An Efficient Pico-Probe Error Box Removal Method

Abstract

High-speed VNA pico-probe calibration can be a very tedious process and is one of the most important and time consuming parts of collecting good S-parameter data. When performing multi-port probe calibrations using a calibration substrate, an operator can easily introduce errors caused by the lengthy process and large number of touchdowns that are required. This paper presents a simplified methodology of removing the error boxes, including effects of the pico-probes using 2x Thru de-embedding. Validation has been completed through a designed test board targeted for frequencies up to 40 GHz. Detailed procedures will be shared through extensive measurements to ensure accurate and consistent de-embedding results.