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2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)最新文献

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Shielding Effectiveness – When to Stop Blocking and Start Absorbing 屏蔽效果-何时停止阻挡并开始吸收
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825276
P. Bremner, G. Vazquez, D. Trout, P. Edwards
{"title":"Shielding Effectiveness – When to Stop Blocking and Start Absorbing","authors":"P. Bremner, G. Vazquez, D. Trout, P. Edwards","doi":"10.1109/ISEMC.2019.8825276","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825276","url":null,"abstract":"Definition and measurement of shielding effectiveness for electrically small enclosures presents some special challenges addressed in IEEE standard 299.1. Testing of small enclosures commonly gets to a point where blocking of penetration with gaskets and sealing tape might not improve shielding effectiveness. This paper uses a power balance model and simple enclosure Q measurements to explain this apparent limit. The same model is then used to design and quantitatively evaluate internal absorber solutions, which can overcome the apparent limit to achieve desired shielding effectiveness.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127630071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Mitigation and Identification of the Cause of Radiated Emissions in an 8 Gbps High-Speed System 8gbps高速系统中辐射发射的缓解和原因识别
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825293
A. Khoshniat, R. Abhari
{"title":"Mitigation and Identification of the Cause of Radiated Emissions in an 8 Gbps High-Speed System","authors":"A. Khoshniat, R. Abhari","doi":"10.1109/ISEMC.2019.8825293","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825293","url":null,"abstract":"This paper studies the impact of signal integrity issues related to rise/fall time and delay imbalance in differential traces of an 8 Gbps high-speed system in generation of excess radiated emissions at 8 GHz. Since modification of layout and system specifications are not possible at the final stages of system development, a custom-designed Frequency Selective Surface (FSS) absorber is used to reduce the emissions. The effectiveness of this solution is determined in comparison with a commercially available microwave absorber. This evaluation is conducted by observing the return loss and coupling between active sources on a mock-up system board and measuring radiated emissions outside the enclosure box containing the system board. An improved EMC scan set up is developed in-house for over the air radiation pattern measurements. The experimental results closely match simulations and all prove the superior performance of the custom-designed FSS absorber.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114282188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Scanning of random fields using blind source separation 利用盲源分离技术扫描随机场
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825273
Yuanzhuo Liu, Jiangshuai Li, Shaohui Yong, Ruijie He, V. Khilkevich
{"title":"Scanning of random fields using blind source separation","authors":"Yuanzhuo Liu, Jiangshuai Li, Shaohui Yong, Ruijie He, V. Khilkevich","doi":"10.1109/ISEMC.2019.8825273","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825273","url":null,"abstract":"A method for the measurement of the field generated by multiple non-correlated sources is proposed. The contribution of each source is determined using a blind source separation (BSS) technique. The measurements are performed using one scanning probe and stationary reference probes, avoiding the need to measure the spatial correlations of the random field. The resolving result can be used to localize the emission sources and their contribution to the far-field pattern. The method was tested on different signals with amplitude and frequency modulation.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114588614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
PVDF-Graphene Nanocomposite Coatings for Electromagnetic Wave Absorption pvdf -石墨烯纳米复合电磁波吸收涂层
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825308
A. D’Aloia, H. C. Bidsorkhi, A. Tamburrano, G. Bellis, M. S. Sarto
{"title":"PVDF-Graphene Nanocomposite Coatings for Electromagnetic Wave Absorption","authors":"A. D’Aloia, H. C. Bidsorkhi, A. Tamburrano, G. Bellis, M. S. Sarto","doi":"10.1109/ISEMC.2019.8825308","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825308","url":null,"abstract":"The feasibility of Polyvinylidene fluoride (PVDF)-graphene nanocomposite coatings for radar absorption is investigated. To this purpose, a production process of PVDF coatings filled with graphene nanoplatelets has been developed. All the produced samples were characterized in terms of morphological, electrical and electromagnetic properties. The effective complex dielectric permittivity was measured in Ku-band and the results were used to predict by simulations the reflection coefficient of radar absorbing panels consisting of PVDF-graphene coatings over dielectric substrates.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114602485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Wireless Coexistence Testing in the 5 GHz Band with LTE-LAA Signals 基于LTE-LAA信号的5ghz频段无线共存测试
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825300
Mohamad Omar Al Kalaa, S. Seidman
{"title":"Wireless Coexistence Testing in the 5 GHz Band with LTE-LAA Signals","authors":"Mohamad Omar Al Kalaa, S. Seidman","doi":"10.1109/ISEMC.2019.8825300","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825300","url":null,"abstract":"Exploiting unlicensed spectrum bands for cellular communication is a rapidly embraced trend by industry stakeholders. Accordingly, the specifications of Long Term Evolution (LTE) were extended in Release 13 to allow unlicensed spectrum operation, also known as LTE-Licensed Assisted Access (LAA). LTE is widely adopted, and there is a potential for significant coexistence impact of LTE-LAA on users of unlicensed spectrum including wireless medical devices, whether adopters of the new technology or incumbents. Therefore, work was initiated to revise and update the American National Standards Institute (ANSI) C63.27 standard for evaluation of wireless coexistence. This paper details the experimental work conducted at the Electromagnetic Compatibility and Wireless Laboratory, U.S. Food and Drug Administration, to investigate the use of LAA signals for wireless coexistence testing. A software defined radio platform was deployed to generate realistic LAA signals and measure the wireless coexistence impact on the LAA communication link. The equipment under test (EUT) used IEEE 802.11ac as an example incumbent technology in the 5 GHz band. The standardized radiated anechoic chamber method was used for testing. Results highlight the mutual coexistence impact of LAA in the 5 GHz band and suggest that selecting an LAA signal with the maximum possible channel time occupancy and the highest possible modulation and coding scheme (MCS) yields the most impactful coexistence situation on both the EUT and the LAA system.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"33 1-2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116734654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Shielding Effectiveness of Board Level Shields with Absorbing Materials 板级屏蔽吸波材料的屏蔽效果
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825197
Yuanzhuo Liu, Ruijie He, V. Khilkevich, P. Dixon
{"title":"Shielding Effectiveness of Board Level Shields with Absorbing Materials","authors":"Yuanzhuo Liu, Ruijie He, V. Khilkevich, P. Dixon","doi":"10.1109/ISEMC.2019.8825197","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825197","url":null,"abstract":"A method is proposed to extend the shielding effectiveness (SE) of board level shields (BLSs) with absorbing material. Resonances of the metallic shield reduce the electromagnetic interference (EMI) suppression and limit the working frequency range to the fundamental resonant frequency. Two strategies of the absorbing material placement are developed to improve the SE and extend the working frequency of a BLS by inserting the absorbing material over the emission source. At low frequencies (below 10 GHz), a large amount of absorber material is needed to effectively reduce the quality factor of the low-order resonances. At high frequencies (above 10 GHz), a much smaller amount of absorber is required to achieve similar effect. At least 15 dB shielding effectiveness is achieved in the frequency range up to 32 GHz, extending from the fundamental resonant frequency of the BLS cavity (about 5 GHz).","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123824481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Study on the noise coupling and shielding between through silicon vias 硅通孔间的噪声耦合与屏蔽研究
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825298
Huan Liu, R. Fang, M. Miao, Yufeng Jin
{"title":"Study on the noise coupling and shielding between through silicon vias","authors":"Huan Liu, R. Fang, M. Miao, Yufeng Jin","doi":"10.1109/ISEMC.2019.8825298","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825298","url":null,"abstract":"Noise coupling between through silicon vias (TSVs) degrades the performance and reliability of 3D integration systems. This paper focus on the research of noise coupling and shielding between TSVs. The impact of various structural parameters on TSV-TSV coupling is analyzed. Three types of noise shielding methods are investigated to evaluate the effectiveness of them to reduce the coupling noise. The TSV-TSV coupling coefficient are extracted from measurement results taking advantage of a proposed de-embedding method, and the effect of several design parameters on coupling coefficient is discussed.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125182058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Efficient Pico-Probe Error Box Removal Method 一种有效的微探针误差盒去除方法
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825195
Eric Gantner, Nathan Tan, X. Ye, Se-jung Moon, H. Dsilva
{"title":"An Efficient Pico-Probe Error Box Removal Method","authors":"Eric Gantner, Nathan Tan, X. Ye, Se-jung Moon, H. Dsilva","doi":"10.1109/ISEMC.2019.8825195","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825195","url":null,"abstract":"High-speed VNA pico-probe calibration can be a very tedious process and is one of the most important and time consuming parts of collecting good S-parameter data. When performing multi-port probe calibrations using a calibration substrate, an operator can easily introduce errors caused by the lengthy process and large number of touchdowns that are required. This paper presents a simplified methodology of removing the error boxes, including effects of the pico-probes using 2x Thru de-embedding. Validation has been completed through a designed test board targeted for frequencies up to 40 GHz. Detailed procedures will be shared through extensive measurements to ensure accurate and consistent de-embedding results.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131114815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Unique Transmission Line Model Which is Defined by Loss Parameters 一种由损耗参数定义的独特传输线模型
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825252
M. Degerstrom, Chad M. Smutzer, Christopher K. White, C. Haider, B. Gilbert
{"title":"A Unique Transmission Line Model Which is Defined by Loss Parameters","authors":"M. Degerstrom, Chad M. Smutzer, Christopher K. White, C. Haider, B. Gilbert","doi":"10.1109/ISEMC.2019.8825252","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825252","url":null,"abstract":"A unique transmission line model for use in high-speed signal simulation was developed. This model, which we term as a “foundational” model, is specified by user-supplied electrical performance parameters, as opposed to the traditional use of physical parameters such as geometric and material definitions.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130089434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the alleged inconsistency in CISPR 16-1-1 performance tests for disturbance analyzers 关于干扰分析仪CISPR 16-1-1性能测试中所谓的不一致
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Pub Date : 2019-07-01 DOI: 10.1109/ISEMC.2019.8825259
C. Carobbi, Franco Milan, Nicolangelo Palermo
{"title":"On the alleged inconsistency in CISPR 16-1-1 performance tests for disturbance analyzers","authors":"C. Carobbi, Franco Milan, Nicolangelo Palermo","doi":"10.1109/ISEMC.2019.8825259","DOIUrl":"https://doi.org/10.1109/ISEMC.2019.8825259","url":null,"abstract":"A claim of inconsistency in the verification tests of click analyzers has been raised in a recent paper [1]. More specifically tests 2 and 3, as defined in the standard CISPR 161-1 [2], are found to be inconsistent with the click definition in the same standard. A rebuttal to the claim of inconsistency is here offered. In addition solutions are proposed to detect transient disturbances so that the measurement of click duration and separation can be successfully carried out without slipping into any inconsistency.","PeriodicalId":137753,"journal":{"name":"2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)","volume":"73 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120886276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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