2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)最新文献

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Fiber-Optic Pressure Sensor System for Diagnosing Anomalies of the Oral Cavity 用于口腔异常诊断的光纤压力传感器系统
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067437
E. Badeeva, T. Murashkina, Yuri Vasiliev, Lyudmila Tereschenko, T. Istomina
{"title":"Fiber-Optic Pressure Sensor System for Diagnosing Anomalies of the Oral Cavity","authors":"E. Badeeva, T. Murashkina, Yuri Vasiliev, Lyudmila Tereschenko, T. Istomina","doi":"10.1109/MWENT47943.2020.9067437","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067437","url":null,"abstract":"A fiber-optic sensor of the force (pressure) of the muscles of the tongue on the palate for use in therapeutic dentistry is proposed. Recommendations for laying optical fibers in the sensor, providing an increase in the sensitivity of optical signal conversion in the transducer, are developed. The new technical solution fiber-optic sensor of force (pressure) of muscles of language in stomatology will allow to provide safe, exact and reliable measurement, to improve quality of service of small patients at an initial stage of diagnostics of the disease connected with congenital clefts of the upper lip and the sky and other anomalies of an oral cavity.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134371265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated Approach to Processing Diagnostic Data Based on Heterogeneous Cognitive Models 基于异构认知模型的诊断数据综合处理方法
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067433
A. Kolodenkova, S. Vereshchagina, V. Vereshchagin
{"title":"Integrated Approach to Processing Diagnostic Data Based on Heterogeneous Cognitive Models","authors":"A. Kolodenkova, S. Vereshchagina, V. Vereshchagin","doi":"10.1109/MWENT47943.2020.9067433","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067433","url":null,"abstract":"The paper presents the reasonable feasibility of using measuring and expert information in diagnosing industrial equipment. The problems encountered in the diagnosis of industrial equipment (IE), theoretical provisions for the construction of models for diagnosing equipment and requirements for models built are considered. The authors proposed a comprehensive approach based on the building heterogeneous cognitive models (HCM) and mixed production rules for processing diagnostic information (DI) obtained from measuring instruments and experts. HCM here is a directed weighted graph with marked vertices and edges with various types of factors and relationships. A model in the form of HCM for diagnosing electrical equipment (EE) in the oil industry is proposed. As an example, a script of possible risk situation developments related to the equipment developed using pulse modeling, and its analysis are presented. The proposed approach allows one not only to calculate the predicted values of the controlled parameters of the equipment, but also to increase the accuracy and completeness of the IE diagnostics. It takes into account not only the measurement data, but also the knowledge from the duty staff, the chief engineer, which leads to the IE timely repair and maintenance.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129790504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Thin Piezoelectric Films for Micromechanical Systems 微机械系统用压电薄膜
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067450
S. Gurin, E. Pecherskaya, K. Spitsyna, A. V. Fimin, D. Artamonov, A. Shepeleva
{"title":"Thin Piezoelectric Films for Micromechanical Systems","authors":"S. Gurin, E. Pecherskaya, K. Spitsyna, A. V. Fimin, D. Artamonov, A. Shepeleva","doi":"10.1109/MWENT47943.2020.9067450","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067450","url":null,"abstract":"The main technological modes of producing thin piezoelectric films of aluminum nitride AlN, zinc oxide ZnO and lead zirconate titanate LZT are analyzed with the aim of their integration in devices of micromechanical systems (MEMS). It was determined that the main technological factors for producing textured ZnO and AlN films on silicon substrates of different orientations by magnetron sputtering are the substrate temperature and the working gases pressure. The crystallization features of thin films of lead zirconate titanate (LZT) deposited on Si / SiO2 / Pt substrates at low temperatures by the method of RF magnetron sputtering are studied. It was revealed that, after low-temperature deposition of LZT piezoelectric films, the pyrochlore phase with non-ferroelectric properties predominates in the structure. It was found that for the formation of the ferroelectric phase of the PZT perovskite, continuous annealing at relatively high temperatures is required.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"198 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114617699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Piecewise Continuous Test Signals in Measuring Circuits with Time Division Multiplexing 时分复用测量电路中的分段连续测试信号
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067432
V. P. Arbuzov, M. A. Kalinina
{"title":"Piecewise Continuous Test Signals in Measuring Circuits with Time Division Multiplexing","authors":"V. P. Arbuzov, M. A. Kalinina","doi":"10.1109/MWENT47943.2020.9067432","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067432","url":null,"abstract":"An output signal of an active transducer which carries out conversion of a passive electrical quantity into an active one is, as a rule, an analog quantity in measuring circuits of sensors. There is a need for sampling and analog-to-digital conversion of the output voltage of the active transducer in order to generate the output signal of the measuring circuit using digital nodes. Since sampling is carried out over some period of time, rather than instantly, during which the analog signal manages to change, this leads to the appearance of an instrumental error due to imperfection of sampling. To eliminate the indicated error, it is proposed to use piecewise continuous test signals in measuring circuits of sensors, which provide invariability of the output voltage of the active transducer during sampling time. Variants for mathematical description of functions of piecewise continuous test signals are considered, and their comparative analysis is carried out.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134012504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Method for Analyzing Parameter Measurements to Track Dangerous Changes in a Technical Object 一种分析参数测量以跟踪技术对象危险变化的方法
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067444
S. Klevtsov
{"title":"A Method for Analyzing Parameter Measurements to Track Dangerous Changes in a Technical Object","authors":"S. Klevtsov","doi":"10.1109/MWENT47943.2020.9067444","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067444","url":null,"abstract":"Improving the safety level of technical facilities is associated with a reliable assessment of the condition of the facility, which should be adequate to the situation that has arisen. Often for this assessment, you can choose one characteristic parameter that determines the state of the object as a whole. The paper shows the possibility of using Poincare diagrams to track changes in the state of a technical object in real time. Poincare diagrams of any dynamic processes are characterized by asymmetry with respect to the center or axes of the coordinate system. In the modeling process, a time shift procedure is used for a limited array of elements of the time series, which consists of parameter values. The structure of a generalized one-factor model for tracking changes in the state of an object based on an analysis of changes in Poincare diagrams is proposed. Assessment of the state of the object is based on the analysis of the spread of the points of the array on the diagram relative to the center of mass at each time point","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134091374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laser Optical Fiber Systems Prospects Use Evaluation 激光光纤系统应用前景评价
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067362
E. Badeeva, T. Murashkina, S. Bazykin, N. Bazykina, Christina Samokhina, M. Gerashchenko
{"title":"Laser Optical Fiber Systems Prospects Use Evaluation","authors":"E. Badeeva, T. Murashkina, S. Bazykin, N. Bazykina, Christina Samokhina, M. Gerashchenko","doi":"10.1109/MWENT47943.2020.9067362","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067362","url":null,"abstract":"The paper considers the various fiber-optic devices, systems and its components improvement issues. The fiber-optic systems using advantages are shown. The information-measuring systems structure questions on the fiber-optic devices basis are considered. The various fiber-optic devices, systems and its components dignity and benefits are shown. It is shown that fiber-optic laser measuring systems can be successfully used to measure pressure, temperature, linear and angular micro-displacements, vibration parameters, mechanical tensions, etc.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122097500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Decentralized Control of Switching Elements in the Intra-Chip Network-on-Chip Routers 片内网络片上路由器中交换元件的分散控制
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067467
D. Kutuzov, O. Stukach, D. Starov, A. Osovsky
{"title":"Decentralized Control of Switching Elements in the Intra-Chip Network-on-Chip Routers","authors":"D. Kutuzov, O. Stukach, D. Starov, A. Osovsky","doi":"10.1109/MWENT47943.2020.9067467","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067467","url":null,"abstract":"We propose a novel switching element with decentralized control for communication systems. In the paper for convenience we have proposed some fragments of the description of a switching element in the VHDL hardware description language. Such switching elements can become part of the switch fabric of NoC technology routers. In our opinion, the decentralization of the switching elements control provides the following advantages: distributed arbitration rather than centralized; flexible balancing of the information traffic due to the shared use of network buffers for various routes; packet route diversity for the same sources and receivers; simplification of port controllers improved scalability of the intra-chip communication system. In addition, we guess that NoC communications can find application in IoT technology, because it combine routing functions with information processing functions.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125876795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Adaptive filtering of non-fluctuation interference when receiving signals with multi-position phase shift keying 接收多位置相移键控信号时的非波动干扰自适应滤波
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067393
G. Kulikov, Do Trung Tien, V. Kulagin
{"title":"Adaptive filtering of non-fluctuation interference when receiving signals with multi-position phase shift keying","authors":"G. Kulikov, Do Trung Tien, V. Kulagin","doi":"10.1109/MWENT47943.2020.9067393","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067393","url":null,"abstract":"The paper considers the efficiency of an adaptive non-recursive filter using the adjustment algorithm for weighting coefficients taking into account the constant envelope of the desired signal when receiving signals with multi-position phase shift keying against the background of noise and non-fluctuation interference. Two types of such interference are considered - harmonic and retranslated. The optimal filter parameters (adaptation coefficient and length) are determined by using simulation; the effect of the filter on the noise immunity of a quadrature coherent signal receiver with multi-position phase shift keying for different combinations of interference and their intensity is estimated. It is shown that such an adaptive filter can successfully deal with the most dangerous sighting harmonic interference.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123790869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Methods of Obtaining Geospatial Data Using Satellite Communications and Their Processing Using Convolutional Neural Networks 利用卫星通信获取地理空间数据的方法及其卷积神经网络处理
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067413
I. I. Tsvetkovskaya, N. V. Tekutieva, E. Prokofeva, A. Vostrikov
{"title":"Methods of Obtaining Geospatial Data Using Satellite Communications and Their Processing Using Convolutional Neural Networks","authors":"I. I. Tsvetkovskaya, N. V. Tekutieva, E. Prokofeva, A. Vostrikov","doi":"10.1109/MWENT47943.2020.9067413","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067413","url":null,"abstract":"The availability of high-resolution satellite images obtained through space radio communications offers the opportunity to use the most advanced technologies and techniques for analyzing remote sensing data. The paper discusses the data obtained with the use of ground-based, airborne or space-based filming equipment, which makes it possible to obtain images in one or several sections of the electromagnetic spectrum. This article provides an overview of existing artificial spacecraft and systems for obtaining space data. Also, there are the examples of the use of convolutional neural networks (CNN) for processing data obtained from artificial Earth satellites. CNN has a high learning ability and the capacity to automatically learn optimal functions based on the data.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124932777","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Inv estigation by the Method of Images of the Heat Flux Distribution at the Semiconductor-Substrate Interface in Transistor Structure from a Point Heat Source Located at the Passivation-Semiconductor Interface 钝化-半导体界面点热源对晶体管结构中半导体-衬底界面热流分布的成像研究
2020 Moscow Workshop on Electronic and Networking Technologies (MWENT) Pub Date : 2020-03-01 DOI: 10.1109/MWENT47943.2020.9067473
Valentin O. Turin, Ekaterina N. Pilyaeva, Igor V. Golovin
{"title":"Inv estigation by the Method of Images of the Heat Flux Distribution at the Semiconductor-Substrate Interface in Transistor Structure from a Point Heat Source Located at the Passivation-Semiconductor Interface","authors":"Valentin O. Turin, Ekaterina N. Pilyaeva, Igor V. Golovin","doi":"10.1109/MWENT47943.2020.9067473","DOIUrl":"https://doi.org/10.1109/MWENT47943.2020.9067473","url":null,"abstract":"Previously the problem of the heat flux distribution at the semiconductor-substrate interface in the semiconductor-substrate transistor structure with adiabatic boundary condition on top of semiconductor was solved analytically. The method of images for two cases of a point and a linear heat sources located on the top of semiconductor layer was used to solve this problem. The substrate was considered as a half-space adjacent to the bottom of the semiconductor layer unlimited on the sides. It has been shown that even in the case of a perfect heat sink into substrate, the heat flow transverse dimension at the semiconductor-substrate interface has the order of thickness of the semiconductor layer. And with decreasing thermal conductivity of the substrate, this transverse dimension increases substantially. In our work, so far only for the case of a point heat source, a solution of a more general problem of heat propagation in the passivation-semiconductor-substrate transistor structure is obtained. Using the method of images, we calculate the transverse dimension of the heat flux at the semiconductor-substrate interface depending on the value of the thermal conductivity of the substrate for different values of the thermal conductivity of passivation. According to our study, the appearance of the heat sink into passivation leads to an increase in the transverse dimension of the heat flow at the semiconductor-substrate interface, although the proportion of heat going into the substrate decreases. Our research should help to optimize the design of transistor structures taking into account the heat transfer into passivation, which is relevant, for example, for high-power transistors based on wide band gap semiconductors, such as GaN and SiC, when the heat dissipation in the active region of the device, located close to passivation, is very high. In addition, our results confirm the previously developed practical recommendation for TCAD simulations with accounting for self-heating effect.","PeriodicalId":122716,"journal":{"name":"2020 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128849915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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