Proceedings International Conference on Computer Design VLSI in Computers and Processors最新文献

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Crosstalk-constrained maze routing based on Lagrangian relaxation 基于拉格朗日松弛的串扰约束迷宫路径
H. Zhou, Martin D. F. Wong
{"title":"Crosstalk-constrained maze routing based on Lagrangian relaxation","authors":"H. Zhou, Martin D. F. Wong","doi":"10.1109/ICCD.1997.628931","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628931","url":null,"abstract":"With the increasing density of VLSI circuits, interconnection wires are getting packed even closer. This has increased the effect of interaction between wires on circuit performance and hence, the importance of controlling crosstalk. Maze routing is a robust and general approach which can be used in many situations including multi-layer interconnections. In this paper we consider crosstalk avoidance in maze routing. The crosstalk-constrained maze routing problem is first formulated. Then we show it is equivalent to the multi-constrained shortest path problem and is strongly NP-complete. Based on the Lagrangian relaxation technique, an effective heuristic algorithm is designed to solve the problem.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123876802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Real-time operating systems for embedded computing 嵌入式计算的实时操作系统
Yanbing Li, M. Potkonjak, W. Wolf
{"title":"Real-time operating systems for embedded computing","authors":"Yanbing Li, M. Potkonjak, W. Wolf","doi":"10.1109/ICCD.1997.628899","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628899","url":null,"abstract":"The authors survey the state-of-the-art in real-time operating systems (RTOSs) from the system synthesis point of view. RTOSs have a very long research history which provides important theoretical results and useful industrial implementations. Convergence of applications, technology, and market trends of embedded systems implies a strong need for new generation of RTOS. Therefore, new system synthesis problem areas, notably hardware/software co-design and synthesis for systems-on-silicon (SOS), are opening up new avenues for RTOS research and development. The paper starts with a survey of classical academic and industrial RTOS work and continues with a survey of recent results related to co-design and design systems-on-silicon. They conclude by outlining future directions for the SOS RTOS.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122570154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
Intelligent RAM (IRAM): the industrial setting, applications, and architectures 智能RAM (IRAM):工业设置、应用和架构
D. Patterson, K. Asanović, Aaron B. Brown, R. Fromm, J. Golbus, B. Gribstad, K. Keeton, C. Kozyrakis, David R. Martin, S. Perissakis, Randi Thomas, N. Treuhaft, K. Yelick
{"title":"Intelligent RAM (IRAM): the industrial setting, applications, and architectures","authors":"D. Patterson, K. Asanović, Aaron B. Brown, R. Fromm, J. Golbus, B. Gribstad, K. Keeton, C. Kozyrakis, David R. Martin, S. Perissakis, Randi Thomas, N. Treuhaft, K. Yelick","doi":"10.1109/ICCD.1997.628842","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628842","url":null,"abstract":"The goal of intelligent RAM (IRAM) is to design a cost-effective computer by designing a processor in a memory fabrication process, instead of in a conventional logic fabrication process, and include memory on-chip. To design a processor in a DRAM process one must learn about the business and culture of the DRAMs, which is quite different from microprocessors. The authors describe some of those differences and their current vision of IRAM applications, architectures, and implementations.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127120035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 62
A new approach for initialization sequences computation for synchronous sequential circuits 同步顺序电路初始化序列计算的新方法
Fulvio Corno, P. Prinetto, M. Rebaudengo, M. Reorda, Giovanni Squillero
{"title":"A new approach for initialization sequences computation for synchronous sequential circuits","authors":"Fulvio Corno, P. Prinetto, M. Rebaudengo, M. Reorda, Giovanni Squillero","doi":"10.1109/ICCD.1997.628898","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628898","url":null,"abstract":"This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task when a global reset signal is not available, and functional techniques often cannot handle large circuits. We propose a Genetic Algorithm providing a sequence that aims at initializing the highest number of flip flops with the lowest number of vectors. The experimental results we provide shore that the approach is feasible to be applied even to the largest benchmark circuits and that it compares well to other known approaches in terms of initialized flip flops and sequence length.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129981448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A novel test set design for parametric testing of analog and mixed-signal circuits 一种用于模拟和混合信号电路参数化测试的新型测试集设计
Jin Chen, A. Ramachandran
{"title":"A novel test set design for parametric testing of analog and mixed-signal circuits","authors":"Jin Chen, A. Ramachandran","doi":"10.1109/ICCD.1997.628911","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628911","url":null,"abstract":"Due to the lack of fault models and limited accessibility to internal nodes, it is difficult to test analog circuits, and many circuit specifications need to be tested in order to achieve the desired fault coverage. We introduce a mathematical technique called \"factor analysis\", now used primarily by social scientists to study behavioral phenomena of great complexity and diversity and mold their findings into scientific theories. Factor analysis is applied to study the correlations among the specifications for an analog circuit. An optimal set of specifications to be tested is derived based on the correlations to achieve the maximum time efficiency, and results using an implementation of the algorithm show the effectiveness of the technique.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126789331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Built-in self test for content addressable memories 内置自我测试内容可寻址存储器
Y. Kang, J. Lee, Sungho Kang
{"title":"Built-in self test for content addressable memories","authors":"Y. Kang, J. Lee, Sungho Kang","doi":"10.1109/ICCD.1997.628848","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628848","url":null,"abstract":"A new parallel test algorithm and a Built-in Self Test (BIST) architecture for an efficient testing of various types of functional faults in Content Addressable Memories (CAMs) are developed. In test mode, the read operation is replaced by one parallel content addressable search operation and the writing operation is performed parallel with small peripheral circuit modifications. The results show that an efficient and practical testing with very low complexity and area overhead can be achieved.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"11 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126065258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Development of a high bandwidth merged logic/DRAM multimedia chip 高带宽逻辑/DRAM融合多媒体芯片的研制
W. Luk, Y. Katayama, W. Hwang, M. Wordeman, T. Kirihata, A. Satoh, S. Munetoh, H. Wong, B. El-Kareh, P. Xiao, R. Joshi
{"title":"Development of a high bandwidth merged logic/DRAM multimedia chip","authors":"W. Luk, Y. Katayama, W. Hwang, M. Wordeman, T. Kirihata, A. Satoh, S. Munetoh, H. Wong, B. El-Kareh, P. Xiao, R. Joshi","doi":"10.1109/ICCD.1997.628880","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628880","url":null,"abstract":"This paper describes the design methodology and the implementation of a merged logic/DRAM multimedia chip. The design is based on 0.25 micron DRAM-based CMOS technology with 4-layers of metal with device performance enhancement. Details of the architecture and system design of the multi-media was described in Katayama et. al. (1996). The present chip consists of 64 Mb of synchronous DRAM which is organized in two banks of eight 8 Mb SDRAM macros, a gate-array memory control and bus control unit, a custom-designed 8/spl times/32-bit parallel graphic processor, a 64-bit parallel ports for data transfer to/from the host processor bus, a 32-bit serial port for video display, and on-chip PLL. The multi-media co-processor chip provides high-density unified memory, high bus bandwidth (4.3 GB/s peak) and 1+GB/s BITBLT processing functions for an external host processor. The current design, floorplan and layout are structured in a way that, we believe, will provide a general framework for other merged logic/DRAM, ASIC+DRAM design for system scale integration.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125838001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Pseudo-random pattern testing of bridging faults 桥接故障的伪随机模式测试
N. Touba, E. McCluskey
{"title":"Pseudo-random pattern testing of bridging faults","authors":"N. Touba, E. McCluskey","doi":"10.1109/ICCD.1997.628849","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628849","url":null,"abstract":"While previous research has focused on deterministic testing of bridging faults, this paper studies pseudo-random testing of bridging faults and describes a means for achieving high fault coverage in a built-in self-test (BIST) environment. Bridging faults are generally more random pattern testable than stuck-at faults, but examples are shown to illustrate that some bridging faults can be much less random pattern testable than stuck-at faults. A fast method for identifying these random-pattern-resistant bridging faults is described. State-of-the-art test point insertion techniques, which are based on the stuck-at fault model, are inadequate. Data is presented which indicates that even after inserting test points that result in 100% single stuck-at fault coverage, many bridging faults are still not detected. A test point insertion procedure that targets both single stuck-at faults and non-feedback bridging faults is presented. It is shown that by considering bath types of faults when selecting the location for test points, higher fault coverage can be obtained with little or no increase in overhead. Thus, the test point insertion procedure described here is a low-cost way to improve the quality of built-in self-test.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121516412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Partitioning under timing and area constraints 在时间和面积约束下进行分区
G. Tumbush, D. Bhatia
{"title":"Partitioning under timing and area constraints","authors":"G. Tumbush, D. Bhatia","doi":"10.1109/ICCD.1997.628929","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628929","url":null,"abstract":"Circuit partitioning is a very extensively studied problem. In this paper we formulate the problem as a nonlinear program (NLP). The NLP is solved for the objective of minimum cutset size under the constraints of timing. Our proposed methodology easily extends to multiple constraints that are very dominant in the design of large scale VLSI Systems. The NLP is solved using the commercial LP/NLP solver MINOS. We have done extensive testing using large scale RT level benchmarks and have shown that our methods can be used for exploring the design space for obtaining constraint satisfying system designs. We also provide extensions for solving system design problems where a choice between multiple technologies, packaging components, performance, cost, yield, and more can be the constraints for design related decisions.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116820692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A high-frequency custom CMOS S/390 microprocessor 高频定制CMOS S/390微处理器
C. Webb, J. Liptay
{"title":"A high-frequency custom CMOS S/390 microprocessor","authors":"C. Webb, J. Liptay","doi":"10.1109/ICCD.1997.628874","DOIUrl":"https://doi.org/10.1109/ICCD.1997.628874","url":null,"abstract":"The S/390 G4 CMOS processor is an implementation of the IBM ESA/390 architecture on a single custom CMOS chip. It is a new design which uses a straightforward pipeline both to achieve a fast cycle time and to speed the design cycle. The complex instructions are implemented using a highly privileged subroutines called millicode. To achieve high data integrity while maintaining a high clock frequency, the chip contains duplicate I- and E-units which perform the same operations each cycle and have their results compared.","PeriodicalId":154864,"journal":{"name":"Proceedings International Conference on Computer Design VLSI in Computers and Processors","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133911938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 56
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