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Proceedings of IEEE Symposium on Electromagnetic Compatibility最新文献

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Wide frequency impedance modeling of EMI ferrites 电磁干扰铁氧体的宽频阻抗建模
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385658
W. Kimmel
{"title":"Wide frequency impedance modeling of EMI ferrites","authors":"W. Kimmel","doi":"10.1109/ISEMC.1994.385658","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385658","url":null,"abstract":"Circuit impedance of popular EMI ferrite beads is empirically modeled over a wide frequency range, using simple lumped circuit analysis. Previous models are cumbersome and difficult to apply. Comparison of this model with vendor published data for several popular EMI ferrite types shows a good agreement for both magnitude and phase.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122244187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Analysis of possible imperilled areas in human head during magnetic resonance imaging 磁共振成像中人类头部可能危险区域的分析
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385615
D. Simunic, P. Wach, W. Renhart, R. Stollberger, Z. Koren
{"title":"Analysis of possible imperilled areas in human head during magnetic resonance imaging","authors":"D. Simunic, P. Wach, W. Renhart, R. Stollberger, Z. Koren","doi":"10.1109/ISEMC.1994.385615","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385615","url":null,"abstract":"The interaction of electromagnetic field and human head is modelled and the eddy currents are calculated at 64 MHz, the operating frequency of a 1.5 T MRI device by numerical finite element simulation. The complexity of the tissue structure imposes a need for explaining the modelling results in more detail. The different tissue properties assigned to every element in the model are given in the form of a table. Finally, the results are discussed.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124051120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
GTEM to OATS radiated emissions correlation from 1-5 GHz GTEM与OATS在1 ~ 5ghz波段的辐射发射相关性
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385627
M.J. Thelberg, E. Bronaugh, J. Osburn
{"title":"GTEM to OATS radiated emissions correlation from 1-5 GHz","authors":"M.J. Thelberg, E. Bronaugh, J. Osburn","doi":"10.1109/ISEMC.1994.385627","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385627","url":null,"abstract":"Part 15 of the FCC Rules and Regulations requires radiated emissions compliance testing above 1 GHz under certain conditions. Previous papers have established a correlation between GTEM and OATS emission measurements below 1 GHz. This paper investigates the accuracy of GTEM to OATS correlation algorithms over the frequency range of 1-5 GHz. To complete the study, additional technical issues are addressed, including the performance of an open area test site ground plane over the frequency range of 1-5 GHz, development of standard reference dipoles in this same frequency range for evaluation measurements, and evaluation of the ANSI C63.4 requirement for equipment under test boresite by the measurement antenna, also for the frequency range of 1-5 GHz.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121650780","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Analysis of electromagnetic fields in and around buildings equipped with shielding screens 设置屏蔽屏的建筑物内部及周围电磁场分析
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385631
Y. Maeda, K. Murakawa, H. Yamane, M. Tokuda
{"title":"Analysis of electromagnetic fields in and around buildings equipped with shielding screens","authors":"Y. Maeda, K. Murakawa, H. Yamane, M. Tokuda","doi":"10.1109/ISEMC.1994.385631","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385631","url":null,"abstract":"The effectiveness of electromagnetic shielding screens installed in buildings as electromagnetic noise countermeasures depends on their structure, position, and the frequencies of the electromagnetic noise. To numerically estimate the effect of shielding screens, we constructed wire-grid models of the buildings, modeling the shielding screens as plane surfaces. We then used the method of moments to calculate the electromagnetic fields in and around those models. The calculated results agree well with measured results, demonstrating that the shielding effect of shielding screens can be estimated by using this method.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"20 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116038410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using GTEM for electromagnetic emission measurements: experiments in test result correlation 用瞬变电磁法测量电磁发射:实验中测试结果的相关性
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385622
A. Tsaliovich, Don Moncion, A. Okun, George Sinfield
{"title":"Using GTEM for electromagnetic emission measurements: experiments in test result correlation","authors":"A. Tsaliovich, Don Moncion, A. Okun, George Sinfield","doi":"10.1109/ISEMC.1994.385622","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385622","url":null,"abstract":"Electromagnetic emissions from a digital broadband source were measured in 30-1000 MHz frequency band using different EMC test facilities: GigaHertz transverse electromagnetic field cell (GTEM), two open area test sites (OATS), and a 3 m site-size RF absorber lined room (AR). While the mean values of the variance between the respective data obtained at these facilities were around 6 dB, the difference between the individual readings could exceed 11-15 dB, confirming the limited character of correlation. On the other hand, the disparities between the GTEM measurement results versus OATS and AR, were of a similar order comparing to those between the OATS and AR, or even between different OATS. Several reasons for these disparities are investigated, including inherent specifics of the facilities, EUT positioning, and cable manipulations.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134008417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Simulated lightning tests on external fuel tank of aircraft 飞机外置燃料箱模拟雷电试验
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385610
Ming-Shing Lin, Chung‐Hsing Tan, Shin-Hsiu Huang, Jyh-Maun Shu
{"title":"Simulated lightning tests on external fuel tank of aircraft","authors":"Ming-Shing Lin, Chung‐Hsing Tan, Shin-Hsiu Huang, Jyh-Maun Shu","doi":"10.1109/ISEMC.1994.385610","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385610","url":null,"abstract":"Laboratory setup and test configuration for lightning testing of fuel tank are described. The test was performed in accordance with test method specified in MIL-STD-1757A. The results of the test indicate that arcs/sparks occur at various locations such as observation window, bulkhead-to-skin gaps, and the fasteners associated with various valves. Lightning protection designs to suppress area/sparks are also discussed.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126395785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A theoretical and experimental investigation of field homogeneity in absorber-lined chambers for radiated-susceptibility tests according to IEC 801-3 second edition 根据IEC 801-3第二版辐射敏感性试验用吸收衬里室场均匀性的理论和实验研究
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385668
H. Garn, W. Mullner, R. Kremser
{"title":"A theoretical and experimental investigation of field homogeneity in absorber-lined chambers for radiated-susceptibility tests according to IEC 801-3 second edition","authors":"H. Garn, W. Mullner, R. Kremser","doi":"10.1109/ISEMC.1994.385668","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385668","url":null,"abstract":"We have investigated to what extent a homogeneous test field can be achieved in absorber-lined chambers. Theoretical calculations using our computer program have shown that for horizontal polarization field variations of at least 20 dB will occur with linear antennas above a groundplane. Therefore either directional antennas or fully anechoic chambers should be preferred if a homogeneous test field is desired. Further parameters of relevance are test distance, antenna height above groundplane, antenna pattern and absorber reflectivity.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133246240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Comparison of time domain and frequency domain electromagnetic susceptibility testing 时域和频域电磁磁化率测试的比较
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385683
A. Schutte, H. Karner
{"title":"Comparison of time domain and frequency domain electromagnetic susceptibility testing","authors":"A. Schutte, H. Karner","doi":"10.1109/ISEMC.1994.385683","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385683","url":null,"abstract":"Electromagnetic susceptibility testing in the frequency domain requires a lot of test equipment and much time for the examination in a wide frequency range, from a few kHz to several hundreds of MHz. Frequency steps must be small enough to allow the indication of resonance frequencies. Fourier transformation shows the correlation between time domain and frequency domain. By this transformation, results of susceptibility tests with nanosecond impulses can be analyzed in the frequency domain. Frequency responses of simple devices under test are calculated from the results of impulse testing in the time domain. They show the same characteristics as the results of frequency domain tests. The impulse test method seems to be a simple and fast tool to find the weak points of electric systems against electromagnetic radiation. Because of their importance for susceptibility of electronic circuits, investigations on cables and conductors on printed-circuit boards (PCB) are put forward. Further on, the presented comparison of time domain and frequency domain test methods can be taken into account for emission measurements of electronic equipment measured with ordinary TEM (or GTEM) cells in the time domain.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"326 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133155695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Automated IEC 801.3 testing 自动化IEC 801.3测试
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385684
D. Pawlowski, R.M. Kercado
{"title":"Automated IEC 801.3 testing","authors":"D. Pawlowski, R.M. Kercado","doi":"10.1109/ISEMC.1994.385684","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385684","url":null,"abstract":"The IEC 801.3 radiated immunity test is a good example of some of the tests that electronics manufacturers are required to perform if they wish to sell their products to the European community. IEC 801.3, specifically with respect to the December 1992 revision draft, is a time-consuming and laborious test, due, in part, to the field uniformity requirement. However, an automated IEC test system serves as an efficient means for conducting this test, and provides the user with exceptionally accurate and reliable test results. The paper illustrates the development of such a system, including capabilities as real-time video monitoring of EUT status and automatic real-time monitoring for failure responses of both analog and digital channels originating in the EUT.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131490865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Moment method calculation of the per-unit-length parameters of cable bundles 索束单位长度参数的矩量法计算
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385608
J. S. Savage, W.T. Smith, C. R. Paul
{"title":"Moment method calculation of the per-unit-length parameters of cable bundles","authors":"J. S. Savage, W.T. Smith, C. R. Paul","doi":"10.1109/ISEMC.1994.385608","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385608","url":null,"abstract":"A method of moments procedure to obtain the capacitance matrix for a cable bundle is presented. The geometry consists of multiple, parallel, insulated wires, possibly above a ground plane. The method uses Fourier harmonic expansion functions for the total charge and Galerkin testing functions. The capacitance matrix is obtained through the relationship of free charge to potential. Computed and measured results are presented. Where possible, these results are compared to exact analytical solutions. The effect of wire insulations on capacitance calculations is also discussed.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125387695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
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