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2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)最新文献

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Planar Microwave Bragg Reflector Resonant Dielectric Sensor 平面微波Bragg反射器谐振介质传感器
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880113
A. Jha, M. Mrozowski, N. Delmonte, A. Lamecki, M. Bozzi
{"title":"Planar Microwave Bragg Reflector Resonant Dielectric Sensor","authors":"A. Jha, M. Mrozowski, N. Delmonte, A. Lamecki, M. Bozzi","doi":"10.1109/IMWS-AMP.2019.8880113","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880113","url":null,"abstract":"In this paper, a periodic structure is used to design a microwave Bragg reflector with the help of hexagonal lattice, which provides a 5 GHz wide stopband between the low-pass band with cut-off frequency 2.6 GHz and the bandpass response with start and stop frequency 7.8 GHz and 10.5 GHz, respectively. A defect in lattice allows passing a narrowband signal at 6 GHz which is found, from the dispersion relation, to be in the region of backward wave propagation. The maximum electric field intensity is found at the lattice defect, and this property is used to sense the dielectric material. It is found that the material under test does not change the low-pass frequency response, hence, the proposed scheme can be used for the dielectric sensor integrated with a low pass filter. The proposed planar sensor operates in the stopband of the Bragg reflector with a typical sensitivity 22x103 kHz corresponding to per unit change in the dielectric constant of material under test. The design is fabricated on a 0.5 mm thick RF35 substrate and tested using standard dielectric materials. The numerical analysis of the proposed structure is found to be in good agreement with the measurement results.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129385548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Glasses and Glass Ceramics for Applications in High Frequency Electronics 用于高频电子器件的玻璃和玻璃陶瓷
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880114
M. Letz
{"title":"Glasses and Glass Ceramics for Applications in High Frequency Electronics","authors":"M. Letz","doi":"10.1109/IMWS-AMP.2019.8880114","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880114","url":null,"abstract":"We report on the applicability of glasses and glass ceramics in the field of high frequency electronics. The main argument for applying such materials in high frequency electronics is their excellent homogeneity, which allows to make designs with kHz accuracy in the range of GHz frequencies. The range of dielectric properties which are covered by glasses and glass ceramics is outlined. Further on a number of examples are discussed were either glasses or glass ceramics are used with antenna functionalities or for high frequency filter applications.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134527613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Characterization and Application of a Commercially Available Laser Diode in a THz System 市售激光二极管在太赫兹系统中的特性与应用
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880071
K. Kolpatzeck, S. Tonder, X. Liu, A. Czylwik, J. Balzer
{"title":"Characterization and Application of a Commercially Available Laser Diode in a THz System","authors":"K. Kolpatzeck, S. Tonder, X. Liu, A. Czylwik, J. Balzer","doi":"10.1109/IMWS-AMP.2019.8880071","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880071","url":null,"abstract":"In this work, we characterize a commercially available laser diode. The complex optical spectrum shows that most of the laser modes have a fixed phase relation, i.e. the laser is mode-locked. By choosing a single-mode fiber with appropriate length, the intrinsic chirp of the laser can be compensated. As a result, the amplitude of the detected THz signal is increased by a factor of 16.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131393200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Emulation of Spatially Distributed Plasma Density Profiles in 3D Electromagnetic Field Simulations 三维电磁场模拟中空间分布等离子体密度分布的仿真
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880104
Birk Hattenhorst, Dennis Pohle, C. Schulz, I. Rolfes, T. Musch
{"title":"Emulation of Spatially Distributed Plasma Density Profiles in 3D Electromagnetic Field Simulations","authors":"Birk Hattenhorst, Dennis Pohle, C. Schulz, I. Rolfes, T. Musch","doi":"10.1109/IMWS-AMP.2019.8880104","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880104","url":null,"abstract":"In this contribution, we introduce three dimensional electromagnetic field simulations for spatially distributed plasma density profiles. Basis for these simulations is a macro-based generation of a locally discretized and dispersive plasma environment that ensures a fast and parameterizable creation while keeping computational time reasonable in simulation tools like CST Microwave Studio. Moreover, measurements with a multipole resonance probe inside of a double inductively coupled plasma reactor confirm the introduced emulation approach.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121070202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Spatial Identification of Dielectric Properties using Synthetic Aperture Radar 基于合成孔径雷达的介电特性空间识别
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880121
J. Barowski, Jochen Jebramcik, Jonas Wagner, N. Pohl, I. Rolfes
{"title":"Spatial Identification of Dielectric Properties using Synthetic Aperture Radar","authors":"J. Barowski, Jochen Jebramcik, Jonas Wagner, N. Pohl, I. Rolfes","doi":"10.1109/IMWS-AMP.2019.8880121","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880121","url":null,"abstract":"This contribution presents a methodology and a measurement setup for spatially resolved material characterization. For this purpose, calibrated millimeter-wave (mmWave) frequency modulated continuous wave (FMCW) radar systems, operating up to 250 GHz, are utilized. The calibration scheme allows for a systematic error correction comparable to a vector network analyzer (VNA). A synthetic aperture radar (SAR) measurement is used to generate a focused 3-dimensional image with very high resolution. A precise spatial distribution of the material parameters is obtained by a novel combination of the imaging and material parameter extraction algorithms.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126935139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design and Characterization of Broadband Triplexers 宽带三工器的设计与特性
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880107
F. Boes, Marius Kretschmann, Sören Marahrens, T. Zwick
{"title":"Design and Characterization of Broadband Triplexers","authors":"F. Boes, Marius Kretschmann, Sören Marahrens, T. Zwick","doi":"10.1109/IMWS-AMP.2019.8880107","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880107","url":null,"abstract":"This paper presents the design process of broadband diplexers and triplexers realized in suspended stripline technology on a 203 μ m thick Rogers 4003C substrate in the microwave frequency range. The design of the multiplexers is based on equivalent circuit models for the low-pass and band-pass filter separately. Stepped-impedance filters and coupled-resonator filters are used as low-pass and band-pass. A realized diplexer features a return loss of more than 10dB from DC to 17GHz with low channel insertion losses of typically less than 2dB after proper optimization. A first prototype triplexer clarifies the challenges and demonstrates the feasibility of the design process.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125159798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An Error Compensation Algorithm for Indirect Resonant Planar Relative Permittivity Sensor Principles up to 100 GHz 高达100ghz的间接谐振平面相对介电常数传感器原理误差补偿算法
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880090
Isabella Lau, F. Lurz, R. Weigel, A. Koelpin
{"title":"An Error Compensation Algorithm for Indirect Resonant Planar Relative Permittivity Sensor Principles up to 100 GHz","authors":"Isabella Lau, F. Lurz, R. Weigel, A. Koelpin","doi":"10.1109/IMWS-AMP.2019.8880090","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880090","url":null,"abstract":"This paper presents an error compensation algorithm for indirect resonant planar relative permittivity sensor principles up to 100 GHz. Besides the measurement of the material under test (MUT), the algorithm requires additional measurements of at least two reference materials. The proposed algorithm is tested for the three most relevant modeling errors occurring while measuring with an indirect planar measurement principle. These include erroneous assumptions regarding the geometrical dimensions, the effective roughness and the air gap between the sensor and the MUT. The proposed algorithm results in an average improvement of the error of the extracted relative permittivity values of 90.46 %.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131358787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization of Liquid Crystals Using a Temperature-Controlled 60 GHz Resonator 使用温度控制的60 GHz谐振器表征液晶
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-16 DOI: 10.1109/IMWS-AMP.2019.8880077
E. Polat, R. Reese, H. Tesmer, S. Schmidt, M. Spaeth, M. Nickel, C. Schuster, R. Jakoby, H. Maune
{"title":"Characterization of Liquid Crystals Using a Temperature-Controlled 60 GHz Resonator","authors":"E. Polat, R. Reese, H. Tesmer, S. Schmidt, M. Spaeth, M. Nickel, C. Schuster, R. Jakoby, H. Maune","doi":"10.1109/IMWS-AMP.2019.8880077","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880077","url":null,"abstract":"This paper presents a resonant liquid crystal (LC) characterization at 60GHz using a temperature controlled automated measurement setup. For the measurements the resonator is perturbed with LC inside a thin silica quartz tube. The LC orientation is accomplished by means of permanent rare earth magnets. Measurements are performed at $20 ^{circ}mathrm{C}$. The investigated LC is the GT3-23001 mixture from Merck KGaA. The extracted values are compared with characterization results at 19GHz. The extracted permittivities are ranging from 3.14 to 2.43 and the loss tangents from 0.0035 to 0.0191 for parallel and orthogonal orientation, respectively.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130771447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Assembly-free Tunable Resonator on TE011 Mode TE011模式上的无装配可调谐振器
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-01 DOI: 10.1109/IMWS-AMP.2019.8880069
A. Périgaud, N. Delhote, O. Tantot, S. Verdeyme, S. Bila, C. Ludovic
{"title":"Assembly-free Tunable Resonator on TE011 Mode","authors":"A. Périgaud, N. Delhote, O. Tantot, S. Verdeyme, S. Bila, C. Ludovic","doi":"10.1109/IMWS-AMP.2019.8880069","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880069","url":null,"abstract":"A new type of continuously tunable resonator is described here. The resonator is working on the TE011 mode which provides a good quality factor. The frequency tuning is obtained by varying its height. A K-band resonator has been fabricated, using plastic 3D printing for the housing and silver paint for the metallization. Measurements show a tuning range of 14%, with quality factors of 2 300 and above while the mechanical system that is adopted for the cavity height variation also ensures a good spurious-free region. The proposed tunable resonator and mechanical tuning system are both made into one single part thanks to additive manufacturing.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126137100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Embedded Suspended Stripline Substrate Technology (ESSS) as a Catalyst for Low-loss PCB Structures in the Ka-Band 嵌入式悬浮带状线衬底技术(ESSS)作为ka波段低损耗PCB结构的催化剂
2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) Pub Date : 2019-07-01 DOI: 10.1109/IMWS-AMP.2019.8880129
S. Sattler, Ahmad Bader Alothman Alterkawi, F. Gentili, R. Teschl, E. Schlaffer, B. Reitmaier, W. Bösch
{"title":"Embedded Suspended Stripline Substrate Technology (ESSS) as a Catalyst for Low-loss PCB Structures in the Ka-Band","authors":"S. Sattler, Ahmad Bader Alothman Alterkawi, F. Gentili, R. Teschl, E. Schlaffer, B. Reitmaier, W. Bösch","doi":"10.1109/IMWS-AMP.2019.8880129","DOIUrl":"https://doi.org/10.1109/IMWS-AMP.2019.8880129","url":null,"abstract":"A novel PCB embedded suspended stripline arrangement is proposed in order to improve the RF performance compared to classical planar technologies. The advantages are demonstrated through the design and characterization of a 2nd-order filter at Ka-band having 4.5% fractional bandwidth (FBW). The simulated Q-factor is around 455 which is significantly higher compared to what is achievable in microstrip. The manufactured sample shows deviations in the expected range given by the manufacturing tolerances from the simulated results. However, a similar high Q-factor of 410 in Ka-band was obtained.","PeriodicalId":109953,"journal":{"name":"2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122874839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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