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IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology最新文献

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A piecewise linear time-varying model for modeling the discharging process of a lithium-ion battery 用分段线性时变模型对锂离子电池放电过程进行建模
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-05 DOI: 10.1109/EIT.2014.6871830
Arab AlSharif, M. Das
{"title":"A piecewise linear time-varying model for modeling the discharging process of a lithium-ion battery","authors":"Arab AlSharif, M. Das","doi":"10.1109/EIT.2014.6871830","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871830","url":null,"abstract":"A piecewise linear, time-varying model for modeling the discharging process of Li-ion batteries is introduced in this paper. Such a model consists of a group of piecewise linear model segments, whose parameters are adapted online with time. Thus, the combined overall model is capable of modeling a nonlinear time-varying process, such as a Li-ion battery discharging process, quite well. Modeling results of both simulated test data and actual test data gathered from a high-power automotive-grade Li-ion cell are presented. The close matches between actual and model-predicted behaviors demonstrate the effectiveness of the proposed modeling approach and indicate the potential usefulness of such models for a battery management system.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"27 1","pages":"587-592"},"PeriodicalIF":0.0,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89787716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Study and validation of singularities for a Fanuc LR Mate 200iC robot Fanuc LR Mate 200iC机器人奇异点的研究与验证
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-05 DOI: 10.1109/EIT.2014.6871803
M. Abderrahmane, A. Djuric, W. Chen, C. Yeh
{"title":"Study and validation of singularities for a Fanuc LR Mate 200iC robot","authors":"M. Abderrahmane, A. Djuric, W. Chen, C. Yeh","doi":"10.1109/EIT.2014.6871803","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871803","url":null,"abstract":"Path planning and re-planning for serial 6 degree of freedom (DOF) robotic systems is challenging due to the complex kinematic structure which reflects in the direct and inverse kinematic solutions. Industrial robots can move either in joint space, which use direct kinematic solver or Cartesian space which use the inverse kinematic solver. The complexity in robotics comes from the inverse kinematics, when the robot is moving in the Cartesian space. In that case singularity conditions can occur. The singularity regions for the Fanuc LR Mate 200iC robot have been calculated by finding the determinant of the robot's Jacobian matrix. The recursive Newton-Euler method and the Vector multiplication method are used for the Jacobian matrix generation and validation. The visual representations of the singularity regions are done using the MTALAB tools, which will help process designers to develop valid robot trajectories and optimal layout designs. The validation of the results is done by using the Fanuc LR Mate 200iC robot available in our lab. For each singularity position the Teach Pendant showed the error and the Robot couldn't move. By visualizing the singularity regions location in advance, the manufacturing layout design will be faster and more accurate.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"136 1","pages":"432-437"},"PeriodicalIF":0.0,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86626961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A large-size image watermarking algorithm based on pseudo-random 基于伪随机的大尺寸图像水印算法
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-05 DOI: 10.1109/EIT.2014.6871750
Shumei Wang, S. Ganesan
{"title":"A large-size image watermarking algorithm based on pseudo-random","authors":"Shumei Wang, S. Ganesan","doi":"10.1109/EIT.2014.6871750","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871750","url":null,"abstract":"This paper presents a digital watermarking algorithm supporting large-size image, the amount of information embedded is based on the characteristics of the host image and the watermarking image. We use pseudo-random encoder to determine the location of embedding information and the watermarking. The method of processing the embedded information and carrier information is discrete cosine transform. The embedding method is determined by the watermark information and the corresponding host pixel value. In the watermark extraction process, the original image and watermarked image are both needed, and the embedded watermark location is determined by the key. The test results show that this algorithm has strong practicality and safety.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"1 1","pages":"122-129"},"PeriodicalIF":0.0,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87950389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Study of stress and strain in human spine 人类脊柱的应力和应变研究
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-05 DOI: 10.1109/EIT.2014.6871759
Harsha Aleti, I. Abdel-Motaleb
{"title":"Study of stress and strain in human spine","authors":"Harsha Aleti, I. Abdel-Motaleb","doi":"10.1109/EIT.2014.6871759","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871759","url":null,"abstract":"Identifying the stress and strain distributions in human spines is critical for understanding and predicting spine injuries. A mltiphysics, finite element numerical simulation program, COMSOL is employed to predict the stress and strain in the whole spine. The study included 3D modeling of the thoracic and lumbar vertebrae from T1 to L5, with intervertebral discs, and facet joints. The forces applied are chosen to mimic the different physiological environments that the spine would undergo in the daily activities. The spine was subjected to compression, extension and lateral bending loads, following the methods reported in the literature from cadaveric experiments. In this study, the vertebral bodies were assumed as perfectly cortical rigid bones, without bony endplates; while the spinal ligaments were modeled with a linear elastic constitutive law. The results show a map of stress and strain for applying different types of loads, indicating the areas where stress will be severe.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"7 1","pages":"184-189"},"PeriodicalIF":0.0,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74255272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Leakage power reduction in data driven dynamic logic circuits 数据驱动动态逻辑电路的泄漏功率降低
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-05 DOI: 10.1109/EIT.2014.6871773
C. G. Martin, E. Oruklu
{"title":"Leakage power reduction in data driven dynamic logic circuits","authors":"C. G. Martin, E. Oruklu","doi":"10.1109/EIT.2014.6871773","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871773","url":null,"abstract":"In this paper, data-driven dynamic logic and its' variant split-path data-driven dynamic logic circuits are analyzed for dynamic and static power consumption. A new low-power methodology is introduced in order to reduce the leakage current while maintaining the speed advantages of the data driven dynamic logic. A sleep switch transistor is used in the data driven dynamic circuits in order to force a sleep mode asynchronously. An additional power gating transistor is used to avoid the possible short-circuit paths during idle mode. The proposed circuits are compared against the conventional dynamic logic that uses dual-Vt sleep switch transistors for reduced leakage. 45nm technology has been used to implement the designs and they have been tested using ripple carry adders. The results demonstrate that, with the proposed circuits, leakage power can be reduced by more than 90%, with minimal impact on the speed and dynamic power consumption. Split-path data-driven dynamic logic offers the best speed and power-delay product among the dynamic logic circuits.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"1 1","pages":"260-263"},"PeriodicalIF":0.0,"publicationDate":"2014-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89677330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Multimodal context modeling and classification using TBM 基于TBM的多模态上下文建模与分类
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-06-01 DOI: 10.1109/EIT.2014.6871788
N. Charara, M. Sokhn, I. Jarkass, Omar Abou Khaled, E. Mugellini
{"title":"Multimodal context modeling and classification using TBM","authors":"N. Charara, M. Sokhn, I. Jarkass, Omar Abou Khaled, E. Mugellini","doi":"10.1109/EIT.2014.6871788","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871788","url":null,"abstract":"This paper presents a novel supervised method for context modeling and classification based on Transferable Belief Model (TBM). The task of context classification is to identify, among predefined context types, the one that is currently active in the video-surveillance footage of multipurpose halls. Context is spatially modeled by extracting five discriminative semantic features according to depth zones. These zones are provided by depth-based scene segmentation method. Using mathematical TBM tools, the structured semantic features are processed and the mass functions are modeled on three levels in order to propose classification. In addition to video document indexing and retrieval, this work can improve the machine vision capability in behavior analysis.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"26 1","pages":"341-346"},"PeriodicalIF":0.0,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91149878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Current protection 电流保护
IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology Pub Date : 2014-01-01 DOI: 10.1109/EIT.2014.6871786
S. Phillips, A. Jensen, Steve C. Chiu
{"title":"Current protection","authors":"S. Phillips, A. Jensen, Steve C. Chiu","doi":"10.1109/EIT.2014.6871786","DOIUrl":"https://doi.org/10.1109/EIT.2014.6871786","url":null,"abstract":"This paper defines different variations of current protection, and their usefulness. The main purpose is to eliminate current protectors that use large amounts of power, and to simplify the circuit to aid in the robotic hand's functionality without damage to the system.","PeriodicalId":92209,"journal":{"name":"IEEE International Conference on Electro Information Technology : [proceedings]. IEEE International Conference on Electro Information Technology","volume":"22 1","pages":"330-334"},"PeriodicalIF":0.0,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83212236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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