IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"A new gasket providing high shielding effectiveness at low cost: The \"magnetic\" gasket","authors":"M. Radojicic, J. Rollin, L. Macleod, J. Drayton","doi":"10.1109/ISEMC.1992.626108","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626108","url":null,"abstract":"A new gasket technology has been developed for ElectroMagnetic Interference (EMI) containment which has proven to be superior to conventional pressurefit gaskets for both performance and reliability in marry applications. The gasket consists of a flexible, conductive diaphragm which is held to a cavity opening by means of a magnetic strip. This technology results in a high shielding effectiveness (SE) over a wide frequency range with almost no degradation in performance over life. Testing has demonstrated an average SE 20 to 30 dB superior to that possible from conventional gaskets between 20 MHz and 5 GHz.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"356-360"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82444207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"EMC Education At Syracuse University","authors":"D. Weiner","doi":"10.1109/ISEMC.1992.626070","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626070","url":null,"abstract":"ELECTROMAGNETIC COMPATIBILITY is proposed as a new 500-level course in Electrical Engineering. This course will augment the relatively few design courses available to students in Electrical and Computer Engineering. It will also satisfy the need by industry for students who understand problems associated with designing electromagnetically compatible products. To enhance the design aspect of the course, demonstrations and experiments will be included. A) PROBLEM STATEMENT The accreditation board for Electrical and Computer Engineering undergraduate programs requires that undergraduate students take a minimum of 16 design credits. Currently, Electrical and Computer Engineering students at Syracuse University have little flexibility in selection of their design courses. To alleviate this situation, it is proposed to develop a new 500-level design course to be taught for senior and first-year graduate students. In selecting the topic area for such a course, consideration was given to industrial requirements. Manufacturers of electrical products and electronic systems are keenly aware of the importance of electromagnetic compatibility (EMC). For example, it is important that the electromagnetic radiation from a home computer not interfere with television reception. As a rule, industry cannot afford an in house program to train their beginning engineers to the necessary level of EMC design competence. Consequently, industry today considers a basic knowledge of EMC to be as important a part of an Electrical or Computer Engineer’s education as is circuits, digital design, signal theory, electromagnetics, etc. Nevertheless, according to a survey in 1985 by the Education Committee of the IEEE Electromagnetic Compatibility Society, only a few colleges and universities offer courses dealing with EMC. In spite of this, most respondents felt that there was a need to include this material in the Electrical Engineering curriculum. To satisfy this need, ELECTROMAGNETIC COMPATIBILITY was selected as the subject matter for the new design course. B) OBJECTIVES The course material will be based on the text, INTRODUCTION TO ELECTROMAGNETIC COMPATIBILITY, by C.R. Paul. The manuscript has only recently been accepted for publication by John Wiley and Sons, Inc. (I served as one of the reviewers for John Wiley.) A course outline, based on this text, is included with the supporting documents. In a design course of this nature, it is important that the student observe demonstrations and have an opportunity to conduct experiments. Not only will this help the student to understand and retain the course material, it will also provide the student with an opportunity to see and use modern measurement equipments and to CH3169-0/92/0000-0032 $3.00 01992 IEEE 166 obtain an appreciation for realistic \"numbers\" to be observed in practice. The objective of the proposed project is to develop a minimum of two demonstrations and four experiments for the new course which will first be tau","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"168-170"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75615359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.","authors":"M. Lutz, J-P. Lecury","doi":"10.1109/ISEMC.1992.626075","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626075","url":null,"abstract":"This paper explains, how the burst \"EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the \"real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"86 1","pages":"189-194"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89439192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Measurement comparisons of radiated test facilities","authors":"W.B. Halaberda, J. Rivers","doi":"10.1109/ISEMC.1992.626124","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626124","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"299 1","pages":"401-406"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73166549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Lightning Transient Response And Margin Analysis Of Aircraft Circuits","authors":"B. Kuhlman","doi":"10.1109/ISEMC.1992.626051","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626051","url":null,"abstract":"Procedures from the Federal Aviation Administration (FAA) establish a margin between lightning induced transient levels, and equipment transient qualification levels, as a basis for certification of aircraft electrical/electronic equipment. The electromagnetic environment applied to equipment by existing qualification standards is an approximation of the aircraft environment, complicating analysis of the margin. A circuit model of aircraft transient behavior is used to compare the aircraft and equipment qualification environments, with elements extracted from data from aircraft lightning simulation tests. Margins are plotted as a function of equipment load impedance and transient source impedance on the basis of peak voltage, power, and energy. The range of validity for margin values is shown to be restricted by the characteristics of the generator source impedance. Introduction Lightning research over the last decade has defined the repetitive current pulses encountered by aircraft. The spread of electronics in aircraft systems from the faucet control to critical flight systems has prompted new aviation regulations to insure electromagnetic compatibility with lightning. Procedures have been developed by the FAA through the work of SAE and RTCA comittees and their counterparts in Europe, to address lightning effects on aircraft electrical/ electronic equipment. These are outlined in Advisory Circular AC 20-136 (1). The external aircraft lightning environment has been defined by waveforms of current such as the single stroke, multiple stroke, and multiple burst waveforms. The steps in the procedure provide that lightning induced transient levels are limited to the transient control level (TCL), and that aircraft equipment tolerate transients up to the equipment transient design level (ETDL). The ratio of ETDL to TCL is defined as the margin (Figure 1). The TCL and ETDL encompass a wide range of circuit responses with differing waveforms. The margin must be based on one or more waveform characteristic. Procedures for qualification of airborne equipment contained in DO-160C section 22 (2) were adopted to verify the ETDL. The induced transients were represented as Thevenin equivalent sources, with short wave, long wave, and oscillatory waveforms, and five ohm or twenty ohm source resistances. The procedures did not address all of the new requirements and have been under revision by the SAE and RTCA committees. The recent approach has been to EQUIPMENT TRANSIENT DESIGN","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"5 1","pages":"72-76"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72638085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A comparison of the susceptibility performance of shielded and unshielded twisted pair cable for data transmission","authors":"R. C. Pritchard, D.C. Smith","doi":"10.1109/ISEMC.1992.626086","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626086","url":null,"abstract":"In the past, arguments have been made that Shielded Twisted pair cable, STP, should have better susceptibility performance than Unshielded Twisted pair cable, UTP, in an environment where the cable is subjected to significant external noise. This paper shows that currently available UTP has susceptibility performance that is similar to STP when tested according to 1EC 801-4, Electrical Fast Transient, one of the most severe forms of interference to data signals. This result holds the possibility of substantial savings for building wiring installations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"50 1","pages":"236-242"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76253955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Some Fundamental Aspects Of ESD Testing, Part II","authors":"R. Keenan","doi":"10.1109/ISEMC.1992.626148","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626148","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"54 1","pages":"469-473"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74045189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Satellite Space Charging Phenomenon, And Design And Test Considerations","authors":"A. Whittlesey, H. Garrett, P. Robinson","doi":"10.1109/ISEMC.1992.626161","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626161","url":null,"abstract":"The phenomenon of spacecraft charging in space plasmas and the resultant discharges (electrostatic discharges, or space ESDs) has been known for some time. The charging process requires the presence of ionized gases (plasmas) of high (10 keV or higher) thermal energies, which are caused by solar magnetic storms. Reference [l] presents a brief description; [2] and [3] are more extensive descriptions of the space charging process.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"526-527"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85458202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Crosstalk Of Finite-length Transmission Lines In Arbitrary Directions On The Same Ground Plane","authors":"Y. Kami, R. Sato","doi":"10.1109/ISEMC.1992.626088","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626088","url":null,"abstract":"Transmission lines in the proximity are not always in parallel directions but in arbitrary directions. In this paper, crosstalk or coupling between transmission lines in the arbitrary directions is studied by using a circuit concept. Under the condition of weak coupling, self-capacitances and self-inductances of the transmission lines can be approximated to be invariant in spite of existence of a proximate line. Mutual-capacitances and mutual-inductance is estimated by considering the coupling mechanism for an external electromagnetic field to a transmissicin line. To generalize our mode, a four-port network is also studied.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"60 1","pages":"247-250"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84567374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Computation of transient voltages near complex caused by ligntning currents","authors":"L. Grcev","doi":"10.1109/ISEMC.1992.626123","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626123","url":null,"abstract":"A h s t r a c t : S p a c i o u s and complex grounding s y s t e m s are o f t e n p a r t of a l i g h t n i n g p r o t e c t i o n sys tem i n i n d u s t r i a l and power p l a n t s . Large l i g h t n i n g c u r r e n t i m p u l s e s can c a u s e l a r g e t r a n s i e n t v o l t a g e s c o u p l e d t o c o n t r o l and s i g n a l c i r c u i t s i n n e a r v i c i n i t y t o t h e grounding sys tems. Two d i f f e r e n t computer programs are developed for numer ica l e v a l u a t i o n o f such t r a n s i e n t v o l t a g e s . I t is shown t h a t s i m p l i f i c a t i o n s u s e d i n p r e v i o u s computer models Lead t o e r r o n e o u s r e s u l t s .","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1 1","pages":"393-400"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88727611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}