2021 IEEE International Test Conference (ITC)最新文献

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Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits and Boards 基于机器学习的集成电路和电路板测试自适应方法
2021 IEEE International Test Conference (ITC) Pub Date : 2021-10-01 DOI: 10.1109/ITC50571.2021.00023
Mengyun Liu, K. Chakrabarty
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