NCSL International Workshop & Symposium Conference Proceedings 2016最新文献

{"title":"Up to 50 GHz Microwave Frequency Measurement Using Down-Convert Technique at Telecommunication  Laboratories, Taiwan  ","authors":"C. Liao","doi":"10.51843/wsproceedings.2016.29","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.29","url":null,"abstract":"TL has established its microwave frequency measurement capability by using a microwave signal synthesizer (~40 GHz) and a microwave counter (~46 GHz) from 2010. Our initial setup of microwave frequency measurement system, utilized direct frequency measurement, couldn't meet the requirement for calibrating a Device under test(DUT) with high frequency accuracy. Therefore, an indirect measuring way utilizing down-convert technique has been used for microwave frequency measurement with enough resolution. In 2012, a HP 83630L signal generator (served as a DUT, ~26.5 GHz ) was used to output a nominal frequency signal to be measured, and the Agilent E8257D synthesizer was then adjusted accordingly to keep a constant difference frequency output (10 MHz) from the mixer. The SR620 time interval counter was popularly used in T&F measurement and which has been adopted in our indirect measurement since 2012. In 2014, an amplified doubler was used to extend the DUT's output to the upper frequency limit provided by the E8257D (40 GHz). The measurement capability of our system was then changed to 40 GHz. In this study, we will follow our previse scheme of 2014 and upgrade the measurement range up to 50GHz. The uncertainty budget will also be discussed.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130833537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Influence Of Adapters On Precision AC and RF Voltage Measurements","authors":"S. Cular","doi":"10.51843/wsproceedings.2016.13","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.13","url":null,"abstract":"Electrical connector adapters, especially for inter-series connections, play a pivotal role in calibrations of electrical standards and devices. The conventional wisdom of using as few adapters as possible certainly is valid; however, this paper quantifies the influence of common co-axial adapters on voltage measurements up to 100 MHz. Measured values show that a single adapter can result in a voltage error of up to 3.5 %, while measurement uncertainty is estimated to be 0.2 % (k = 2) without factoring in the adapter. Results based on AC-DC and RF-DC voltage difference measurements are presented for inter-series connections of BNC, N-type, and GR874 series connectors. Adapter length was found to be nearly independent of connector series, and a generalized empirical model was generated based on the test frequency and adapter length. The model was validated with beaded airlines of varying lengths. Preliminary results indicated the proposed model can be used as an initial estimate of the error introduced by an adapter; however, additional testing of adapters of different materials and types is required prior to accepting such a generalized approximation. Additionally observations of wear characteristics and general repeatability are presented for consideration.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123750079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Summary of Electronic Balance Calibration Proficiency Testing in Taiwan","authors":"Yi-Ting Chen","doi":"10.51843/wsproceedings.2016.14","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.14","url":null,"abstract":"Proficiency testing is an established way to demonstrate a laboratory's measurement capabilities. Accredited laboratories are usually requested to participate in proficiency testing conducted by the laboratory accreditation organizations in their countries. The Center for Measurement Standards / Industrial Technology Research Institute (CMS/ITRI) has long been committed to measurement technologies and statistical engineering in Taiwan and is one of the Proficiency Testing Providers (PTPs), with an accreditation number of P002, accredited by Taiwan Accreditation Foundation (TAF). This paper summarizes the result of a 2014 Electronic Balance calibration proficiency testing scheme, number PT2014-KC05, held from November 10, 2014 till December 12, 2014 in Taiwan. Fifteen laboratories participated in this proficiency testing, identified by A, B, C, D... to read the result in the summary report. Because there was no central laboratory, the pilot used robust statistics to calculate the assigned value and expanded uncertainty of all participating laboratories' results. Through statistic analysis, the |En| values of each participating laboratory is smaller than one. This implies that all the participants' results are satisfactory with respect to each other and that the measurement capabilities of laboratories performing electronic balance calibrations are very consistent in Taiwan.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132198962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Extending Oscilloscope Bandwidth Calibrations To 27GHz","authors":"P. Roberts","doi":"10.51843/wsproceedings.2016.28","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.28","url":null,"abstract":"Until recently, finding a convenient solution for oscilloscope bandwidth calibrations above 6GHz using levelled sinewaves was problematic, currently the highest frequency provided by oscilloscope calibrators. Imputing equivalent bandwidth from a fast edge rise time measurement is possible (to around 15GHz with the fastest calibrator 25ps risetime edge), but may be impractical or inappropriate. Alternatively, users often resort to the added complexity of a high frequency signal generator, power splitter and power meter. A new RF calibrator greatly speeds up and simplifies oscilloscope bandwidth testing up to 27GHz. This paper overviews oscilloscope calibration, including levelled sine and fast pulse bandwidth testing methods, and describes how such an RF calibrator may be used alongside dedicated oscilloscope calibrators or other multi-product calibrators with oscilloscope calibration options. Considerations for placing trigger signal pick-off devices inside the RF calibrator's automated digital levelling loop and also evaluating and combining mismatch errors are discussed.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121444735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Design of a Table-Top Watt Balance","authors":"N. Rogge","doi":"10.51843/wsproceedings.2016.25","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.25","url":null,"abstract":"The main objective of the paper is to propose a new possible design process for controllers in electromagnetic force compensated balances (EMFC). Controllers used in EMFC balances demand a high precision of the measured and generated electrical quantities. Regarding to the achievable uncertainty in static measurements, EMFC balances are state of the art, but in future applications the importance of dynamic applications will probably increase. Therefore the controlled system should possess a high measurement bandwidth to reduce the measurement time in dynamic applications. For digital controller concepts this results in ambitious requirements on the controller hardware especially on the digital-to-analog and analog-to-digital converters. The paper will illuminate the limitations caused by commercial off-the-shelf standard hardware and propose a possible alternative hardware concept. A design process will be presented, which is strongly focused on the disturbance transfer function of the control loop. This can be achieved by building a detailed model of the balance behavior, in particular by modeling the disturbance sensitivity. Based on the consideration of these additional system characteristics in the controller design process, the measurement time of the balance is reduced significantly compared to conventional PID controllers. By using a specially developed controller hardware environment, this is also achievable with a low static uncertainty of the controlled balance.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116289613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Comparative Calculations to Evaluate Proposed Changes to the Gum","authors":"R. Geisthardt","doi":"10.51843/wsproceedings.2016.20","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.20","url":null,"abstract":"An ongoing effort is underway to revise the Guide to the Expression of Uncertainty in Measurement (GUM). The initial draft in early 2015 was met with intense scrutiny, however understanding the proposed changes from an implementation standpoint is important even if the new method is only partially adopted. The current proposal, removes reference to effective degrees of freedom as calculated by the Welch-Satterthwaite formula. The move to evaluate Type A components of uncertainty using Bayesian statistics represents a departure from traditional GUM methodology. To understand better the pros and cons of the proposal, this paper will present a series of examples showing the traditional method of evaluating data verses the Bayesian approach. The results are then employed in the evaluation of uncertainty using both Linear and Monte Carlo propagation to show the how the new approach changes the output. Combinations of different probability distributions with different relative sizes, and different equations are used to help the reader better analyze and evaluate the impact of such a change.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"13 6 Suppl 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123656795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Dimnesional Fidelity of Replica Casting Compounds","authors":"Edward O'Brien, Nishant Patel, James Woods, Rick Mertes, H. Tran","doi":"10.51843/wsproceedings.2016.19","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.19","url":null,"abstract":"Difficulty arises when wanting to measure features on a part or assembly that is inaccessible with measuring equipment. Sometimes, these features are small and in a recess, such as an O-ring groove; other times, the feature is on a complete assembly which is large, such as a valve seat on an engine. A common practice is to use a replica casting compound to make a negative impression of the feature of interest and measure the replica. Advantages of making replicas include being able to (1) measure a small imperfection on a large piece without having to disassemble or destroy the original, (2)provide archiving of such imperfections, and (3) eliminate light scattering which might cause difficulty with some optical techniques for dimensional metrology. Reprorubber®, a metrology-grade casting material, is a commonly used silicone-based replica casting compound made from polyvinyl siloxane (PVS). We investigated the fidelity to which this material replicates surface texture and geometry, using step height reference specimens and parameter reference specimens (Type A per ASME B46.1:2009), along with the fidelity for longer spatial wavelength features using optical flats (and Type C specimens per ASME B46.1:2009), and other surfaces with known form geometry. Results of step heights are presented here, but all results will be presented at the conference. Our results are used to assign a Type B uncertainty associated with the replication process when replicating a feature which is inaccessible to dimensional instruments.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122253275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Worldwide Measurement Traceability Challenges From an OEM Support Point of View","authors":"Jorge Martins","doi":"10.51843/wsproceedings.2016.33","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.33","url":null,"abstract":"This paper address some of the challenges that a Test & Measurement (T&M) manufacturer faces when the decision is made to move a production line or the entire manufacturing process to a low cost region. All manufacturing resources and supporting services plan and execute for the big relocation. One area that is sometimes neglected is identifying reliable local or regional calibration providers to support your T&M equipment at the required uncertainty, turnaround time (TAT) and quality of service. Questions that must be answered include accounting for import/export fees, and managing delays and logistics. In addition, do you have specific instructions and requirements on how your T&M equipment is calibrated to achieve the required measurement performance and ensure the final quality of your products? What was before a well establish calibration process with a reliable TAT, becomes a two month ordeal with added expenses that can put your production goals and equipment maintenance budget at risk. This paper will share our experience and concerns when some of our production lines were relocated to facilities around the world, one to Western Europe and the other to the Far East Asia.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"2004 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129636083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Remote Auditing - Love It Or Hate It - Let's Embrace It!","authors":"G. Robinson","doi":"10.51843/wsproceedings.2016.08","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.08","url":null,"abstract":"The concept of Remote Auditing (often called E-Auditing) is a polarizing idea in the metrology community. Staunch advocates offer claims that audits can and should be 100% remote and that on-site visits are a vestige of the pre-internet business world. Equally staunch opponents are passionate that without a physical visit an effective audit is simply not possible. The truth is somewhere in the middle. As part of a toolbox of auditing techniques, Remote Auditing can contribute to reduction of the cost of an audit program and may offer flexibility, especially in internal auditing. Remote auditing can be used to reduce, but not eliminate, on-site visits and hence save travel costs and temper the operational impact by reducing audit interruptions to manufacturing and service. But can we ensure remote auditing techniques produce reliable, repeatable and validated results? This paper will show, through real examples, a method of incorporating remote auditing into robust audit program. Examples will be shared regarding when it is or is not an effective tool and how it can be combined with and enhance traditional on-site auditing processes. Additional examples illustrate when remote auditing is not effective and when its use may actually hinder the internal audit process. Pros and cons, data comparing potential savings, best practices and lessons learned will be presented. The conclusion of the paper is that while it is not a stand-alone process, the inclusion of effective Remote Auditing techniques can contribute significantly to the overall goals of cost and time reduction in an audit program, without sacrificing audit quality.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114641860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Review of In-situ Temperature Measurements for Additive Manufacturing Technologies","authors":"Ryan Murphy","doi":"10.51843/wsproceedings.2016.11","DOIUrl":"https://doi.org/10.51843/wsproceedings.2016.11","url":null,"abstract":"Additive manufacturing (AM) encompasses a rapidly advancing host of technologies used for building parts with complex geometrical shapes layer-by-layer from a wide range of materials such as polymers, glasses, ceramics, metals, and metal-alloys. A wide variety of AM processes are used to build parts on test beds using processes such as material extrusion and laser or e-beam irradiation of powders and liquids, depending on the industrial or commercial application. Unfortunately the dimensional and compositional quality of AM built parts highly depends on the technology, and can even significantly vary between different AM machines of the same technology, due to a lack of process feedback and control. Improvements have been made by performing computational modeling and ex-situ characterization such as x-ray diffraction, focused ion beam cross-sectioning, x-ray computed tomography, and electron microscopy. These techniques, however, are time consuming, expensive, and do not allow in-situ monitoring of parts as they are built. In-situ temperature measurements are promising as they monitor the build temperature and can provide feedback for better process control. Thermal imaging is widely-used for in-situ temperature measurements, but is limited to qualitative data due to the unpredictability of emissivity as temperature and composition dynamically change. Two-color pyrometry and mm-wave radiometry measurements promise to circumvent these problems but have their own dimensional limitations. These methods and others will be compared and contrasted, and future improvements of in-situ temperature measurements will also be discussed. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the US Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000. Certain commercial equipment, instruments, or materials are identified in this paper in order to adequately describe the experimental procedure. Such identification does not imply recommendation or endorsement by the authors, Sandia National Laboratories, or NCSL International, nor does it imply that the materials or equipment identified are the only or best available for the purpose.","PeriodicalId":162467,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2016","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116165569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}