{"title":"3-D in 12 Days","authors":"J. Pawley","doi":"10.1002/IMIC.200990027","DOIUrl":"https://doi.org/10.1002/IMIC.200990027","url":null,"abstract":"During June, 13–25, the 14th Annual Living Cell Course will take place at the University of British Columbia Medicine School (UBC) in Vancouver. This residential course concentrates on all aspects of the 3D microscopy of living cells. Designed for biological research scientists and advanced graduate students, who apply – or plan to – modern 3D imaging, the course want to open up-to-date methods to a wider selection of scientists.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"80 1","pages":"16-16"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72990380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Photonica Expo 2009","authors":"M. Riboni","doi":"10.1002/IMIC.200990030","DOIUrl":"https://doi.org/10.1002/IMIC.200990030","url":null,"abstract":"In the photonics market facts speak for themselves: according to the report “PHORIT. The Photonics in Italy” carried out in the context of the European Platform Photonics21 and published in 2008, European turnover in this area in 2006 was € 49 billion (equivalent to approximately 19% of the world market), with 246.000 employees in 5.000 companies.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"26 1","pages":"19-19"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78211104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Organelle Dynamics in a Living Cell","authors":"Chuang-Yu Lin, Li-tzu Li","doi":"10.1002/IMIC.200990032","DOIUrl":"https://doi.org/10.1002/IMIC.200990032","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"19 1","pages":"22-25"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84053261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Nanoscience in SEM and TEM: Energy Dispersive X-ray Analysis with High Spatial Resolution","authors":"M. Falke, Alexandra von Platen","doi":"10.1002/IMIC.200990037","DOIUrl":"https://doi.org/10.1002/IMIC.200990037","url":null,"abstract":"The development of modern technology affects the science of small objects in two ways. On one hand better means for handling, imaging and analysis of miniature objects are provided, which means we can try and understand our world on a much smaller scale. On the other hand further miniaturization in manufacturing necessitates the control of technological processes at a minimum of one order of magnitude below the aspired device size. The need for rapid and efficient nanoanalysis is growing very quickly. The next generation 22 nm node in microelectronics architecture is approaching. New solutions for electronic interconnects, capacitors, denser data storage and solar cells are currently under development. This requires atomic scale analysis of a wide range of materials such as functionalized carbon nanotubes (CNTs), various perovskites and three-dimensional nanostructures. Another important field of miniaturization is modern medicine. It strives to identify toxic nanoparticles and transfer medication and operation tools precisely to the place where they are needed in the body. For all of this nanoanalysis is irreplaceable. To understand and control the function of miniature sized natural and artificial objects we need to know their element distribution.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"4 1","pages":"36-39"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82740274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical Metrology Made Easy: Advanced Material Microscopy","authors":"Esther Ahrent","doi":"10.1002/IMIC.200990031","DOIUrl":"https://doi.org/10.1002/IMIC.200990031","url":null,"abstract":"Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained. As such, the LEXT confocal laser scanning microscope (cLSM) concept from Olympus utilizes optical metrology, enabling non-contact surface roughness measurements to be obtained. It provides high-precision 3D surface profile observations and measurements in real-time. Combining advanced optics and reliability with a user-friendly software interface.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"89 1","pages":"20-21"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79140286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Focused in Krakow","authors":"M. Friedrich, Fred Brakenhoff, J. Dobrucki","doi":"10.1002/IMIC.200990026","DOIUrl":"https://doi.org/10.1002/IMIC.200990026","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"311 1","pages":"15-15"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77281663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Chinese Optoelectronic Market","authors":"J. Fang","doi":"10.1002/IMIC.200990029","DOIUrl":"https://doi.org/10.1002/IMIC.200990029","url":null,"abstract":"According to the China Optics and Optoelectronic Manufacturers Association (COEMA), the production value of China's optoelectronic industry amounted to $ 14 billion in 2006, the association expects this value to increase to $ 45 billion by 2010, which equals a global market share of 10 %.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"1 1","pages":"18-18"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78582451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Total Internal Reflection Fluorescence (TIRF) Microscopy","authors":"S. Denham, Deborah Cutchey","doi":"10.1002/IMIC.200990043","DOIUrl":"https://doi.org/10.1002/IMIC.200990043","url":null,"abstract":"TIRF microscopy is a technique for imaging the surface of cells that utilizes a thin field of illumination to image fluorophores on or near to the coverslip. TIRF is a highly sensitive widefield camera-based technique providing an excellent signal-to-noise ratio compared with epi-fluorescence or confocal imaging methods. TIRF can be used alone or in combination with other imaging techniques to give an “inside and out” view of a specimen. This technical note describes the theoretical basis of TIRF microscopy, the hardware required and examples of TIRF applications.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"201 1","pages":"54-55"},"PeriodicalIF":0.0,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79694757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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