电快速瞬变IEC 801-4。电子设备和系统在较高频率和电压下的易感性。

IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1992-01-01 DOI:10.1109/ISEMC.1992.626075

M. Lutz, J-P. Lecury

{"title":"电快速瞬变IEC 801-4。电子设备和系统在较高频率和电压下的易感性。","authors":"M. Lutz, J-P. Lecury","doi":"10.1109/ISEMC.1992.626075","DOIUrl":null,"url":null,"abstract":"This paper explains, how the burst \"EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the \"real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"86 1","pages":"189-194"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.\",\"authors\":\"M. Lutz, J-P. Lecury\",\"doi\":\"10.1109/ISEMC.1992.626075\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper explains, how the burst \\\"EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the \\\"real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"86 1\",\"pages\":\"189-194\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626075\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

本文解释了如何产生突发“EFT”，对标准801-4进行了哪些妥协，以及使用这些妥协测试电子设备的后果。为了避免某些电子设备出现运行故障，必须对“真实飞行”进行模拟。本文将介绍在一个电子系统上进行英语测试的结果。试验在峰值频率高达500k h ~，电压幅值高于4kv的条件下进行。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.

This paper explains, how the burst "EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the "real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility

CiteScore

0.30

自引率

0.00%

发文量