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2006 17th International Zurich Symposium on Electromagnetic Compatibility最新文献

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PCB design techniques for the SI and EMC of Gb/s differential transmission lines Gb/s差动传输线SI和EMC的PCB设计技术
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214945
K. Armstrong
{"title":"PCB design techniques for the SI and EMC of Gb/s differential transmission lines","authors":"K. Armstrong","doi":"10.1109/EMCZUR.2006.214945","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214945","url":null,"abstract":"Differential transmission lines are increasingly employed to carry very high data rates in serial communications in printed circuit boards (PCBs). This paper provides an overview of a number of signal integrity (SI) and electromagnetic compatibility (EMC) problems with differential lines in PCBs. It also describes design techniques that can help achieve good SI and EMC","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133792771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
EMC strategy in wireless sensor packaging 无线传感器封装中的EMC策略
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.215001
A. Gandelli, F. Grimaccia, R. Zich
{"title":"EMC strategy in wireless sensor packaging","authors":"A. Gandelli, F. Grimaccia, R. Zich","doi":"10.1109/EMCZUR.2006.215001","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.215001","url":null,"abstract":"Microelectronics for environmental monitoring (microsensors, etc.) present a variety of power supply voltages and operative frequencies from one side and are subject to interference and noise from the external environment on the other. All these aspects lead accuracy and reliability of those circuits devoted to physical measurements a difficult compromise for the designer. Sensors implemented in the newest generation of networks are realized by integrating advanced analog features with digital processing capabilities. The analog blocks, above all, where the processing related to the signal provided by the active element is performed, show in the most substantial way this problem related to EMC inadequacy. In order to restore the top-quality features it is necessary to arrange the best shielding design for the blocks more influenced by interference and noise. So the work of the designer leads to the analysis, simulation and realization of localized and global shields inside and on the packaging. The problem related to the definition of EMC role in designing such shields is very substantial for environmental applications, where performance leads to improve and optimize the traditional designing techniques. The proposal and consequent application of general criteria devoted to define specific needs for shielding is the first step of a logical development oriented to the mature industrial production of efficient and reliable devices able to maintain their performance independently by the influence of external and internal noise","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133661804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Parametric analysis of NSA data by the methods of piecewise multiple linear regression 用分段多元线性回归方法对NSA数据进行参数分析
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214971
D.Y. Wang, Ken-Huang Lin, M. Huang
{"title":"Parametric analysis of NSA data by the methods of piecewise multiple linear regression","authors":"D.Y. Wang, Ken-Huang Lin, M. Huang","doi":"10.1109/EMCZUR.2006.214971","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214971","url":null,"abstract":"NSA data parametric analysis enables us to draw more valuable information concerning quality of a radiated emissions test site. The single breakpoint regression model can best fit either theoretical or measured NSA data because of the nature of ED curves of all NSA geometries. Radiation pattern and phase center should be considered for frequency ranging from 200 to 1000 MHz. In this frequency band a pair of LPDA are used. When distance between the two antennas is 3 meters, the use of hybrid broadband antennas (commonly known as bilog antennas) should be avoided due to their large size. A typical biconical antenna as depicted in MIL-STD-461A has the radiation pattern of a thick dipole. Therefore the CFNSA method is not applicable to the biconical antennas","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123883396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Behavioral modelling of ICs for investigations of conducted emissions in automotive systems 用于汽车系统传导排放研究的集成电路行为建模
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214944
G. Seibert, D. Metzner, F. Klotz, G. Pelz, R. Weigel
{"title":"Behavioral modelling of ICs for investigations of conducted emissions in automotive systems","authors":"G. Seibert, D. Metzner, F. Klotz, G. Pelz, R. Weigel","doi":"10.1109/EMCZUR.2006.214944","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214944","url":null,"abstract":"Because of increasing the electronics in a car, the automotive industry researches for simulating the whole system and how each element could influence another unexpected element. These are often caused by conducted emissions, which are a major challenge in the simulation of automotive systems. One important task is modeling power-ICs to simulate the switching depending on the load. Although circuit based models could perform this task in principle, the required computing-resources for simulation exceed acceptable limits. The applicability of a highly abstracted model will be shown and correlated with measurements and circuit based simulation. This work is a part to find a way to develop a load-independent model for EMC-simulation, but also doesn't need to much simulation-time. This work has been funded by the \"Bayerische Forschungsstiftung\" project MISEA","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123966055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analyses of several realistic exposure scenarios near cellular base stations 蜂窝基站附近几种真实暴露情景的分析
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214923
R. Zaridze, D. Kakulia, G. Kajaia, D. Mazmanov, L. Manukyan, N. Jejelava, T. Gogua
{"title":"Analyses of several realistic exposure scenarios near cellular base stations","authors":"R. Zaridze, D. Kakulia, G. Kajaia, D. Mazmanov, L. Manukyan, N. Jejelava, T. Gogua","doi":"10.1109/EMCZUR.2006.214923","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214923","url":null,"abstract":"This paper contains the results of computer simulations performed for several realistic scenarios of electromagnetic (EM) field evaluation near the cellular base station (CBS) and some analysis of obtained results. The motivation of this study is exposure assessment of EM energy on biological objects. There are scenarios of field distribution indoors, near the hill, obstacle like a wall and finally the field distribution inside the human body is computed. These scenarios are general and frequently encountering in practice inside space covered by wireless networks. Using the reasonable computational resources and keeping the accuracy of the solution acceptable for problems involving the electrically large objects the method of auxiliary sources (MAS) (R. Zaridze et al., 2002) (D. Kakulia et al., 2004) is used to simulate the EM field for the cases mentioned above","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123988174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of internal patch antenna ground plane on SAR 内贴片天线接地面对SAR的影响
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214984
K. Chan, L. Fung, S. Leung, Y. Siu
{"title":"Effect of internal patch antenna ground plane on SAR","authors":"K. Chan, L. Fung, S. Leung, Y. Siu","doi":"10.1109/EMCZUR.2006.214984","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214984","url":null,"abstract":"This paper investigates the effect of different ground plane configurations of a typical internal planar inverted-F patch antenna (PIFA) on specific absorption rate (SAR). The effect of the size and the addition of vertical sidewall of the ground plane are investigated; it is found that by varying the ground plane locations and configurations, SAR value can be reduced by 15%","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121521218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Prediction of maximum electric field with given independent sampling points in a reverberation chamber 混响室中给定独立采样点的最大电场预测
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214977
Z. Daming, S. K. Yak, Koh Wee Jin
{"title":"Prediction of maximum electric field with given independent sampling points in a reverberation chamber","authors":"Z. Daming, S. K. Yak, Koh Wee Jin","doi":"10.1109/EMCZUR.2006.214977","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214977","url":null,"abstract":"Independent boundary condition is a key factor in the prediction of maximal electric field level in a reverberation chamber and it determines the number of independent sampling points that stirrers can generate. With different independent sampling points the expected maximal electrical fields are different. With a fixed number of independent sampling points the average maximum of electric field is a constant. This paper studies the relationship between maximal electric field and independent sampling points","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124953929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Analytical and experimental study of the shielding effectiveness of a metallic enclosure with off-centered apertures 偏心孔金属外壳屏蔽效果的分析与实验研究
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.215010
F. A. Po'ad, M. Jenu, Christos Christopoulos, David W. P. Thomas
{"title":"Analytical and experimental study of the shielding effectiveness of a metallic enclosure with off-centered apertures","authors":"F. A. Po'ad, M. Jenu, Christos Christopoulos, David W. P. Thomas","doi":"10.1109/EMCZUR.2006.215010","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.215010","url":null,"abstract":"An analytical formulation has been developed for the shielding effectiveness of a rectangular enclosure with off-centered apertures. The present analytical formulation has been extended to include modes higher than TE10. The electric shielding may be calculated as a function of frequency, enclosure dimensions, aperture dimensions and position within the enclosure. Measurements conducted in a Gigahertz transverse electromagnetic (GTEM) cell show good agreement with theoretical values","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125185737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
EMI modeling and simulation in the IC design process 集成电路设计过程中的电磁干扰建模与仿真
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.215004
T. Steinecke, D. Hesidenz, E. Miersch
{"title":"EMI modeling and simulation in the IC design process","authors":"T. Steinecke, D. Hesidenz, E. Miersch","doi":"10.1109/EMCZUR.2006.215004","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.215004","url":null,"abstract":"The power integrity of the system chip plus chip package determines the RF emission potential and is thus a key quality parameter of complex integrated circuits like microcontrollers for automotive applications. However, modeling and simulation of power integrity and thus electromagnetic emission must be applied as early as possible in the IC design process. This paper presents two approaches: (1) the case study simulation in a very early IC design phase and (2) the accurate netlist/layout-based simulation at a later design phase. Both implementations have been used in combination with the Infineon 32-bit microcontroller TC1796","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128112737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
EMC analysis of planar PCB-based coils in the vicinity of to the automobile carriage 汽车车厢附近平面pcb线圈的电磁兼容分析
2006 17th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2006-05-15 DOI: 10.1109/EMCZUR.2006.214943
S. Schuh, M. Albach
{"title":"EMC analysis of planar PCB-based coils in the vicinity of to the automobile carriage","authors":"S. Schuh, M. Albach","doi":"10.1109/EMCZUR.2006.214943","DOIUrl":"https://doi.org/10.1109/EMCZUR.2006.214943","url":null,"abstract":"In the future power converter applications will become more and more important as a part of the whole electronic system in an automobile because of the increasing number of devices. Building these converters with planar PCB-based coils makes them more robust against vibrations and cheaper in mass production. With the analysis method presented in this paper the influence of the automobile carriage on these planar inductive components can be investigated. The results are useful for the design and the EMC behavior of these inductors","PeriodicalId":130489,"journal":{"name":"2006 17th International Zurich Symposium on Electromagnetic Compatibility","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117198455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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