一种测定非晶半导体导带尾部电子态密度分布的新方法

Р. Икрамов, Х. Муминов, М. Нуриддинов, Х. Абдуллаев, Б. Султонов
{"title":"一种测定非晶半导体导带尾部电子态密度分布的新方法","authors":"Р. Икрамов, Х. Муминов, М. Нуриддинов, Х. Абдуллаев, Б. Султонов","doi":"10.37681/2181-1652-019-x-2021-6-4","DOIUrl":null,"url":null,"abstract":"A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS","PeriodicalId":153395,"journal":{"name":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS\",\"authors\":\"Р. Икрамов, Х. Муминов, М. Нуриддинов, Х. Абдуллаев, Б. Султонов\",\"doi\":\"10.37681/2181-1652-019-x-2021-6-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS\",\"PeriodicalId\":153395,\"journal\":{\"name\":\"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.37681/2181-1652-019-x-2021-6-4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SEMOCONDUCTOR PHYSICS AND MICROELECTRONICS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.37681/2181-1652-019-x-2021-6-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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一种测定非晶半导体导带尾部电子态密度分布的新方法
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
A NEW METHOD FOR DETERMINING THE DISTRIBUTION OF THE DENSITY OF ELECTRONIC STATES AT THE TAIL OF THE CONDUCTION BAND OF AMORPHOUS SEMICONDUCTORS
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