IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility最新文献

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Introduction to shielding boundary conditions and anomalies 介绍屏蔽边界条件和异常
A. Raahid
{"title":"Introduction to shielding boundary conditions and anomalies","authors":"A. Raahid","doi":"10.1109/ISEMC.1992.626039","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626039","url":null,"abstract":"Certain apparent anomalies in the present electromagnetic shielding theory of a conductive barrier tal radiations from an antenna are described. The rereflection loss paranneter of the present theory is reviewed and the question of its existence is resolved. By using both transmission line and electromagnetic wave propagation theories, it is shown that the rereflection loss occurs in both transmission lines and conductive barriers. The limited applicability of the present theory only to plane wave radiations from antennas is discussed.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78113145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
6 GHz time domain measurement of fast-transient events 快速瞬变事件的6ghz时域测量
R. Wallace
{"title":"6 GHz time domain measurement of fast-transient events","authors":"R. Wallace","doi":"10.1109/ISEMC.1992.626143","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626143","url":null,"abstract":"Very wideband (6 GHz) measurements of the discharge current produced by a commercially available electrostatic discharge (ESD) generator are presented. The results are compared to similar measurements obtained using the IEC 801-2 measurement method (1GHz bandwidth). Under contact discharge conditions, the wideband results indicate a risetime seven times faster than that reported using the IEC method and a peak current amplitude at least four times greater. EM1 generated by a contact discharge is shown to be a more severe threat to high speed telecommunications equipment than is the EM1 generated by an air discharge.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"40 1","pages":"460-463"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85272895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Measuring EMC Antenna Factors In The GHz Transverse Electromagnetic Cell GHz横向电磁蜂窝中电磁兼容天线系数的测量
E. Bronaugh, J. Osburn
{"title":"Measuring EMC Antenna Factors In The GHz Transverse Electromagnetic Cell","authors":"E. Bronaugh, J. Osburn","doi":"10.1109/ISEMC.1992.626084","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626084","url":null,"abstract":"As ule precision of EMC ueasuremeuts his improved, so has their accuracy. With impmved meawrement acciiracy, one of the major concerns of the EMC Community is the absolute accuracy of the field strength data that is compared to field strength specification limits for determination of equipment under test (EUT} compliance. Majab elements of the field strength value calculations are the anterm factors used in the computation of field strength. There is dependence for these values on traditional antenna calibration methods to adequately measure the antenna factor of EMC antennas. While each of the standard calibration procedures will produce adequate calibration results, any new method that provides separate verification or is a precise, accurate alternative method of measurement provides a new optinn for efficient determination of anteiuui factors. This pqer explores a new measurement methcl for antenna factors, provides comparative data and presents conclusions as to its adequacy.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"229-231"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81804146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Development Of IEC Cable Shielding Effectiveness Standards IEC电缆屏蔽效能标准的制定
L. Halme
{"title":"Development Of IEC Cable Shielding Effectiveness Standards","authors":"L. Halme","doi":"10.1109/ISEMC.1992.626102","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626102","url":null,"abstract":"IEC has in the Working Groups on Screening Effectiveness of the sub-committees on RF cables and RF connectors developed shielding effectiveness measurement standards during the past twenty years. The preparatory work is now about completed and new standards for measuring methods and limits are on their way. In this paper the adopted shielding effectiveness quantities and their definitions and background are explained.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"168 1","pages":"321-328"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79516274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Travelling-wave Fast-transient ESD Simulation 行波快速瞬态ESD仿真
K. Balmain, F. Rayal
{"title":"Travelling-wave Fast-transient ESD Simulation","authors":"K. Balmain, F. Rayal","doi":"10.1109/ISEMC.1992.626142","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626142","url":null,"abstract":"Human electrostatic discharge is discussed as a travellingwave process, with the objective of simulating the initial nanosecond-scale current impulse. The approach presented uses swept-frequency impedance measurements at the \"fingertip\" to establish equivalence between the human subject and the simulator which is a lossy dielectric strip. The impedance measurements at the fingertip are used for approximate FFT calculation of transient discharge current. Time-domain arc discharge current measurements for the human subject and the simulator are presented for comparison. Also presented are method-of-moments calculations of time-domain discharge currents, using a loaded wire grid representation for the lossy dielectric strip simulator.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"455-459"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76848131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Inductive-transient testing in large system applications 感应暂态测试在大型系统中的应用
T. Braxton
{"title":"Inductive-transient testing in large system applications","authors":"T. Braxton","doi":"10.1109/ISEMC.1992.626074","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626074","url":null,"abstract":"Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"63 1","pages":"183-188"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83270733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-frequency and low-frequency components of the capacitive switching transients in power mains 电源中容性开关瞬态的高频和低频分量
M. Forti, L. Millanta, G. Pellicci
{"title":"High-frequency and low-frequency components of the capacitive switching transients in power mains","authors":"M. Forti, L. Millanta, G. Pellicci","doi":"10.1109/ISEMC.1992.626135","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626135","url":null,"abstract":"At the connection of a load (typ. a capacitor) across the power-mains live wires a transient disturbance is excited, containing both a low-frequency waveshape (lumpedparameter analysis) and a high-frequency waveshape (wavepropagation analysis). The role of dispersion due to a nonideal dielectric is pointed out, in relation to the high-frequency component.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"53 1","pages":"431-434"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73120924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EMI Modeling Of Air Vents And Slots In Shielded Cabinets 屏蔽机柜通风口和插槽的电磁干扰建模
B. Archambeault
{"title":"EMI Modeling Of Air Vents And Slots In Shielded Cabinets","authors":"B. Archambeault","doi":"10.1109/ISEMC.1992.626047","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626047","url":null,"abstract":"Author: Bruce Archambeault Digital Equipment Corporation This paper describes the development of a modeling tool to predict EM1 radiation from air vent panels, slots, and other openings in shielded devices. The model uses a conducting wire behind the openings rather than a farfield plane wave and predicts the received EM1 strength at typical FCC distances from these openings. The model allows overall dimensions of the vent, thickness of the vent, as well as number, spacing, and orientation of the holes to be varied. Rapid comparisons between existing and proposed slot lengths, air vent openings, and tolerance analysis are possible.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"44-51"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76793389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Applying The Waveguide Below Cut-off Principle To Shielded Enclosure Design 波导下截止原理在屏蔽外壳设计中的应用
L. Hemming
{"title":"Applying The Waveguide Below Cut-off Principle To Shielded Enclosure Design","authors":"L. Hemming","doi":"10.1109/ISEMC.1992.626096","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626096","url":null,"abstract":": The waveguide below cut-off principle is stated and then applied to a series of shielded enclosure applications. Included are the pipe penetration, honeycomb vent, an enclosure seam, a shielding tape, andadoorless entrance for shieldedenclosures that experience a large amount of traffic.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"287-289"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/ISEMC.1992.626096","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72521285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Metallic Quantum Tunneling Surge arresting Materials Principles, Technology Status, And Potential Applications 金属量子隧道阻浪材料原理、技术现状及应用前景
C. Dutcher
{"title":"Metallic Quantum Tunneling Surge arresting Materials Principles, Technology Status, And Potential Applications","authors":"C. Dutcher","doi":"10.1109/ISEMC.1992.626122","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626122","url":null,"abstract":"This paper reports the status of an ongoing research project being carried out on a new class of polymeric surge arresting material devices. They are based on inter-metallic quantum mechanical tunnelling, have demonstrated higher speeds than other types of devices, and have the potential for achieving high energy per volume capacity, while being conformably moldable. The latter can yield a high degree of flexibility in device design allowing the coverage of a wide range of applications. This paper describes their principles of operation, examines the theoretical limit for energy handling in an ideal device, gives status of current material development as well as three potential application examples and their generic considerations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"8 1","pages":"384-392"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75671205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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