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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices: Wide Band Gap Semiconductors for Automotive Applications 《电子器件:汽车用宽带隙半导体》特刊征文
IF 2.3 3区 工程技术
IEEE Transactions on Semiconductor Manufacturing Pub Date : 2025-08-21 DOI: 10.1109/TSM.2025.3595469
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引用次数: 0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices: Ultrawide Band Gap Semiconductor Devices for RF, Power and Optoelectronic Applications 《IEEE电子器件学报:用于射频、功率和光电子应用的超宽带隙半导体器件》特刊征文
IF 2.3 3区 工程技术
IEEE Transactions on Semiconductor Manufacturing Pub Date : 2025-08-21 DOI: 10.1109/TSM.2025.3595473
{"title":"Call for Papers for a Special Issue of IEEE Transactions on Electron Devices: Ultrawide Band Gap Semiconductor Devices for RF, Power and Optoelectronic Applications","authors":"","doi":"10.1109/TSM.2025.3595473","DOIUrl":"https://doi.org/10.1109/TSM.2025.3595473","url":null,"abstract":"","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"38 3","pages":"738-739"},"PeriodicalIF":2.3,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11132377","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on “Ultrawide Band Gap Semiconductor Device for RF, Power and Optoelectronic Applications” IEEE电子器件学报特刊“用于射频、功率和光电子应用的超宽带隙半导体器件”征文
IF 2.6 3区 工程技术
IEEE Journal of Photovoltaics Pub Date : 2025-08-21 DOI: 10.1109/JPHOTOV.2025.3597182
{"title":"Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on “Ultrawide Band Gap Semiconductor Device for RF, Power and Optoelectronic Applications”","authors":"","doi":"10.1109/JPHOTOV.2025.3597182","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3597182","url":null,"abstract":"","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 5","pages":"734-735"},"PeriodicalIF":2.6,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11133609","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Guest Editorial Special Section on the 2024 SEMI Advanced Semiconductor Manufacturing Conference 2024年SEMI先进半导体制造会议特邀编辑专区
IF 2.3 3区 工程技术
IEEE Transactions on Semiconductor Manufacturing Pub Date : 2025-08-21 DOI: 10.1109/TSM.2025.3594797
Jeanne Paulette Bickford;Delphine Le Cunff;Ralf Buengener;Stefan Radloff;Paul Werbaneth
{"title":"Guest Editorial Special Section on the 2024 SEMI Advanced Semiconductor Manufacturing Conference","authors":"Jeanne Paulette Bickford;Delphine Le Cunff;Ralf Buengener;Stefan Radloff;Paul Werbaneth","doi":"10.1109/TSM.2025.3594797","DOIUrl":"https://doi.org/10.1109/TSM.2025.3594797","url":null,"abstract":"","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"38 3","pages":"372-374"},"PeriodicalIF":2.3,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11132375","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Photovoltaics Publication Information IEEE光电杂志出版信息
IF 2.6 3区 工程技术
IEEE Journal of Photovoltaics Pub Date : 2025-08-21 DOI: 10.1109/JPHOTOV.2025.3597174
{"title":"IEEE Journal of Photovoltaics Publication Information","authors":"","doi":"10.1109/JPHOTOV.2025.3597174","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3597174","url":null,"abstract":"","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 5","pages":"C2-C2"},"PeriodicalIF":2.6,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11133597","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multisensor Management Method Based on Multistep Prediction of Bidirectional Joint Risk 基于双向联合风险多步预测的多传感器管理方法
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-08-21 DOI: 10.1109/JSEN.2025.3599187
Lin Zhou;Zheng Zhao;Jiayuan Yan;Yong Jin;Yongjin Huo
{"title":"Multisensor Management Method Based on Multistep Prediction of Bidirectional Joint Risk","authors":"Lin Zhou;Zheng Zhao;Jiayuan Yan;Yong Jin;Yongjin Huo","doi":"10.1109/JSEN.2025.3599187","DOIUrl":"https://doi.org/10.1109/JSEN.2025.3599187","url":null,"abstract":"In a multisensor collaborative tracking system, rational multisensor management methods can achieve optimal system performance. However, the complexity and variability of environmental risks will lead to reduced accuracy and safety of the tracking system. Therefore, this article proposes a multisensor management method based on multistep prediction of a bidirectional joint risk to rationally allocate limited sensor resources. First, this article comprehensively considers three risks, including the radiation risk of our multisensors, the risk of detection loss, and the threat risk of opposing targets, meanwhile constructing a bidirectional joint risk model. Second, adaptive weights for the three risks are proposed to adjust the three risks in the above model. Then, based on the framework of time-series prediction, the bidirectional joint risk is predicted. Finally, based on this, the problem of minimizing the multistep prediction bidirectional joint risk is proposed and then achieving the rational allocation of multisensor resources. The simulation results demonstrate that the proposed method is feasible, as it can effectively allocate limited sensor resources in a multirisk environment, improving the accuracy and security of the tracking system.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 19","pages":"37407-37418"},"PeriodicalIF":4.3,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145204553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on “Reliability of Advanced Nodes” IEEE电子设备学报“先进节点的可靠性”特刊征文
IF 2.6 3区 工程技术
IEEE Journal of Photovoltaics Pub Date : 2025-08-21 DOI: 10.1109/JPHOTOV.2025.3597184
{"title":"Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on “Reliability of Advanced Nodes”","authors":"","doi":"10.1109/JPHOTOV.2025.3597184","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3597184","url":null,"abstract":"","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 5","pages":"736-737"},"PeriodicalIF":2.6,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11133596","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Differential Evolution Optimized Fuzzy Logic Controller and D-Star Algorithm for Clustering Routing in WSNs 基于差分进化优化模糊逻辑控制器和D-Star算法的wsn聚类路由
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-08-21 DOI: 10.1109/JSEN.2025.3599435
Qi Zhang;Huicong Li;Shicheng Zhu;Xiaoshuai Dong
{"title":"Differential Evolution Optimized Fuzzy Logic Controller and D-Star Algorithm for Clustering Routing in WSNs","authors":"Qi Zhang;Huicong Li;Shicheng Zhu;Xiaoshuai Dong","doi":"10.1109/JSEN.2025.3599435","DOIUrl":"https://doi.org/10.1109/JSEN.2025.3599435","url":null,"abstract":"Wireless sensor networks (WSNs), with advantages, such as easy deployment and efficient data collection, constitute a critical component of the Internet of Things. However, WSNs face significant challenges in energy efficiency and prolonging network lifetime. To mitigate these identified limitations, the present work introduces a differential evolution optimized fuzzy logic controller and D-star (DEFLCD) algorithm for clustering routing in WSNs. First, the differential evolution (DE) algorithm is enhanced by integrating a population initialization method based on the SPM chaotic map, along with adaptive scaling factors, crossover probabilities, and an elite individual selection strategy, thereby improving the algorithm’s exploitation capability. Second, the optimized DE algorithm is employed to refine the output membership functions of the fuzzy logic controller (FLC). An innovative fitness metric is formulated to quantify the optimized FLC’s efficacy in improving cluster performance, thereby enhancing operational adaptability and robustness in dynamic networking environments. In the packet forwarding stage, the D-star methodology dynamically classifies congested nodes as routing barriers and establishes power-efficient multihop links between cluster heads (CHs) and the base station, achieving balanced energy utilization and improved scalability across large-scale network infrastructures. The simulation outcomes show that DEFLCD surpasses the existing algorithms in various network performance assessment metrics, offering an energy-efficient routing solution for large-scale monitoring applications.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 19","pages":"37394-37406"},"PeriodicalIF":4.3,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145204564","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Semiconductor Manufacturing Information for Authors IEEE半导体制造信息汇刊
IF 2.3 3区 工程技术
IEEE Transactions on Semiconductor Manufacturing Pub Date : 2025-08-21 DOI: 10.1109/TSM.2025.3595357
{"title":"IEEE Transactions on Semiconductor Manufacturing Information for Authors","authors":"","doi":"10.1109/TSM.2025.3595357","DOIUrl":"https://doi.org/10.1109/TSM.2025.3595357","url":null,"abstract":"","PeriodicalId":451,"journal":{"name":"IEEE Transactions on Semiconductor Manufacturing","volume":"38 3","pages":"C3-C3"},"PeriodicalIF":2.3,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11132376","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Photovoltaics Information for Authors IEEE光电期刊,作者信息
IF 2.6 3区 工程技术
IEEE Journal of Photovoltaics Pub Date : 2025-08-21 DOI: 10.1109/JPHOTOV.2025.3597178
{"title":"IEEE Journal of Photovoltaics Information for Authors","authors":"","doi":"10.1109/JPHOTOV.2025.3597178","DOIUrl":"https://doi.org/10.1109/JPHOTOV.2025.3597178","url":null,"abstract":"","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"15 5","pages":"C3-C3"},"PeriodicalIF":2.6,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11133598","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144887639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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