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IEEE Transactions on Terahertz Science and Technology最新文献

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A 140- and 220-GHz Dual-Band Amplifier in 130-nm SiGe BiCMOS Process 采用 130 纳米 SiGe BiCMOS 工艺的 140 和 220-GHz 双频放大器
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-17 DOI: 10.1109/TTHZ.2024.3430064
Letian Guo;Shuyang Li;Wenhua Chen;Shunli Ma;Junyan Ren
{"title":"A 140- and 220-GHz Dual-Band Amplifier in 130-nm SiGe BiCMOS Process","authors":"Letian Guo;Shuyang Li;Wenhua Chen;Shunli Ma;Junyan Ren","doi":"10.1109/TTHZ.2024.3430064","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3430064","url":null,"abstract":"This article presents a concurrent dual-band power amplifier (PA) in 130-nm SiGe BiCMOS process. A three-stage stacked BJT amplifier configuration is employed to enhance both the power gain and the output power. To achieve dual-band low-loss matching, the subquarter-wavelength-based baluns are adopted to construct the input and output matching networks. In addition, multiorder \u0000<italic>LC</i>\u0000 networks are introduced to achieve excellent dual-band interstage impedance matching. The proposed three-stage dual-band PA exhibits maximum small signal gains of 25.4 dB at 135 GHz and 21.6 dB at 210 GHz, with 3-dB bandwidths of 28 and 25 GHz, respectively. The measured results show a saturated power (Psat) of more than 13.1 dBm and 9.6 dBm and a power-added efficiency (PAE) of more than 6.75% and 3.1% over ranges of 126–154 GHz and 200–225 GHz, respectively. To the best of the authors’ knowledge, the proposed PA achieves the higher Psat and PAE value than other dual-band PA operating at frequencies greater than 100 GHz with silicon-based process.","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 5","pages":"768-773"},"PeriodicalIF":3.9,"publicationDate":"2024-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142160012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Terahertz Gas Spectroscopy Applied to Medicine and Metrology 太赫兹气体光谱学在医学和计量学中的应用
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-17 DOI: 10.1109/TTHZ.2024.3430107
Nick Rothbart;Alexandra Glück;Heinz-Wilhelm Hübers
{"title":"Terahertz Gas Spectroscopy Applied to Medicine and Metrology","authors":"Nick Rothbart;Alexandra Glück;Heinz-Wilhelm Hübers","doi":"10.1109/TTHZ.2024.3430107","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3430107","url":null,"abstract":"The characteristics of the terahertz (THz) frequency range are very favorable for gas spectroscopy due to the presence of rotational fingerprint spectra of many molecules. Since advanced silicon-based technology can offer a cost-efficient access to these frequencies, the technology is promising to be used for everyday applications in the near future. In this article, we will present THz systems and their performances for applications in medicine and metrology, namely for the analysis of exhaled human breath and for frequency standards. We will discuss technical backgrounds and summarize our current developments in this field.","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 5","pages":"613-620"},"PeriodicalIF":3.9,"publicationDate":"2024-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142159802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Resolution-Enhanced Polarimetric Terahertz Imaging 分辨率增强型极坐标太赫兹成像技术
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-17 DOI: 10.1109/TTHZ.2024.3430040
Maruf Md. Sajjad Hossain;Niru K. Nahar;Kubilay Sertel
{"title":"Resolution-Enhanced Polarimetric Terahertz Imaging","authors":"Maruf Md. Sajjad Hossain;Niru K. Nahar;Kubilay Sertel","doi":"10.1109/TTHZ.2024.3430040","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3430040","url":null,"abstract":"We present a novel millimeter-wave and terahertz-band imaging system capable of sensing the full polarization matrix of the signals that are locally reflected by a sample under test. A high-resistivity extended-hemispherical lens further provides 3.4× improved pixel resolution, leading to a powerful fully polarimetric imaging sensor. The generation and sensing of millimeter-wave/terahertz signals are based on commercially available VNA frequency extension modules interfaced with diagonal horn antenna. As such, the transmitted and received signals can be controlled to exhibit pure linear polarization. With a precisely aligned quasi-optical link consisting of 90° off-axis parabolic mirror, a wire-grid polarizer and the high-permittivity lens, the beam can be tightly focused at the sample plane, resulting in an unprecedented resolution as fine as 50 \u0000<inline-formula><tex-math>$mu$</tex-math></inline-formula>\u0000m for the WR-1.0 band (750–1100 GHz). To demonstrate the utility of the proposed fully polarimetric THz reflectrometry, copolarized and cross-polarized reflection images of a diverse set of FFPE brain tissue samples are captured and the image quality, as well as statistical properties are discussed. The effectiveness of THz fully polarimetric imaging in capturing the anisotropic features in a sample by discriminating edges based on the polarization is demonstrated. This new approach can find wide application areas in nondestructive imaging, such as crack and delamination detection in multilayered composite materials, and diagnosis of degenerative diseases.","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 5","pages":"675-690"},"PeriodicalIF":3.9,"publicationDate":"2024-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142159972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sensitivity Enhancement of Cubic Nonlinearity Measurement in THz Frequency Range 太赫兹频率范围内立方非线性测量的灵敏度提升
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-09 DOI: 10.1109/TTHZ.2024.3425059
Alexandra Nabilkova;Azat Ismagilov;Maksim Melnik;Daniil Gushchin;Maria Zhukova;Mikhail Guselnikov;Sergey Kozlov;Anton Tcypkin
{"title":"Sensitivity Enhancement of Cubic Nonlinearity Measurement in THz Frequency Range","authors":"Alexandra Nabilkova;Azat Ismagilov;Maksim Melnik;Daniil Gushchin;Maria Zhukova;Mikhail Guselnikov;Sergey Kozlov;Anton Tcypkin","doi":"10.1109/TTHZ.2024.3425059","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3425059","url":null,"abstract":"The study applies for the first time the eclipse Z-scan technique to measure LiNbO\u0000<inline-formula><tex-math>$_{3}$</tex-math></inline-formula>\u0000 crystal's nonlinear refractive index coefficient in the THz range. This technique is by one order of magnitude more sensitive than the conventional Z-scan method. The obtained value of LiNbO\u0000<inline-formula><tex-math>$_{3}$</tex-math></inline-formula>\u0000 nonlinear refractive index coefficient is estimated to be 5 \u0000<inline-formula><tex-math>$pm , 2times 10^{-11}$</tex-math></inline-formula>\u0000 cm\u0000<inline-formula><tex-math>$^{2}$</tex-math></inline-formula>\u0000/W, which is commensurate with the established results. This value correlates with the theoretically calculated nonlinear refractive index coefficient of vibrational nature. The influence of thermal nonlinearity on the experimental results can be neglected, since the estimated refractive index change induced by temperature \u0000<inline-formula><tex-math>$Delta n{text{th}}$</tex-math></inline-formula>\u0000 equals 2.6 \u0000<inline-formula><tex-math>$times, 10^{-5}$</tex-math></inline-formula>\u0000, while the contribution \u0000<inline-formula><tex-math>$Delta n_{nl}$</tex-math></inline-formula>\u0000 from optical nonlinearity is 2.9 \u0000<inline-formula><tex-math>$times, 10^{-3}$</tex-math></inline-formula>\u0000. The demonstrated heightened sensitivity of eclipse Z-scan holds promise for the evaluation of properties of materials with lower nonlinear refractive index coefficients, thus expanding the method applicability in characterizing various nonlinear optical materials.","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 5","pages":"718-724"},"PeriodicalIF":3.9,"publicationDate":"2024-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142159974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Women in Engineering 电气和电子工程师学会工程界妇女
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3419290
{"title":"IEEE Women in Engineering","authors":"","doi":"10.1109/TTHZ.2024.3419290","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3419290","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"550-550"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582813","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141495044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Terahertz Science and Technology Information for Authors 太赫兹科学与技术》（IEEE Transactions on Terahertz Science and Technology）作者须知
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3419309
{"title":"IEEE Transactions on Terahertz Science and Technology Information for Authors","authors":"","doi":"10.1109/TTHZ.2024.3419309","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3419309","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"548-549"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582809","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141495192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TechRxiv: Share Your Preprint Research with the World! TechRxiv：与世界分享您的预印本研究成果！
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3419311
{"title":"TechRxiv: Share Your Preprint Research with the World!","authors":"","doi":"10.1109/TTHZ.2024.3419311","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3419311","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"551-551"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582812","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141495056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Terahertz Science and Technology Publication Information 电气和电子工程师学会太赫兹科学与技术论文集》出版信息
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3414771
{"title":"IEEE Transactions on Terahertz Science and Technology Publication Information","authors":"","doi":"10.1109/TTHZ.2024.3414771","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3414771","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"C3-C3"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582814","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141495108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Microwave Theory and Techniques Society Information 电气和电子工程师学会微波理论与技术协会信息
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3414769
{"title":"IEEE Microwave Theory and Techniques Society Information","authors":"","doi":"10.1109/TTHZ.2024.3414769","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3414769","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"C2-C2"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582810","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141495294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Access Publishing IEEE 开放存取出版
IF 3.9 2区 工程技术
IEEE Transactions on Terahertz Science and Technology Pub Date : 2024-07-02 DOI: 10.1109/TTHZ.2024.3419313
{"title":"IEEE Open Access Publishing","authors":"","doi":"10.1109/TTHZ.2024.3419313","DOIUrl":"https://doi.org/10.1109/TTHZ.2024.3419313","url":null,"abstract":"","PeriodicalId":13258,"journal":{"name":"IEEE Transactions on Terahertz Science and Technology","volume":"14 4","pages":"552-552"},"PeriodicalIF":3.9,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10582811","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141494981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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