时域和频域电磁磁化率测试的比较

A. Schutte, H. Karner
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引用次数: 9

摘要

频域电磁磁化率测试需要大量的测试设备和大量的时间,在从几kHz到几百MHz的宽频率范围内进行测试。频率步长必须足够小,以便显示共振频率。傅里叶变换显示了时域和频域的相关性。通过这种变换,可以在频域分析纳秒脉冲敏感试验的结果。简单被测装置的频率响应由脉冲测试结果在时域内计算得到。它们表现出与频域测试结果相同的特性。脉冲试验方法似乎是一种简单而快速的工具,可以发现电力系统对电磁辐射的弱点。由于电缆和导体对电子电路的易感性具有重要意义,因此提出了对印刷电路板上电缆和导体的研究。此外,本文所提出的时域和频域测试方法的比较,也可以考虑到用普通瞬变电磁法(或瞬变电磁法)在时域测量电子设备的发射。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparison of time domain and frequency domain electromagnetic susceptibility testing
Electromagnetic susceptibility testing in the frequency domain requires a lot of test equipment and much time for the examination in a wide frequency range, from a few kHz to several hundreds of MHz. Frequency steps must be small enough to allow the indication of resonance frequencies. Fourier transformation shows the correlation between time domain and frequency domain. By this transformation, results of susceptibility tests with nanosecond impulses can be analyzed in the frequency domain. Frequency responses of simple devices under test are calculated from the results of impulse testing in the time domain. They show the same characteristics as the results of frequency domain tests. The impulse test method seems to be a simple and fast tool to find the weak points of electric systems against electromagnetic radiation. Because of their importance for susceptibility of electronic circuits, investigations on cables and conductors on printed-circuit boards (PCB) are put forward. Further on, the presented comparison of time domain and frequency domain test methods can be taken into account for emission measurements of electronic equipment measured with ordinary TEM (or GTEM) cells in the time domain.<>
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