2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)最新文献_第3页

Measurements of anode temperature around current zero following interruption of high currents 测量大电流中断后电流零附近的阳极温度

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412481

A. Schneider

引用次数: 2

Change of the e-beam generation mode at transition from the vacuum to the gas-filled diode 从真空过渡到充气二极管时电子束产生方式的变化

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412588

E. Baksht, V. Tarasenko, A. Burachenko, M. Lomaev, D. Rybka, D. A. Sorokin

引用次数: 0

A vacuum interrupters internal pressure on-line condition monitoring system 真空断路器内压在线状态监测系统

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412561

Liu Xu-dong, Fan Xing-ming, Zhang Xin, Zou Qi-tao, Fan Jian-rong, Liang Cong, Shi Wei-jian

{"title":"A vacuum interrupters internal pressure on-line condition monitoring system","authors":"Liu Xu-dong, Fan Xing-ming, Zhang Xin, Zou Qi-tao, Fan Jian-rong, Liang Cong, Shi Wei-jian","doi":"10.1109/DEIV.2012.6412561","DOIUrl":"https://doi.org/10.1109/DEIV.2012.6412561","url":null,"abstract":"The reliability and intelligence of vacuum circuit breakers related to the digitization of the substations directly, however, the internal pressure in vacuum interrupters (VIs) is an important indicator parameter of the breaking capability and life. To realize the On-line condition monitor of VIs' internal pressure, weighting the domestic and international on-line monitoring method, we select the coupling capacitance sensor with Advantages of simple composition, long service life and low cost, Real-time monitoring the AC component variables(Δ UAC) and DC component variables(Δ UDC) potential on shield of VIs. Two processors was configured on the monitor system respectively EP2C8Q (FPGA) and TMS320LF2812 (DSP), trying to play the superiority of the two processors and achieve the optimal efficiency. Besides, the conversion algorithm of changing potential on shield of VIs to internal pressure values was studied and the Ethernet communication module based on IEC61850 was designed for uploading data in IED of process level to BAY/UNIT level. Besides, the system was designed with high EMC to ensure the anti-jamming capability. Experimental data and on-site operating results proved that the monitor devices get the advantages of high sensitivity, reliability and strong EMC, and it was applicable in new generation of smart grid.","PeriodicalId":130964,"journal":{"name":"2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124613629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Numerical simulation of overvoltage generated at switching on medium-voltage motors with the aid of different circuit breakers 利用不同断路器对中压电机开断时过电压的数值模拟

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412497

A. Chaly, V. Minaev

引用次数: 0

Testing procedure for the current interruption capability of vacuum interrupter contact materials 真空灭流器触点材料电流中断能力的试验方法

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412489

T. Delachaux, F. Rager, R. Simon, D. Gentsch

{"title":"Testing procedure for the current interruption capability of vacuum interrupter contact materials","authors":"T. Delachaux, F. Rager, R. Simon, D. Gentsch","doi":"10.1109/DEIV.2012.6412489","DOIUrl":"https://doi.org/10.1109/DEIV.2012.6412489","url":null,"abstract":"A testing procedure has been developed with the aim to investigate and to screen the current interruption capability of vacuum interrupters with different contact materials. A synthetic circuit delivering a 1.2 ms pulse current up to 18 kA was used in order to simulate a surface temperature on the electrodes similar to the constricted arc mode. At current zero a pulse voltage was injected to stress the vacuum interrupters to a value corresponding to the peak transient voltage of a 24 kV rating. Vacuum interrupters with contact materials based on CuCr 75/25 wt% were tested in a single phase. The statistical analysis of the probability of current interruption failure as a function of the current allowed ranking the contact materials compared to a commercial CuCr 75/25 wt% used as a reference. A specially doped CuCr 75/25 wt% showed higher potential current interruption capability than the reference, while the other contacts produced from different copper and chromium powders' suppliers had similar current interruption capability than the reference. The trend given by this method has been compared with results obtained in a three-phase test at a power laboratory. The test procedure is able to predict the major trends, but lacks of sensitivity for the small composition differences. In addition, it was found that when using the best materials in vacuum interrupters rated 20 kA/12 kV a potential current interruption capability higher than 33 kA would be in principle possible based on the contact material only.","PeriodicalId":130964,"journal":{"name":"2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126871271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

On the participation of molecules adsorbed to the cathode surface in the initial stage of a highvoltage vacuum discharge 高压真空放电初期吸附在阴极表面的分子的参与

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412454

Y. A. Barengolts, S. I. Beril

引用次数: 2

Functionally graded copper chromium based vacuum interrupter contact tip and its interruption ability 功能梯度铜铬基真空灭弧头及其灭弧能力

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412493

S. Rayudu, S. Kulkarni, L. Andrews, J. Nemade

{"title":"Functionally graded copper chromium based vacuum interrupter contact tip and its interruption ability","authors":"S. Rayudu, S. Kulkarni, L. Andrews, J. Nemade","doi":"10.1109/DEIV.2012.6412493","DOIUrl":"https://doi.org/10.1109/DEIV.2012.6412493","url":null,"abstract":"Copper-Chromium (CuCr) based contact material is widely used for vacuum interrupter (VI) contacts and has found worldwide acceptance in medium-voltage VIs, especially for high-current interruption. Contact material with chromium content between 25 and 50 wt. % is almost exclusively used. Conventionally, copper and chromium are uniformly distributed throughout the body of the contact. In a few cases, contacts with grading of the material along the thickness have been used. This paper presents a new concept of functionally graded electrical contact which consists of CuCr50 in the bulk region and the remaining petal region consists of CuCr25. The aim of this grading is to improve the interruption ability with optimum erosion characteristics. The paper further reports the results of the investigations of switching behavior of VI with these functionally graded contact tips. The results indicate that the higher thermal and electrical conductivity as well as anti-welding properties at the required locations of the developed functionally graded contact material improved the interruption ability of the VI. The results of the switching tests are seconded by the results of the microstructural analysis (SEM/EDS) of the arced and un-arced contact tips.","PeriodicalId":130964,"journal":{"name":"2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114155178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Microsecond plasma opening switch: Pro et contra 微秒等离子体开启开关:Pro et contra

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412549

V. Kokshenev

引用次数: 0

The multiarc plasma cathode electron source 多弧等离子体阴极电子源

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412595

M. Vorobyov, V. Denisov, V. Devyatkov, S. A. Gamermaister, N. Koval, V. Shugurov, S. Sulakshin, V. Yakovlev

引用次数: 1

Arcing behavior on TMF contacts at intermediate-frequency 中频TMF触点的电弧行为

2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412508

Z. Liying, Wu Jianwen, Liu Bin, Feng Ying

引用次数: 0