功能梯度铜铬基真空灭弧头及其灭弧能力

S. Rayudu, S. Kulkarni, L. Andrews, J. Nemade
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引用次数: 2

摘要

铜铬(CuCr)基触点材料广泛用于真空灭弧(VI)触点,在中压灭弧,特别是大电流灭弧中得到了广泛的应用。铬含量在25 - 50wt %之间的接触材料几乎完全被使用。通常,铜和铬均匀地分布在整个触点体中。在少数情况下,采用了沿厚度进行材料分级的接触。本文提出了一种新的功能梯度电触点概念,该触点在体区由CuCr50组成,其余花瓣区由CuCr25组成。这种分级的目的是提高具有最佳侵蚀特性的中断能力。本文进一步报道了使用这些功能分级接触尖端对VI开关行为的研究结果。结果表明,所开发的功能梯度触点材料在要求位置具有更高的导热性和导电性以及抗焊接性能,从而提高了VI的中断能力。电弧和非电弧触点尖端的微观结构分析(SEM/EDS)结果支持了开关测试的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Functionally graded copper chromium based vacuum interrupter contact tip and its interruption ability
Copper-Chromium (CuCr) based contact material is widely used for vacuum interrupter (VI) contacts and has found worldwide acceptance in medium-voltage VIs, especially for high-current interruption. Contact material with chromium content between 25 and 50 wt. % is almost exclusively used. Conventionally, copper and chromium are uniformly distributed throughout the body of the contact. In a few cases, contacts with grading of the material along the thickness have been used. This paper presents a new concept of functionally graded electrical contact which consists of CuCr50 in the bulk region and the remaining petal region consists of CuCr25. The aim of this grading is to improve the interruption ability with optimum erosion characteristics. The paper further reports the results of the investigations of switching behavior of VI with these functionally graded contact tips. The results indicate that the higher thermal and electrical conductivity as well as anti-welding properties at the required locations of the developed functionally graded contact material improved the interruption ability of the VI. The results of the switching tests are seconded by the results of the microstructural analysis (SEM/EDS) of the arced and un-arced contact tips.
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