{"title":"Co-Site Interference Modelling, Characterizing and Mitigation Between Inmarsat FB and GPS Systems Onboard a Submarine","authors":"Vitor T. Klingelfus, A. Serrano","doi":"10.1109/emcsi.2018.8495218","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495218","url":null,"abstract":"This paper focuses on modelling and studying the RF interference (RFI) between a civilian Inmarsat FB emitter at 1627 MHz (culprit) and a GPS L1 band maritime system at 1575 MHz (victim) on close antennas proximity onboard a submarine. Once detected the RFI, we propose the design of an adequate mitigation for it.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132348704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Gifuni, M. Migliaccio, L. Bastianelli, F. Moglie, V. M. Primiani, G. Gradoni
{"title":"Applicability of Measurement Uncertainty Models in a Reverberation Chamber Including Frequency Stirring","authors":"A. Gifuni, M. Migliaccio, L. Bastianelli, F. Moglie, V. M. Primiani, G. Gradoni","doi":"10.1109/EMCSI.2018.8495183","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495183","url":null,"abstract":"We analyze the uncertainty of measurements carried out in a reverberation chamber. The adopted model includes the frequency stirring method and different $K$ -Factor values. Two majorants are proposed to enhance the uncertainty computation of the chamber insertion loss.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132325186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Functional Safety risks caused by EM disturbances","authors":"D. Pissoort, K. Armstrong","doi":"10.1109/EMCSI.2018.8495325","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495325","url":null,"abstract":"Systematic failures could be described ‘designed-in’…","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130164700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Immunity for Power Station an Substation Environments","authors":"W. Radasky","doi":"10.1109/emcsi.2018.8495297","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495297","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114363764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Bradde, S. Grivet-Talocia, M. De Stefano, A. Zanco
{"title":"A Scalable Reduced-Order Modeling Algorithm for the Construction of Parameterized Interconnect Macromodels from Scattering Responses","authors":"T. Bradde, S. Grivet-Talocia, M. De Stefano, A. Zanco","doi":"10.1109/EMCSI.2018.8495287","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495287","url":null,"abstract":"This paper introduces an algorithm for the construction of reduced-order macromodels of electrical interconnects starting from their sampled scattering responses. The produced macromodels embed in a closed-form an approximate dependence of the model equations on external parameters such as geometrical dimensions or material characteristics. The resulting parameterized models are easily cast as parameter-dependent SPICE netlists, which can be used for system-level Signal and Power Integrity assessment via numerical simulation, including sensitivity and optimization tasks. The main novel contribution of this work is the formulation of the model fitting equations in a decoupled form, which allows for a very efficient implementation in case of interconnects with a large number of interface ports, as typically required in Signal and Power Integrity applications. The parameterized models are guaranteed stable and passive for any configuration of the external parameters, thus ensuring stable transient numerical simulations.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116473954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"System Level Electromagnetic Compatibility Remedy Using Absorbing Frequency Selective Surfaces","authors":"A. Khoshniat, R. Abhari","doi":"10.1109/EMCSI.2018.8495321","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495321","url":null,"abstract":"To mitigate unwanted electromagnetic emissions from a digital system enclosed in a metal box with ventilation slots at 8 GHz, a customized absorber is developed using the Frequency Selective Surface (FSS) design concept. The low profile FSS is composed of 2D arrays of square patches of a resistive material incorporated in two consecutive layers of a PCB stack-up. The designed FSS covers the inner top wall of the enclosure box. Analytical derivations and full-wave simulations demonstrate that the surface input impedance of FSS at 8 GHz is matched to the intrinsic impedance of the plane waves emitted from the digital system thus providing more than 6 dB reduction in radiated emissions when FSS is present. The FSS structure is fabricated and a test set-up is created to measure the emissions from a prototyped system board with an array of intentional radiators operating at 8 GHz. Lab measurement results also confirm more than 5 dB reduction in radiated emissions at 8 GHz for the worst case emission scenario.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114658577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Investigation of Electromagnetic Complex Cavities by Applying the Generalized Extreme Value Distribution","authors":"Neda Nourshamsi, J. West, C. Bunting","doi":"10.1109/EMCSI.2018.8495225","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495225","url":null,"abstract":"The generalized extreme value distribution has been recently presented as a leverage to find the maximum distribution function directly without a knowledge about the parent distribution. In this paper, this key component is investigated when the parent distribution is not known. The measurement is performed inside a nested chamber with different aperture dimensions and shapes on the enclosure. The Anderson Darling test is applied to show the field does not follow Rayleigh distribution. The results are shown by using parametric and non-parametric estimation in the confidence interval.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131852720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shaohui Yong, Kevin Cai, Bidyut Sen, J. Fan, V. Khilkevich, Chunchun Sui
{"title":"A Comprehensive and Practical Way to Look at Crosstalk for Transmission Lines with Mismatched Terminals","authors":"Shaohui Yong, Kevin Cai, Bidyut Sen, J. Fan, V. Khilkevich, Chunchun Sui","doi":"10.1109/EMCSI.2018.8495301","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495301","url":null,"abstract":"The analytical formulas for crosstalk due to backward and forward coupling were originally introduced in 1963 [1]. In 2016, the formulas were extended for asymmetrical traces [2]. But all previous approaches assume perfectly-matched terminals, which limits the usage of these equations. In this paper, we re-define the far-end crosstalk (FEXT) as a combination of several components generated by different coupling and reflection mechanisms. A new set of crosstalk estimation formulas is developed to calculate the contribution of each component. Because the influence of mismatched terminals is introduced, the proposed method has much better accuracy than the traditional approach, which estimates FEXT by using forward coupling noise alone. In addition, the proposed equations use per-unit-length inductance (L) and capacitance (C) metrics as inputs instead of S-parameters. Since L and C can be calculated using analytical formulas, the new approach provides a practical and fast crosstalk estimation for engineering designs, avoiding the time-consuming numerical full wave 2D or 3D simulations.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134588726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xinglong Wu, F. Grassi, S. Pignari, P. Manfredi, D. Vande Ginste
{"title":"Perturbative Reformulation of the Stochastic Galerkin Method for Statistical Analysis of Wiring Structures with Several Random Parameters","authors":"Xinglong Wu, F. Grassi, S. Pignari, P. Manfredi, D. Vande Ginste","doi":"10.1109/EMCSI.2018.8495353","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495353","url":null,"abstract":"In this paper, a novel approach for statistical analysis of cable harnesses characterized by several random parameters is proposed, which is based on a perturbative reformulation of the well-known stochastic Galerkin method (SGM). With respect to the traditional SGM, the proposed method avoids the solution of an augmented multiconductor transmission line (MTL), whose dimensions may become prohibitive in case of structures characterized by several wires and random parameters. Namely, it resorts to the iterative and repeated solution of a MTL having the same number of wires as the original structure, where the effects of random variations of geometrical parameters are included by means of equivalent sources. The proposed approach is here applied to collect statistical information of voltages and currents at the terminations of a shielded cable. Through such an example, involving a large number of wires (7) and random variables (12), it is proven that the proposed method yields a significant reduction of computational time with respect to the traditional SGM, at the same time providing similar accuracy in the prediction of statistical moments.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133936433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fundamentals of EMC : Current Return","authors":"Piper Scott","doi":"10.1109/emcsi.2018.8495399","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495399","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134504825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}