Applications of Surface Science最新文献_第3页

Interfacial deep levels responsible for schottky barrier formation at semiconductor/metal contacts 负责半导体/金属接触处肖特基势垒形成的界面深度

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90227-2

John D. Dow, Otto F. Sankey, Roland E. Allen

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引用次数: 7

The Chadi total energy algorithm for determining surface geometries 确定表面几何形状的Chadi总能量算法

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90191-6

P.V. Smith

{"title":"The Chadi total energy algorithm for determining surface geometries","authors":"P.V. Smith","doi":"10.1016/0378-5963(85)90191-6","DOIUrl":"10.1016/0378-5963(85)90191-6","url":null,"abstract":"<div>The Chadi total energy minimization technique is probably the simplest, physically realistic approach for determining the surface geometries of solids and has proved highly successful in predicting the surface relaxation and reconstruction of a wide variety of covalent solids. One of the basic assumptions of this method has been that the tight-binding parameters, which describe the dependence of the electronic energy of the system upon the surface configuration of atoms, simply vary as the inverse square of the appropriate interatomic distance. More recent work, however, has shown that there are now strong grounds for doubting the validity of this 1/d2 approximation, and has suggested that a better representation of the spatial dependence of the LCAO model Hamiltonian parameters might be obtained from self-consistent bandstructure calculations performed at different lattice constants. The purpose of this paper is to assess the relative merit of these two alternative models by employing them in a direct determination of some of the lattice dynamical properties of silicon, and to discuss the implications of the results of these calculations for surface structure analyses within the Chadi formalism.</div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 596-603"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90191-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76366943","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Chemisorption studies with LEED fine structure analysis LEED精细结构分析的化学吸附研究

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90079-0

S.M. Thurgate, P.J. Jennings

引用次数: 0

Topics in ultraviolet inverse photoemission 紫外光逆发射的主题

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90066-2

V. Dose

引用次数: 2

Hall mobility and field effect mobility studies on PbTe HWE thin films PbTe HWE薄膜的霍尔迁移率和场效应迁移率研究

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90206-5

P.R. Vaya , J. Majhi , B.S.V. Gopalam , C. Dattatreyan

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引用次数: 1

Coadsorption of oxygen and caesium on silver (110) 氧和铯在银上的共吸附(110)

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90078-9

K.C. Prince, M.E. Kordesch

引用次数: 1

Secondary ion yields of polymers 聚合物的仲离子产率

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90039-X

T. Ogama, H. Kurokawa, I. Karino

引用次数: 1

Electron beam induced effects at silicon-transition metal silicide interfaces 电子束在硅过渡金属硅化物界面上的诱导效应

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90229-6

K.A. Pandelisev, E.Y. Wang, J.C. Kelly

引用次数: 5

Functional dependence of electron mobility on the distance of remote donor impurities from the interface in AlGaAs/GaAs heterostructures AlGaAs/GaAs异质结构中电子迁移率对远端给体杂质离界面距离的功能依赖

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90232-6

J. Szymański, D. Neilson, F. Green, P.G. Kemeny, B.J. Linard

引用次数: 0

Recent progress in the nondestructive analysis of surfaces, thin films, and interfaces by spectroellipsometry 光谱椭偏法无损分析表面、薄膜和界面的最新进展

Applications of Surface Science Pub Date : 1985-05-01 DOI: 10.1016/0378-5963(85)90212-0

D.E. Aspnes

引用次数: 13