U. Grossner, J. Grillenberger, J. Woerle, M. E. Bathen, J. Müting
{"title":"Intrinsic and Extrinsic Electrically Active Point Defects in SiC","authors":"U. Grossner, J. Grillenberger, J. Woerle, M. E. Bathen, J. Müting","doi":"10.1002/9783527824724.ch6","DOIUrl":"https://doi.org/10.1002/9783527824724.ch6","url":null,"abstract":"","PeriodicalId":113938,"journal":{"name":"Wide Bandgap Semiconductors for Power Electronics","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125163992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}