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Fresenius' Zeitschrift für analytische Chemie最新文献

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On the role of ion bombardment parameters in AES sputter depth profiling of Ta2O5/Ta with Ar+ and Xe+ 离子轰击参数对Ta2O5/Ta的Ar+和Xe+溅射深度谱图的影响
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572356
J. Scholtes, H. Oechsner
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引用次数: 5
Kinetics of titanium silicide formation by rapid thermal processing 快速热处理硅化钛形成动力学
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572378
W. Pamler, K. Wangemann, W. Bensch, E. Bussmann, A. Mitwalsky
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引用次数: 4
High-resolution Auger electron spectroscopy of phase boundaries in TiC/TiB2 materials TiC/TiB2材料相界的高分辨率俄歇电子能谱研究
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572361
E. Nold, H. Holleck, H. Leiste
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引用次数: 2
Near-infrared spectroscopy: why are still so many analysts opposed to it? 近红外光谱:为什么还有那么多分析人士反对它?
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476613
H. Siesler
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引用次数: 0
Analysis of sputter deposited and evaporated tantalum oxide layers on SiO2 by SNMS, XPS, TDS and TRFA 用SNMS、XPS、TDS和TRFA分析SiO2表面溅射沉积和蒸发氧化钽层
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572362
K. Müller, V. Rupertus, H. Oechsner, V. Scheuer, T. Tschudi
{"title":"Analysis of sputter deposited and evaporated tantalum oxide layers on SiO2 by SNMS, XPS, TDS and TRFA","authors":"K. Müller, V. Rupertus, H. Oechsner, V. Scheuer, T. Tschudi","doi":"10.1007/BF00572362","DOIUrl":"https://doi.org/10.1007/BF00572362","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"9 1","pages":"498-501"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88891142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Coupled methods in analytical atomic spectroscopy 原子光谱分析中的耦合方法
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476612
F. Leis
{"title":"Coupled methods in analytical atomic spectroscopy","authors":"F. Leis","doi":"10.1007/BF00476612","DOIUrl":"https://doi.org/10.1007/BF00476612","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"17 1","pages":"755"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81638535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantitative determination of oxygen in silicon by combination of FTIR-spectroscopy, inert gas fusion analysis and secondary ion mass spectroscopy 红外光谱、惰性气体融合分析和二次离子质谱联用定量测定硅中的氧
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572379
G. Stingeder, S. Gara, S. Pahlke, H. Schwenk, E. Guerrero, M. Grasserbauer
{"title":"Quantitative determination of oxygen in silicon by combination of FTIR-spectroscopy, inert gas fusion analysis and secondary ion mass spectroscopy","authors":"G. Stingeder, S. Gara, S. Pahlke, H. Schwenk, E. Guerrero, M. Grasserbauer","doi":"10.1007/BF00572379","DOIUrl":"https://doi.org/10.1007/BF00572379","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"38 1","pages":"576-582"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89199890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Intramolecular protein reactions investigated by time-resolved FTIR difference spectroscopy 时间分辨FTIR差分光谱法研究分子内蛋白质反应
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476634
K. Gerwert, B. Hess
{"title":"Intramolecular protein reactions investigated by time-resolved FTIR difference spectroscopy","authors":"K. Gerwert, B. Hess","doi":"10.1007/BF00476634","DOIUrl":"https://doi.org/10.1007/BF00476634","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"14 1","pages":"778"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88258802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thickness measurement of thin dielectrics with electron spectroscopy 用电子能谱法测量薄电介质的厚度
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572360
D. Ross, M. Maier
{"title":"Thickness measurement of thin dielectrics with electron spectroscopy","authors":"D. Ross, M. Maier","doi":"10.1007/BF00572360","DOIUrl":"https://doi.org/10.1007/BF00572360","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"121 1","pages":"488-491"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76801297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
SIMS investigations of titanium profiles in LiNbO3 produced by ion beam mixing and diffusion 离子束混合扩散法制备LiNbO3中钛型材的SIMS研究
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572359
T. Bremer, D. Kollewe, H. Koschmieder, W. Heiland
{"title":"SIMS investigations of titanium profiles in LiNbO3 produced by ion beam mixing and diffusion","authors":"T. Bremer, D. Kollewe, H. Koschmieder, W. Heiland","doi":"10.1007/BF00572359","DOIUrl":"https://doi.org/10.1007/BF00572359","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":"104 1","pages":"485-487"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76112956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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