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Fresenius' Zeitschrift für analytische Chemie最新文献

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ESCA, SIMS, SEM and XRD investigations of Pt-10%Rh catalyst-gauzes Pt-10%Rh催化膜的ESCA, SIMS, SEM和XRD研究
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-03-01 DOI: 10.1007/BF00572372
A. Rosenstiel, W. H. J. Bruis, G. V. Os, P. Mertens, O. A. Koeiman, K. Berresheim
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引用次数: 3
HPLC-separation and fluorimetric detection of chlorinated aromatic acids after pre-column derivatization with 9-bromomethylanthracene 9-溴甲基镧柱前衍生氯化芳香酸的高效液相色谱分离与荧光检测
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476622
I. Braumiller, K. Ballschmiter
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引用次数: 1
Surface analytical characterization of oxide-free Si(100) wafer surfaces 无氧化硅(100)晶圆片表面的表面分析表征
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572370
L. Mühlhoff, T. Bolze
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引用次数: 12
Adaptation of leucocyte and erythrocyte countings of a hematology analyzer to low cell contents of cerebrospinal fluid (CSF) samples 白细胞和红细胞计数的血液分析仪适应低细胞含量的脑脊液(CSF)样品
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476630
T. Kleine
{"title":"Adaptation of leucocyte and erythrocyte countings of a hematology analyzer to low cell contents of cerebrospinal fluid (CSF) samples","authors":"T. Kleine","doi":"10.1007/BF00476630","DOIUrl":"https://doi.org/10.1007/BF00476630","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86118439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Depth scale calibration during sputter removal of multilayer systems by SNMS 多层系统溅射去除过程中SNMS的深度刻度校准
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572355
A. Wucher, H. Oechsner
{"title":"Depth scale calibration during sputter removal of multilayer systems by SNMS","authors":"A. Wucher, H. Oechsner","doi":"10.1007/BF00572355","DOIUrl":"https://doi.org/10.1007/BF00572355","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83126859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
Application of fuzzy set theory to 13C NMR library searches 模糊集理论在13C核磁共振库检索中的应用
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476625
J. Seil, C. Lieth
{"title":"Application of fuzzy set theory to 13C NMR library searches","authors":"J. Seil, C. Lieth","doi":"10.1007/BF00476625","DOIUrl":"https://doi.org/10.1007/BF00476625","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87232902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Detection of metallic trace impurities on Si(100) surfaces with total reflection X-ray fluorescence (TXRF) 全反射x射线荧光(TXRF)检测Si(100)表面微量金属杂质
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572381
V. Penka, W. Hub
{"title":"Detection of metallic trace impurities on Si(100) surfaces with total reflection X-ray fluorescence (TXRF)","authors":"V. Penka, W. Hub","doi":"10.1007/BF00572381","DOIUrl":"https://doi.org/10.1007/BF00572381","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86580015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
High resolution transmission electron microscopy (HRTEM) 高分辨率透射电镜(HRTEM)
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476638
R. Gruehn
{"title":"High resolution transmission electron microscopy (HRTEM)","authors":"R. Gruehn","doi":"10.1007/BF00476638","DOIUrl":"https://doi.org/10.1007/BF00476638","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91279550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Electron spectroscopy applied to heterogeneous catalysis 应用于多相催化的电子能谱
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476640
R. Schlögl
{"title":"Electron spectroscopy applied to heterogeneous catalysis","authors":"R. Schlögl","doi":"10.1007/BF00476640","DOIUrl":"https://doi.org/10.1007/BF00476640","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89883332","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
XPS and ISS analysis of Fischer-Tropsch catalysts 费托催化剂的XPS和ISS分析
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572373
U. Lindner, H. Papp
{"title":"XPS and ISS analysis of Fischer-Tropsch catalysts","authors":"U. Lindner, H. Papp","doi":"10.1007/BF00572373","DOIUrl":"https://doi.org/10.1007/BF00572373","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76323650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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