发布求助
文献互助 智能选刊 最新文献

Proceedings of 1995 International Symposium on Electrical Insulating Materials最新文献

筛选
英文 中文
Three-dimensional space charge distribution measurement in solid dielectrics using pulsed electroacoustic method 固体介质中三维空间电荷分布的脉冲电声测量
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496572
Y. Imaizumi, K. Suzuki, Y. Tanaka, T. Takeda
{"title":"Three-dimensional space charge distribution measurement in solid dielectrics using pulsed electroacoustic method","authors":"Y. Imaizumi, K. Suzuki, Y. Tanaka, T. Takeda","doi":"10.1109/ISEIM.1995.496572","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496572","url":null,"abstract":"The authors have developed a new scanning system with a small detecting electrode for three-dimensional space charge distribution measurement using the pulsed electroacoustic method. In this report, the three-dimensional charge distribution in a PMMA plate which was prepared by electron beam irradiation was measured using the newly developed system.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115374119","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Noise rejection techniques for on-line PD monitor of turbine generators 汽轮发电机PD在线监测噪声抑制技术
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496548
K. Itoh, Y. Kaneda, S. Kitamura, K. Kimura, A. Nishimura, T. Tanaka, H. Tokura, I. Okada
{"title":"Noise rejection techniques for on-line PD monitor of turbine generators","authors":"K. Itoh, Y. Kaneda, S. Kitamura, K. Kimura, A. Nishimura, T. Tanaka, H. Tokura, I. Okada","doi":"10.1109/ISEIM.1995.496548","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496548","url":null,"abstract":"Correlation between frequency bands and correlation between PD sensors are applied to noise rejection of on-line PD measurement for turbine generators. Over 90% of external noises are rejected with either technique.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125639115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A study of voltage distribution in motor windings against steep-fronted surge 陡锋浪涌下电机绕组电压分布的研究
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496508
H. Ishikawa, Y. Haga
{"title":"A study of voltage distribution in motor windings against steep-fronted surge","authors":"H. Ishikawa, Y. Haga","doi":"10.1109/ISEIM.1995.496508","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496508","url":null,"abstract":"For inverter driven motors, it is important to investigate the coil voltage distribution for interturn insulation design. In this paper we researched form-wound coil voltages against steep-fronted surge. We present the results of investigations of the equivalent circuit of the windings, measurement of coil voltages and voltages-to-ground, simulation of them by EMTP (Electromagnetic Transients Program) and formulation of a numerical expression for the circuit constants.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132061147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Factor for dielectric strength reduction due to fibrous contaminants in XLPE 交联聚乙烯中纤维污染物导致介电强度降低的因素
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496519
K. Iinuma, H. Miyata, T. Takahashi, S. Yamamoto
{"title":"Factor for dielectric strength reduction due to fibrous contaminants in XLPE","authors":"K. Iinuma, H. Miyata, T. Takahashi, S. Yamamoto","doi":"10.1109/ISEIM.1995.496519","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496519","url":null,"abstract":"We investigate the effect on breakdown strength reduction by employing several kinds of fiber, in which each effect is classified in prebreakdown by partial discharge detection and electroluminescence measurement. In the same size fiber, breakdown strength decreases in the order: solid synthetic fiber>cotton fiber>hollow synthetic fiber>copper fiber. The partial discharge behavior is clearly different between hollow fiber and copper fiber. The electrical tree characteristics are also discussed.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"6 17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132322691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Luminescence properties of defects in P/sup +/- or B/sup +/-implanted thermally grown silicon dioxide P/sup +/-或B/sup +/-热生长二氧化硅缺陷的发光特性
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496514
K. Seol, A. Ieki, Y. Ohki, H. Nishikawa, M. Takiyama
{"title":"Luminescence properties of defects in P/sup +/- or B/sup +/-implanted thermally grown silicon dioxide","authors":"K. Seol, A. Ieki, Y. Ohki, H. Nishikawa, M. Takiyama","doi":"10.1109/ISEIM.1995.496514","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496514","url":null,"abstract":"In this paper, we report photoluminescence spectra from P/sup +/- or B/sup +/-implanted thermally grown SiO/sub 2/ films obtained by synchrotron radiation and an excimer laser, and discuss the nature of the defects induced by the ion implantation.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"26 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131240791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Long term degradation of epoxy molding resins 环氧成型树脂的长期降解
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496584
M. Koyama, K. Goto, T. Shimizu, M. Koyamada
{"title":"Long term degradation of epoxy molding resins","authors":"M. Koyama, K. Goto, T. Shimizu, M. Koyamada","doi":"10.1109/ISEIM.1995.496584","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496584","url":null,"abstract":"Epoxy molding resins are widely used for outdoor insulators in heavy apparatuses, especially for transformers in distribution equipment, bushings in traffic equipment, current and potential transformers, etc. Liquid type epoxy resins are used instead of solid type resin because of their easy treatment. This report investigates several properties of liquid type epoxy moldings and estimates their life in heavy apparatuses for long-term outdoor use.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132428533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-Langevin recombination and radiation-induced conductivity in disordered dielectrics 无序介质中的非朗之万复合和辐射诱导电导率
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496589
V. Arkhipov
{"title":"Non-Langevin recombination and radiation-induced conductivity in disordered dielectrics","authors":"V. Arkhipov","doi":"10.1109/ISEIM.1995.496589","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496589","url":null,"abstract":"Experimental data on radiation-induced conductivity (RIC) in disordered dielectrics are usually interpreted in terms of trap-controlled transport and recombination of charge carriers. This model explains behavior of both stationary and non-stationary RIC measured under various conditions. On the other hand, it is well established from first principles that transport and recombination of charge carriers must occur via hopping in most non-crystalline dielectrics. Recently, it was shown that the rate of carrier recombination is much lower than predicted by the well-known Langevin equation. In the present work, a model of suppressed recombination is suggested based on a hopping approach to charge-carrier kinetics in disordered materials.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116337128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the conduction mechanism in dielectrics 电介质中的传导机制
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496588
E. Neagu, M. Bulea, R. Neagu
{"title":"On the conduction mechanism in dielectrics","authors":"E. Neagu, M. Bulea, R. Neagu","doi":"10.1109/ISEIM.1995.496588","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496588","url":null,"abstract":"It is important to know if and to what extent the energy band model can be used in the case of dielectric materials. Using isothermal and non isothermal measurements with direct current and for triangular symmetric signals we tried to solve two problems: (i) the existence of the barrier potential at the contact between a metal and a dielectric; (ii) the resemblance and the differences between the displacement current and the so called conduction current in a dielectric. The answers to these two problems are important in deciding if the charge transport mechanism in dielectrics takes place by carrier movement in extended states or by carrier hopping between localized states.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123568368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High temperature PD characteristics of polyimide and liquid crystal polymer 聚酰亚胺和液晶聚合物的高温PD特性
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496545
T. Okamoto, M. Kanegani, N. Hozumi, M. Ikeda
{"title":"High temperature PD characteristics of polyimide and liquid crystal polymer","authors":"T. Okamoto, M. Kanegani, N. Hozumi, M. Ikeda","doi":"10.1109/ISEIM.1995.496545","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496545","url":null,"abstract":"Partial discharge (PD) characteristics and PD degradation mechanisms of high voltage equipment have been studied by many researchers from the point of view of insulation diagnosis and insulation breakdown prediction. Since PD pulse occurrence in insulation systems is affected by many factors such as void gas, electrode materials, electrode configuration, void shape, applied electric field strength and remaining charge effect of previous PD, the relationship between PD characteristics and PD mechanism still remains ambiguous. Life time estimation of insulating material at high temperature becomes very important due to severe design condition and environmental conditions in power apparatus and electronic insulation. Unfortunately there have been few research works on PD endurance characteristics of insulating materials. The gas temperature is also a very important factor affecting PD characteristics. This paper describes some aspects of PD characteristics and PD endurance life at elevated temperature with several insulating materials such as liquid crystal polymer (Xydar), epoxy resins, polyimide and polyethylenetelephthalate (PET).","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116855509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of surface conditions on the breakdown strength of various dielectric interfaces 表面条件对不同介电界面击穿强度的影响
Proceedings of 1995 International Symposium on Electrical Insulating Materials Pub Date : 1995-09-17 DOI: 10.1109/ISEIM.1995.496540
C. Dang
{"title":"Effect of surface conditions on the breakdown strength of various dielectric interfaces","authors":"C. Dang","doi":"10.1109/ISEIM.1995.496540","DOIUrl":"https://doi.org/10.1109/ISEIM.1995.496540","url":null,"abstract":"Results of this study have shown that the breakdown strength greatly depends on the type of dielectrics forming an interface as well as their surface conditions. Some greases perform much better than others in maintaining the dielectric integrity of the interface; this is so despite the change in substrate materials, and the sliding as well as the sanding in assemblage. On the contrary, the high-K layer material tested is not effective in controlling the interface performance; it produces little improvement on the dielectric strength of an interface, however it does reduce significantly the dispersion of the breakdown voltage. An interface with a high-K layer is both affected by the substrate material and the sanding.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129382708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信