IEEE Open Journal of Instrumentation and Measurement最新文献_第2页

IEEE Instrumentation and Measurement Society 仪器与测量学会

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-27 DOI: 10.1109/OJIM.2024.3505992

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IEEE Instrumentation and Measurement Society 仪器与测量学会

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-27 DOI: 10.1109/OJIM.2024.3505993

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Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section 《无损检测与评价（NDT&E）专刊》特邀编辑

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-24 DOI: 10.1109/OJIM.2024.3506272

James A. Smith;Helena Geirinhas Ramos

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Clamshell Inductive Current Coupler for Online Cable Condition Monitoring 用于在线电缆状态监测的翻盖式电感电流耦合器

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-18 DOI: 10.1109/OJIM.2024.3517623

Samuel W. Glass;Jonathan R. Tedeschi;Muthu Elen;Mychal P. Spencer;Jiyoung Son;Leo S. Fifield

{"title":"Clamshell Inductive Current Coupler for Online Cable Condition Monitoring","authors":"Samuel W. Glass;Jonathan R. Tedeschi;Muthu Elen;Mychal P. Spencer;Jiyoung Son;Leo S. Fifield","doi":"10.1109/OJIM.2024.3517623","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3517623","url":null,"abstract":"This document describes the adaptation of a clamshell inductive current coupler for online reflectometry testing (both frequency-domain reflectometry and spread spectrum time-domain reflectometry) to evaluate cable anomalies. The life span of safety-critical nuclear power plant cables is initially qualified for 40 years in accordance with IEEE 383 without additional testing. As plants extend their operating licenses to 60 and 80 years, justification for continued safe operation includes cable test and condition monitoring (CM) programs. Test programs traditionally involve manual interventions to disconnect the cables, perform one or several tests, then reconnect the systems, usually during refueling outages occurring only every two years. Offline testing poses an operational burden that can be minimized by online testing. This work investigates the adaptation of a clamshell inductive current coupler to inject a signal onto a cable conductor and listen for a reflected signal indicative of a damaged condition. The coupler provides >60 dB of protection, thereby allowing tests on cables up to 10 kV or more. Although the clamshell coupler is a known commercial product for cable performance testing, its use for energized cable CM constitutes a novel use case.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-8"},"PeriodicalIF":0.0,"publicationDate":"2024-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10807070","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142938284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Semi-Siam: A Novel Intelligent Monitoring System With a Multibaseline Video Anomaly Detection

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-18 DOI: 10.1109/OJIM.2024.3517614

Abbas Mahbod;Henry Leung

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Adhesion Testing of Direct-Write Printed Ink on Metallic Structural Components

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-17 DOI: 10.1109/OJIM.2024.3517622

Timothy L. Phero;Amey R. Khanolkar;James A. Smith;Bradley C. Benefiel;Shaun P. Evans;Michael D. McMurtrey;David Estrada;Brian J. Jaques

{"title":"Adhesion Testing of Direct-Write Printed Ink on Metallic Structural Components","authors":"Timothy L. Phero;Amey R. Khanolkar;James A. Smith;Bradley C. Benefiel;Shaun P. Evans;Michael D. McMurtrey;David Estrada;Brian J. Jaques","doi":"10.1109/OJIM.2024.3517622","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3517622","url":null,"abstract":"The successful adoption of additive manufacturing for the rapid prototyping of direct-write printed electronics requires the establishment of quantifiable metrics. These metrics should directly interrogate the fabrication quality of the device during the manufacturing process. This implies that the characterization technique should be nondestructive. One measure of fabrication performance is the adhesion strength between the substrate and printed film interface, which is critical since the strength of this interface can dictate the accuracy and reliability of the printed device. In this work, a noncontact laser-induced spallation technique has been used to estimate the adhesion of silver-printed films on aluminum alloy substrates. The laser-based method was compared to a standardized pull-off adhesion test, which provided baseline measurements of adhesion strength. These adhesion measurement techniques were compared against the sintering condition-dependent microstructure of the additive manufacturing films. The porous structure of the printed thin film was found to be an important factor that impacted adhesion tests that utilize adhesives (i.e., glue and resins) due to an enhanced interlocking to the adherend surface. Due to its noncontact nature and insensitivity to thin samples/films, laser spallation was found to be a more reliable indication of process parameter change. The methods and results described in this work support the establishment of process control steps that are necessary for quickly verifying the reliability of printed devices prior to their deployment in critical experiments.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-15"},"PeriodicalIF":0.0,"publicationDate":"2024-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10804879","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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Year-End Message by the Editor-in-Chief 总编辑年终致辞

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-11 DOI: 10.1109/OJIM.2024.3498214

Reza Zoughi

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Distance Conversion Factors for In Situ H-Field Emissions Tests 现场h场发射试验的距离转换系数

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-12-02 DOI: 10.1109/OJIM.2024.3509543

Jordi Solé-Lloveras;Yasutoshi Yoshioka;Manuel Añón-Cancela;Thilo Kootz;Ferran Silva;Marco A. Azpúrua

{"title":"Distance Conversion Factors for In Situ H-Field Emissions Tests","authors":"Jordi Solé-Lloveras;Yasutoshi Yoshioka;Manuel Añón-Cancela;Thilo Kootz;Ferran Silva;Marco A. Azpúrua","doi":"10.1109/OJIM.2024.3509543","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3509543","url":null,"abstract":"This article derives and validates a set of distance conversion factors for the magnetic field emissions limits in the frequency range from 9 kHz to 30 MHz, which are intended to be proposed for their inclusion in new electromagnetic compatibility standards. Simulation models based on loop-type electromagnetic field sources are employed to evaluate, using the method of moments, the changes in the amplitude of the H-field components along the measurement axes. An algorithm is developed to extract the H-field strengths normalized to the reference distance and then, through methods for optimal detection of changepoints, such a normalized curve is fitted to a piece-wise linear function that becomes the generalized distance conversion factor, presented in the form of simplified equations. The fitness of the model is checked through experiments carried out in representative locations, showing a very good agreement between measurement and simulations. The adequacy of the conversion factors and the problem around the equipment under test are also analyzed.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-10"},"PeriodicalIF":0.0,"publicationDate":"2024-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10772380","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142890149","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Device-Free Human Activity Recognition: A Systematic Literature Review 无设备人类活动识别：系统文献综述

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-11-22 DOI: 10.1109/OJIM.2024.3502885

Majid Ghosian Moghaddam;Ali Asghar Nazari Shirehjini;Shervin Shirmohammadi

{"title":"Device-Free Human Activity Recognition: A Systematic Literature Review","authors":"Majid Ghosian Moghaddam;Ali Asghar Nazari Shirehjini;Shervin Shirmohammadi","doi":"10.1109/OJIM.2024.3502885","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3502885","url":null,"abstract":"Human activity recognition (HAR) has become a topic of interest in recent years. While device-based, object-tagged, and camera-based approaches to HAR have many advantages, device-free HAR offers new contributions to the field. Unlike device-based or object-tagged methods, it does not require users to carry sensory devices, and unlike camera-based methods, it respects privacy. Despite the significant number of original research studies and surveys on device-free HAR published in recent years, many scientific questions remain open. In this study, a systematic literature review on device-free HAR was conducted by exploring ACM, IEEExplore, ScienceDirect, Scopus, and WebOfScience. This mixed-method study assesses the quality of the reviewed papers and analyzes suggested HAR methods in both a scientometric and technical manner. The scientometric analysis investigates the trends of scientific publications in this field from the beginning of 2017 to the end of 2023 and reviews the types and distribution of publications among countries, universities, and media. The technical analysis categorizes methods based on device-free sensing modalities, the type, and granularity of recognized activities of proposed methods. It also discusses the common challenges and limitations of current device-free HAR approaches. Additionally, existing methods are compared based on their support for non-line-of-sight, multisubject, user-independent, and environment-independent recognition of human activities. This work provides foundational knowledge on each step of device-free HAR: data acquisition, preprocessing, classification, and evaluation, and identifies gaps and open questions in existing research.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-34"},"PeriodicalIF":0.0,"publicationDate":"2024-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10766409","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142918528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Digital Twin-Based Real-Time Monitoring System for Safety of Multiple Laptops in Working Environment 基于数字孪生的多台笔记本电脑工作环境安全实时监控系统

IEEE Open Journal of Instrumentation and Measurement Pub Date : 2024-11-20 DOI: 10.1109/OJIM.2024.3502879

Minh Long Hoang;Nicola Delmonte

{"title":"Digital Twin-Based Real-Time Monitoring System for Safety of Multiple Laptops in Working Environment","authors":"Minh Long Hoang;Nicola Delmonte","doi":"10.1109/OJIM.2024.3502879","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3502879","url":null,"abstract":"Overheating is a significant issue for laptops, especially in working environments where multiple laptops are utilized to launch heavy programs without the user’s presence frequently. The proposed monitoring method is based on a digital twin (DT) system in a workstation that monitors the heat power loss of the battery, relying on the measurements of the battery current, the central processing units (CPUs) temperatures, and graphics processing units (GPUs) temperatures. Other personal computer (PC) laptops deliver their data via transmission control protocol (TCP)/Internet protocol (IP). The workstation sends a query message, allowing each PC to transfer the necessary information. The virtual system handles the received data to proceed with the alert system for warning if these parameters overcome the concerned threshold. The DT system is implemented into a Dell workstation based on MATLAB-Simulink to manage the data from ten other PCs in the experiment. Power loss is calculated in the DT Simulink system based on the electrical circuit of the PC in plugged-in mode and discharge mode. Together with other factors, the system successfully monitors and detects the current situation with a specific alert function. The monitored parameters can be observed for each setting-up period, which allows the manager to comprehend the condition state during a specific time.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"1-9"},"PeriodicalIF":0.0,"publicationDate":"2024-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10758824","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142798056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0