《无损检测与评价（NDT&E）专刊》特邀编辑

{"title":"《无损检测与评价（NDT&E）专刊》特邀编辑","authors":"James A. Smith;Helena Geirinhas Ramos","doi":"10.1109/OJIM.2024.3506272","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2024-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10815015","citationCount":"0","resultStr":"{\"title\":\"Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section\",\"authors\":\"James A. Smith;Helena Geirinhas Ramos\",\"doi\":\"10.1109/OJIM.2024.3506272\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100630,\"journal\":{\"name\":\"IEEE Open Journal of Instrumentation and Measurement\",\"volume\":\"3 \",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-12-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10815015\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Open Journal of Instrumentation and Measurement\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10815015/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of Instrumentation and Measurement","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10815015/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}