E. Vavrinsky, M. Strémy, D. Horvath, T. Závodník, K. Gasparek, D. Vitazkova, H. Kosnacova
{"title":"Concept of modern EOG system for BCI","authors":"E. Vavrinsky, M. Strémy, D. Horvath, T. Závodník, K. Gasparek, D. Vitazkova, H. Kosnacova","doi":"10.1109/ASDAM55965.2022.9966743","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966743","url":null,"abstract":"In this paper, we present the concept of a modern EOG sensor. In contrast to the standard version, it is realized in the form of a headband with conductive textiles and supplemented by a photoplethysmography, electroencephalography and simplified ECG recording. The device is designed for people suffering from amyotrophic lateral sclerosis.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121548519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Matej Horský, P. Nádaždy, E. Dobročka, D. Gregušová, A. Seifertová, J. Dérer, J. Fedor, T. Ščepka, B. Hudec
{"title":"Electrical properties of Pt/TiO2/Pt and Pt/TiO2/TiN structures grown by atomic layer deposition using TTIP and water","authors":"Matej Horský, P. Nádaždy, E. Dobročka, D. Gregušová, A. Seifertová, J. Dérer, J. Fedor, T. Ščepka, B. Hudec","doi":"10.1109/ASDAM55965.2022.9966782","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966782","url":null,"abstract":"Atomic layer deposition (ALD) growth of TiO2 thin films using TTIP and water is discussed in respect to deposition temperature and resulting crystallinity. Metal-insulator-metal devices with anatase- TiO2 ALD thin film dielectrics on TiN or Pt are investigated for their robustness against oxidative and non-oxidative thermal treatments, towards their use as oxide Schottky diodes or memristor selectors.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121782741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Daniel Kostynski, S. Sack, Peter Kolter, M. Glavanovics
{"title":"A Multi-Channel System for Active Thermal Cycling of Discrete Power Semiconductors Based on Mission Profiles","authors":"Daniel Kostynski, S. Sack, Peter Kolter, M. Glavanovics","doi":"10.1109/ASDAM55965.2022.9966759","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966759","url":null,"abstract":"Within this paper a test system is introduced which is able to cycle multiple discrete power semiconductors in a hybrid manner within a wide temperature range, based on arbitrary programmable temperature mission profiles. Based on these profiles active power cycling is performed in combination with different static climatic conditions. The aim of this kind of test is to emulate the real thermal stress the device would undergo in harsh environments, where strong temperature changes could lead to a faster degradation of the device. With this approach the reliability of the device can be evaluated without the need for a lifetime model, as it is based on standard temperature cycling methods.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117230909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Gasparek, T. Závodník, E. Vavrinsky, M. Micjan, M. Donoval, J. Nevrela, A. Mateasik, M. Zábrodský, V. Sisolak, H. Kosnáčová
{"title":"Design of equipment for advanced PPG research","authors":"K. Gasparek, T. Závodník, E. Vavrinsky, M. Micjan, M. Donoval, J. Nevrela, A. Mateasik, M. Zábrodský, V. Sisolak, H. Kosnáčová","doi":"10.1109/ASDAM55965.2022.9966768","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966768","url":null,"abstract":"The development of a high-quality photoplethysmographic sensor (PPG) is one partial tasks of our research of telemedicine equipment. This area become very critical during recent pandemic. We have previously worked on the development of patches that monitor the temperature of people in the hospital environment. The situation came up with the idea of fitting this patch with a PPG for determining the heart pulse and the blood oxygen saturation. Unfortunately, when using a PPG, we found that it would not be such an easy task and we need an extensive optimization. Each part of the human body requires a specific geometry and combination of LEDs and photodetectors, different LED intensities etc. For this reason, we created universal and advanced PPG sensor. The device contains 15 three-color LEDs, 2 photodetectors, an ambient light sensor, an accelerometer, and wireless communication. In this article, we focus only on the hardware part.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133386134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Research Fab Microelectronics Germany (FMD): strengthening micro- and nanoelectronics on a European scale","authors":"O. Pyper, S. Guttowski","doi":"10.1109/ASDAM55965.2022.9966797","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966797","url":null,"abstract":"As a cooperation of the Fraunhofer Group for Microelectronics with the Leibniz Institutes FBH and IHP, the Research Fab Microelectronics Germany (FMD, Forschungsfabrik Mikroelektronik Deutschland) is the central contact for all questions concerning micro- and nanoelectronics. As a one-stop shop, FMD has been combining scientific excellence, application-oriented technologies and system solutions of the 13 cooperating institutes from the Fraunhofer-Gesellschaft and Leibniz Association into a customer-specific offering since 2017. As a pioneer in cross-location and cross-technology cooperation, FMD is actively addressing the current and future challenges of electronics research to ensure the preservation and expansion of Germany's and Europe's technological sovereignty. As a strategic partner, FMD actively contributes to the German and European research agenda, providing important initiatives for the development of elementary innovations for tomorrow's world.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121961728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Zehetner, G. Vanko, T. Izsák, E. Kováčová, M. Drzik, F. Dohnal, A. Kromka
{"title":"Diamond cantilevers for MEMS sensor applications fabricated by laser ablation and optimized etching techniques","authors":"J. Zehetner, G. Vanko, T. Izsák, E. Kováčová, M. Drzik, F. Dohnal, A. Kromka","doi":"10.1109/ASDAM55965.2022.9966776","DOIUrl":"https://doi.org/10.1109/ASDAM55965.2022.9966776","url":null,"abstract":"The properties of diamond make it an attractive material for MEMS and sensor devices. We present the feasibility to fabricate membranes and cantilevers made of nano-(micro-) crystalline diamond films grown on Si/SiO2 substrates using microwave chemical vapour deposition (MWCVD). The patterning of micromechanical structures was performed by a combined process of femtosecond laser ablation and wet etching. We designed cantilever structures with varying lengths and widths (25,50,100,200 and 300 µm). The cantilevers were made in a symmetric left- and right-hand configuration. An additional laser treatment was used to modify the mechanical properties of the left-hand cantilever. The deflection of the laser-treated, and non-treated sections was measured. The global mechanical system properties were simulated and corresponded with high accuracy to the measured results of deflection.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132096801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}