","url":null,"abstract":"This will look at a practical and efficient way of assessing your laboratory's compliance to Section 5 of ISO/IEC 17025:2005. An assessment of Section 5 should consist of much more than just cross referencing requirements of the Quality Management System. This paper will provide an overview of each pertinent technical section of the standard and provide a hands on approach to assessing the laboratory's compliance to the elements of ISO/IEC 17025:2005. It will educate users on how to proactively uncover nonconformities which may arise when performing daily routine calibrations or tests. Each part of Section 5 will be reviewed and will include an interpretation of key elements, along with objective evidence in which internal auditors should request while actually witnessing the calibrations or tests being undertaken. This will incorporate a front door to backdoor approach from the acceptance of an artifact to the return of an artifact to a client. Key elements of Section 4 will also be discussed as applicable. This will benefit participants involved in the quality operation of a laboratory, particularly those designated to conduct or oversee internal audits and results.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128178590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Computer Aided Calibration of Voltage and Current Surge Generator in Accordance with IEC 61000-4-5:2014 电压和电流浪涌发电机的计算机辅助校准，符合IEC 61000-4-5:2014

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.39

Samuel C. K. Ko

{"title":"Computer Aided Calibration of Voltage and Current Surge Generator in Accordance with IEC 61000-4-5:2014","authors":"Samuel C. K. Ko","doi":"10.51843/wsproceedings.2016.39","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.39","url":null,"abstract":"Reliable electrical and electronic equipment are designed to immense against different kinds of electromagnetic interference such as voltage dip, burst, electrostatic discharge, and surge. Surge is a 'slow transient overvoltage' with frequency contents below 10 MHz which may cause electrical and thermal damages to the equipment. Surges are created by switching events and insulation faults in AC power distribution networks, lightning and others. A combination wave generator which simulates the switching and lightning transients is used to evaluate the immunity performance of equipment under test against high energy surge interference. The Standards and Calibration Laboratory (SCL) has recently set up a system to calibrate 1.2/50 μs - 8/20 μs or 10/700 μs - 5/320 μs combination wave generators by laboratory digital oscilloscope in accordance with the latest international standard IEC 61000-4-5:2014. The new revision has made many significant changes including redefinition of the surge waveforms and the evaluation of measurement uncertainty. The calibration parameters include the front time, duration and voltage surge peak. The principle of the calibration is to convert the high voltage or high current surge pulse waveform to lower signal waveform by calibrated potential divider or burden respectively. System response time including the oscilloscope, divider and the burden must be considered to characterize the surge waveform accurately. The required voltage and timing measurement is taken by computer automatically to reduce human error and to enhance consistency. The best measurement uncertainties of the front time, duration and surge peak are 5%, 2% and 3% respectively with test output voltage of 0.5 to 4 kV.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125260882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Conformance Decision Rules to Support ISO/IEC CD2 17025 Under Revision 支持ISO/IEC CD2 17025修订的一致性决策规则

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.32

R. Stern

{"title":"Conformance Decision Rules to Support ISO/IEC CD2 17025 Under Revision","authors":"R. Stern","doi":"10.51843/wsproceedings.2016.32","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.32","url":null,"abstract":"The current draft of ISO/IEC CD 17025 contains a clause to document the decision rule for conformity along with the risk and statistical assumptions in the test method or procedure (7.1.1d). So how shall we do this? A common strategy for managing measurement decision risk is to choose a guard-band that results in a desired false-accept risk given a tolerance limit, the calibration process uncertainty, and the a priori probability. JCGM 106:2012 provides guidance for the implementation of prior knowledge in conformance decisions, however a good estimate of the a priori probability may be difficult to obtain. Historical device population information for estimating a priori probability may not be readily available such as \"testing\" applications where the device is a prototype. This paper presents the false-accept risk and corresponding false-reject risk for four decision rules. We provide simple equations to limit risk to pre-determined amounts. Several case studies illustrate when to use \"Specific\" or \"Global\" risk. When \"Global\" risk is appropriate, the decision rules can be applied with limited knowledge of a priori probability.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128690298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Calibration Of Infrasound Measurement Devices 次声测量装置的校正

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.42

M. Mende

{"title":"Calibration Of Infrasound Measurement Devices","authors":"M. Mende","doi":"10.51843/wsproceedings.2016.42","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.42","url":null,"abstract":"Infrasound measurement devices like low frequency microphones and dynamic pressure sensors are widely used in many branches of trade like aerospace industries (airflow mechanics) or acoustical engineering (infrasound measurements of geophysical events, emissions of wind energy plants, etc.). This paper presents a calibration system that allows the calibration of such devices in a frequency range as low as 0.1 Hz to 31.5 Hz. It is based on a special low frequency pressure chamber that uses a similar working principle as a pistonphone but is adapted to the requirements of this low frequency range. The chamber has a size that allows to place the whole device under test (DUT) inside the chamber. So no mechanical adaption between DUT and pressure chamber is required and thus the DUT can have a nearly arbitrary shape. Other than a pistonphone which is based on the assumption that the sound level can be calculated from the physical dimensions of the chamber by means of the adiabatic gas law, this calibration system requires the use of a reference standard sensor. This is due to the fact that in the low frequency range the gas compression becomes more and more an isothermal process the lower the applied frequency gets. Thus a pressure sensor is used as reference standard allowing high precision measurements (uncertainty < 0.05 dB). The paper discusses the question how the measurement uncertainty over the whole frequency can be determined although the reference pressure sensor is only calibrated by static pressure calibration. It also shows how other parameters like the homogeneity of the pressure field can be determined that contribute to the measurement uncertainty. Finally some calibration results will be presented.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127802390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Calibration of Elctrocardiograph (ECG) Simulators 校准心电图(ECG)模拟器

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.36

Steven S. L. Yang

{"title":"Calibration of Elctrocardiograph (ECG) Simulators","authors":"Steven S. L. Yang","doi":"10.51843/wsproceedings.2016.36","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.36","url":null,"abstract":"The Standards and Calibration Laboratory (SCL) in Hong Kong has set up a calibration facility for electro-cardio graph (ECG) simulators. ECGs are medical devices designed to measure the electrical signals associated with cardiac activity. They are used to diagnose heart diseases and arrhythmias, which are commonly used in hospitals, emergency facilities and medical institutes. Routine performance check of ECGs could be performed by ECG simulator. In order to ensure the accuracy of the instruments, calibration procedures which are traceable to primary standards or SI units are essential. At the SCL, the output signal from an ECG simulator is measured by a differential amplifier and a high speed digital sampling system. The system also includes a reference voltage source, an inductive voltage divider and a control computer. Digital sampling system enables the calibration of non-sinusoidal wave with high accuracy. Signal characteristics including signal amplitude, frequency and wave form could be evaluated by an in-house developed program for normal sinus rhythm waveforms as well as for ECG performance waveforms (sinusoidal, triangle, square and pulse). Since the test signal is in the sub-millivolt (mV) range, a differential amplifier with high common mode rejection ratio is used to amplify the test signal. The frequency response of the differential amplifier is calibrated by a reference voltage source and an inductive voltage divider, whereas the digital sampling system is calibrated against the laboratory's voltage and frequency reference standards. The developed calibration system is capable of measuring signals in the sub-mV level with test uncertainty ratio (TUR) better than 4. Details of the system configurations and the uncertainty evaluation will be described in the paper.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124625815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Calibration of Optical Fiber Time Domain Reflectometers in Accordance with IEC 61749-1:2009 根据IEC 61749-1:2009校准光纤时域反射计

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.34

Samuel C. K. Ko

{"title":"Calibration of Optical Fiber Time Domain Reflectometers in Accordance with IEC 61749-1:2009","authors":"Samuel C. K. Ko","doi":"10.51843/wsproceedings.2016.34","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.34","url":null,"abstract":"Optical time domain reflectometers (OTDR) are widely used in testing, installation and maintenance of optical communication networks. An OTDR launches a series of high speed pulses into a fibre network and measures the amplitude and the delay time of reflected signals to locate events or faults along a fibre link. Precise measurement capabilities of an OTDR on distance, loss/attenuation and reflectance are required to locate and evaluate the severity of faults accurately. The Standards and Calibration Laboratory (SCL) has developed a calibration system for calibrating single mode OTDRs fitted with FC connectors at wavelength 1310 nm and 1550 nm in accordance with the international standards IEC 61746-1:2009. The characteristic parameters calibrated include the distance deviation, attenuation deviation and reflectance deviation. The principle of the calibration is to apply a set of reference standards, namely distance calibration artifact, attenuation calibration artifact and reflectance calibration artifacts, to the OTDR, and to compare against the displayed values for a given OTDR setting. The distance calibration artifact consists of a recirculating delay line and of a lead-in fiber which generates a series of reflection peaks separated by calculable distances. The linear regression of the measured data is processed in Microsoft Excel to estimate the distance scale deviation and zero location offset. The attenuation artefact consists of a G.652 fibre spool with known spectral attenuation and attenuation uniform. The reflectance artifact is composed of a set of known reflectances ranging from -10 dB to -50 dB. The best measurement uncertainties for the distance, attenuation and reflectance deviation calibration are 2m, 0.06 dB and 1.7 dB respectively.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130686845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Metrology of Navy Directed Energy Weapons 海军定向能武器计量

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.22

S. Sanyal

引用次数: 1

Modeling Insulation Leakage Effects on Platinum Resistance Thermometer Performance 模拟绝缘泄漏对铂电阻温度计性能的影响

NCSL International Workshop & Symposium Conference Proceedings 2016 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2016.10

M. Coleman

引用次数: 0

NCSL International Workshop &amp; Symposium Conference Proceedings 2016最新文献

NCSL International Workshop & Symposium Conference Proceedings 2016最新文献