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INVESTIGATION OF SILICON DIFFUSIONLY ALLOYED WITH ZINC AND SELENIUM ATOMS 硅与锌、硒原子扩散合金的研究
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-5
О. Турсунов, Н. Зикриллаев
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引用次数: 0
A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS 一种测定非晶半导体导带尾部电子态密度分布的新方法
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-4
Р. Икрамов, Х. Муминов, М. Нуриддинов, Х. Абдуллаев, Б. Султонов
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引用次数: 0
THEORETICAL INVESTIGATION OF OPTICAL PROPERTIES OF SEMICONDUCTOR SPHERICAL QUANTUM DOTS 半导体球形量子点光学性质的理论研究
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-7
К.А. Корабоев, Д. Т. Якубов, Х.Х. Курбонов, У.К. Сапаев
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引用次数: 0
DIGITAL INFRARED HUMIDITY METER OF RAW COTTON IN BUNTS 毛纺原棉数字式红外湿度仪
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-8
Х.С. Далиев, Г. О. Кулдашов
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引用次数: 0
OPTICAL GAS ANALYZER OF EXPLOSIVE CONCENTRATIONS OF HYDROCARBONS IN THE ATMOSPHERE 大气中爆炸性碳氢化合物浓度的光学气体分析仪
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-9
О. Х. Кулдашов, И.О. Холмирзаев, Ш.Э. Муродов, С.Ш. Рашидов
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引用次数: 0
STUDIES OF THE SURFACE OF A THIN SiO2(001) Ῑ10 FILM BY THE METHOD OF SCATTERING OF LOW-ENERGY IONS 用低能离子散射法研究薄SiO2(001)Ῑ10薄膜表面
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-6
М.К. Каримов, С. Хакимов, Я.Ж. Жаббарова
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引用次数: 0
Effect of Holmium Impurity on the Processes of Radiation Defect Formation in n-Si 钬杂质对n-Si辐射缺陷形成过程的影响
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-2
Ш.Б. Утамурадова, Ж.Ж. Ҳамдамов, Д.А. Рахманов
{"title":"Effect of Holmium Impurity on the Processes of Radiation Defect Formation in n-Si","authors":"Ш.Б. Утамурадова, Ж.Ж. Ҳамдамов, Д.А. Рахманов","doi":"10.37681/2181-1652-019-x-2021-6-2","DOIUrl":"https://doi.org/10.37681/2181-1652-019-x-2021-6-2","url":null,"abstract":"Effect of Holmium Impurity on the Processes of Radiation Defect Formation in n-Si","PeriodicalId":153395,"journal":{"name":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122825180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS 光致变色材料全息特性的研究
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-3
З.Т. Азаматов, М.А. Йулдошев, Н.Н. Базарбаев
{"title":"INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS","authors":"З.Т. Азаматов, М.А. Йулдошев, Н.Н. Базарбаев","doi":"10.37681/2181-1652-019-x-2021-6-3","DOIUrl":"https://doi.org/10.37681/2181-1652-019-x-2021-6-3","url":null,"abstract":"INVESTIGATION OF THE HOLOGRAPHIC CHARACTERISTICS OF PHOTOCHROMIC MATERIALS","PeriodicalId":153395,"journal":{"name":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120903425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
INJECTION CURRENTS P-SI–N-SI1-XSNX–N+-SI1-XSNX (0X0.04)-STRUCTURES 注入电流p-si-n-si1-xsnx-n + -si1-xsnx(0x0.04)-结构
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-1
С.З. Зайнабидинов, Х.М. Мадаминов, А.Ш. Икромов
{"title":"INJECTION CURRENTS P-SI–N-SI1-XSNX–N+-SI1-XSNX (0X0.04)-STRUCTURES","authors":"С.З. Зайнабидинов, Х.М. Мадаминов, А.Ш. Икромов","doi":"10.37681/2181-1652-019-x-2021-6-1","DOIUrl":"https://doi.org/10.37681/2181-1652-019-x-2021-6-1","url":null,"abstract":"INJECTION CURRENTS P-SI–N-SI1-XSNX–N+-SI1-XSNX (0X0.04)-STRUCTURES","PeriodicalId":153395,"journal":{"name":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126033357","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER 薄膜半导体光电应力计
SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS Pub Date : 2021-12-30 DOI: 10.37681/2181-1652-019-x-2021-6-10
К.Э. Онаркулов, Ш.А. Юлдашев
{"title":"THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER","authors":"К.Э. Онаркулов, Ш.А. Юлдашев","doi":"10.37681/2181-1652-019-x-2021-6-10","DOIUrl":"https://doi.org/10.37681/2181-1652-019-x-2021-6-10","url":null,"abstract":"THIN-FILM SEMICONDUCTOR OPTOELECTRONIC STRESS METER","PeriodicalId":153395,"journal":{"name":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114769272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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