{"title":"Serial I/O layout shifts signal integrity design","authors":"C. Halford","doi":"10.1049/ESS:20050505","DOIUrl":"https://doi.org/10.1049/ESS:20050505","url":null,"abstract":"Serial I/O is putting greater constraints on board design, and bringing the disciplines of board engineering and layout closer together. The author discusses some of the issues involved.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122805720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Managing the firehose","authors":"M. Davila","doi":"10.1049/ESS:20050506","DOIUrl":"https://doi.org/10.1049/ESS:20050506","url":null,"abstract":"Serial protocols demand high-speed tools and often seem to be beyond the capability of trusted tools such as logic analysers, which are designed for parallel buses not the firehouse of serial comms. But with the right add on tools and techniques, it is possible to get results fast.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125248414","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Lavu, M. Desmulliez, M. Begbie, G. Ball, I. Wolf
{"title":"Avoiding MEMS failures","authors":"S. Lavu, M. Desmulliez, M. Begbie, G. Ball, I. Wolf","doi":"10.1049/ESS:20050503","DOIUrl":"https://doi.org/10.1049/ESS:20050503","url":null,"abstract":"As MEMS devices becomes more common, understanding their failure mechanisms has become critical. Failure mode and effect analysis provides a way of making the assessment of potential failures a systematic process.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"161 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121482265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Save power with virtual system prototyping","authors":"G. Hellestrand","doi":"10.1049/ESS:20050603","DOIUrl":"https://doi.org/10.1049/ESS:20050603","url":null,"abstract":"The designers of most electronic systems are concerned with minimising the amount of power that the system consumes. The problem is determining which implementation choices give the best power savings. Virtual system prototyping can show the hardware that will improve or worsen battery life. Characteristics such as performance and power for a complex system such as a cellphone - including its software determining such characteristics is some form of simulation. The virtual system prototype (VSP) provides a way of performing the simulation.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125262150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Goodbye wires, hello objects","authors":"S. Sutherland, B. Tabbara","doi":"10.1049/ESS:20050602","DOIUrl":"https://doi.org/10.1049/ESS:20050602","url":null,"abstract":"The object-oriented nature of SystemVerilog means designers can build systems at a higher level and design with less ambiguity, but it will need new debuggers and techniques. The object-orientation of SystemVerilog adds flexibility and greater scope for reuse. Objects allow easy testbench creation and maintenance in design. Advanced languages such as SystemVerilog have come about in response to a pressing market need for enhanced and productive design, verification, and debug. SystemVerilog has a lot of potential for the design community, and raises challenges and the opportunities for the EDA vendor community. The language has been ratified by the industry as a worthwhile attempt to address the current design woes. The promise is there; it is now up to the user and vendor communities to make this a reality.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128969734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Out of sight but not out of mind","authors":"C. Edwards","doi":"10.1049/ESS:20050605","DOIUrl":"https://doi.org/10.1049/ESS:20050605","url":null,"abstract":"Electronic companies have discovered that outsourcing demands more than simply lobbing part of a project over the wall to another company's engineers. Offshoring and outsourcing are not entirely painless, companies are keen to press ahead with their use as they try to work out where to focus internal resources.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132463336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Taking back the trash","authors":"P. Price","doi":"10.1049/ESS:20050606","DOIUrl":"https://doi.org/10.1049/ESS:20050606","url":null,"abstract":"From June 2006 the European Union's Waste, Electrical and Electronic Equipment (WEEE) directive will come into force in the UK and will require manufacturers to pay for at least the collection of their products at end-of-life from central points as well as meet the cost of targets for re-use, recycling and recovery. It is not the only new directive to come into force during 2006. The Reduction of Use of Certain Hazardous Substances (RoHS) directive means that products containing restricted substances will have to be redesigned or withdrawn by July this year. Sustainable product design requires input and support from all parts of the company in order to gather a variety of information and ideas, allocate resources such as dedicated staff time, as well as reaching agreeable outcomes on any design changes that may seriously impact on the business. It is therefore vital that senior management commitment be secured in progressing these actions.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130066607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Like an animal","authors":"C. Edwards","doi":"10.1049/ESS:20050601","DOIUrl":"https://doi.org/10.1049/ESS:20050601","url":null,"abstract":"Robotics researchers are turning to the natural world to try to build more efficient walking robots, trying to make their creations copy the way creatures move around. Researchers from around the world have gathered to trade ideas in making robots more agile in the hope that they will break out of factories and start not just to help people in their homes and at work but to rescue them from accidents and natural disasters.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124632338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Chip test - Physical connection","authors":"C. Edwards","doi":"10.1049/ESS:20050401","DOIUrl":"https://doi.org/10.1049/ESS:20050401","url":null,"abstract":"With electronics manufacturers now cutting chipmakers out of business if they see too many returns from retail, design-for-test is in the firing line for many companies. ESS interviewed test guru Janusz Rajski to find out how the environment is changing. As chief scientist and director of design-for-test engineering at Mentor Graphics, Rajski has worked on many of the issues that face chip companies when trying to work out if their products will work in the field based on just seconds of time on an expensive tester. His work led to the development of test compression in a bid to keep a lid on the time it takes to run millions of test vectors on a chip. It took many years for design engineers to get to grips with the idea of planning for production test but now, for him, test is moving to the point where it underpins not just the means to ensure that chip-level products work, but to improve yields and make designs more manufacturable. As quality and yield issues continue to take centre stage in optimising design, engineers will need to focus more on what test can uncover for them.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"275 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133198532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Medical electronics - Recognition in a heart beat","authors":"D. J. Hamilton, W. Sandham, J. McQueen","doi":"10.1049/ESS:20050404","DOIUrl":"https://doi.org/10.1049/ESS:20050404","url":null,"abstract":"Since its invention in the 19th century, when it was little more than a scientific curiosity, the electrocardiogram (ECG) has developed into one of the most important and widely used quantitative diagnostic tools in medicine. Commercial ambulatory recorders typically have a memory requirement of close to 400 MB of data. Even with improvements in memory density, such a large storage requirement increases the cost of the device. As a result, compression is a key concern for makers of ECG equipment. Novel compression techniques developed for portable heart-monitoring equipment could also form the basis for more intelligent diagnostic systems thanks to the way the compression algorithms depend on signal classification. The authors have developed a Windows-based application known as the research and analysis platform for integrated development of ECG systems (RAPIDECGS), which implements principal components analysis (PCA) and non-linear PCA (NLPCA) techniques. We hope to make it available to the ECG and clinical-research communities so that ECG researchers will use the software as a convenient platform to integrate new research into ECG triggering, compression, clustering, classification, analysis, presentation and interpretation techniques.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129154097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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