{"title":"Nano-fabrication dependent quality factor in photonic crystal slab biosensors","authors":"H. Akhavan, M. El-Beheiry, O. Levi","doi":"10.1109/ISOT.2010.5687333","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687333","url":null,"abstract":"Photonic crystal slabs (PCS) are attractive for label-fr ee optical bio-sensors inside micro-fluidic portable diagnostic systems due to their high sensitivity and easy coupling to external radiation. Obtaining high quality factor (Q) values for the guided resonances in these index-of-refraction PCS biosensors is crucial for high sensitivity. Non-ideal fabrication of the hole array in the PCS due to electron beam writing, pattern transfer, and reactive ion etching (RIE) steps will result in imperfect circular hole shapes, and non vertical hole profile that can reduce the Q values. We evaluate the effect of nano-fabrication on the quality factor of guided resonances in PCS biosensors and investigate the potential limitations on sensitivity with current fabrication technologies in a realistic PCS biosensor due to fabrication errors. Spectral broadening of the guided resonances (lower Q values) is found for the fundamental guided resonance modes but no significant changes were observed in higher order guided resonances. These fin dings are consistent with reduced bio-sensing sensitivity in higher order modes due to reduced field overlap with the analyte in side the micro-fluidic channels.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"142 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87566958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Alexander Hildebrand, C. Falldorf, C. von Kopylow, R. Bergmann
{"title":"Resolution enhancement by time-multiplexed acquisition of sub-pixel shifted images employing a Spatial Light Modulator","authors":"Alexander Hildebrand, C. Falldorf, C. von Kopylow, R. Bergmann","doi":"10.1109/ISOT.2010.5687353","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687353","url":null,"abstract":"We present an opto-electronic sub-pixel shifting method for resolution enhancement in monochromatic imaging. It is based on a Spatial Light Modulator (SLM) in the Fourier domain of a 4f-configuration. The SLM is used to modulate the incident light with the transfer function of a lateral subpixel shift. Therefore, a set of laterally shifted representations of the wave field incident on the 4f-setup can be generated in the corresponding camera domain. By numerically combining these images a high resolution image can be calculated. The use of an SLM as a wave field shifting device promises fast and flexible subpixel shifting with a high reproducibility. Exemplarily the method will be introduced for the case of monochromatic imaging, although it can easily be adopted to holography, phase shifting interferometry or other optical measurement techniques. The theoretical analysis includes modeling of the sampling process and the resolution enhancement approach as well as the effects associated with using an SLM as the shifting device. Furthermore the technical limits arising from the pixel pitch and pixel size of the sensor and the SLM are investigated. Finally the feasibility of the presented method is verified experimentally.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"42 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76175679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Okazaki, Takayuki Tanaka, S. Kaneko, H. Takauji, N. Kochi, M. Yamada
{"title":"Modeling stereo measurement error by considering camera vibration","authors":"S. Okazaki, Takayuki Tanaka, S. Kaneko, H. Takauji, N. Kochi, M. Yamada","doi":"10.1109/ISOT.2010.5687347","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687347","url":null,"abstract":"Camera vibration in recorded video is a problem with both handheld and stationary devices that vibrate due to wind and other external forces. To facilitate the development of a robust stereo system that is immune to such camera vibration, this study aims to study establishes an error model for a stereo measurement system by considering camera vibration. In stereo measurements, we approximate the distribution of measurement error in images as a uniform distribution. Given this approximation, parameters of the distribution of measurement error are mean value μ and standard deviation σ, whereas amplitude A and frequency F are parameters of camera vibration. To verify the relationship between these parameters, we performed experiments using a vibration testing system. Results indicated that the vibration did not affect the mean value μ. We also found a positive correlation between standard deviation σ and amplitude A as well as a negative correlation between standard deviation σ and frequency F. Based on these findings, we estimate the parameters of measurement error by the camera vibration parameters and establish our proposed error model.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"74 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79699516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In-Su Jang, Ho-Gun Ha, Tae-Hyoung Lee, Yeong-Ho Ha
{"title":"Adaptive color enhancement based on multi-scaled Retinex using local contrast of the input image","authors":"In-Su Jang, Ho-Gun Ha, Tae-Hyoung Lee, Yeong-Ho Ha","doi":"10.1109/ISOT.2010.5687343","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687343","url":null,"abstract":"Methods of contrast enhancement and color correction are currently among the most active fields in imaging research. The tone curve or histogram of an image is generally used to improve contrast and detail, even though this is often unsatisfactory because the intensity and chromaticity of the illumination vary with geometric position. This has led to the development of the multi-scaled Retinex algorithm in which the in fluence of non-uniform illumination is reduced by partitioning the original image using local average images that are estimated ba sed on Gaussian filtering. However, this algorithm produces color distortion because of the dominant chromaticity of the illumination. To solve this problem, this study introduces a new color correction method for digital images inspired by the multi-scale Retinex algorithm. The method includes selecting appropriate parameters for the Gaussian filters because this is the most important factor in reducing the artifacts introduced by the conventional multi-scale Retinex algorithm. Measures of visual contrast and halo are used to check the condition of artifacts for different values of the Gaussian parameters. The illuminant component is estimated to correct its chromaticity. A saturation compensation method based on preserving the chroma ratio is also used to compensate for the possible lack of saturation resulting from the modified multi-scale Retinex model.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"76 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75945653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Cheng-ming Sun, Yan Yuan, Xiu-bao Zhang, Qian Wang, Zhiliang Zhou
{"title":"Research on the model of spectral BRDF for space target surface material","authors":"Cheng-ming Sun, Yan Yuan, Xiu-bao Zhang, Qian Wang, Zhiliang Zhou","doi":"10.1109/ISOT.2010.5687369","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687369","url":null,"abstract":"In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380–2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"97 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76974099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurement and compensation of deformations in coordinate measurement arm","authors":"M. Vrhovec, I. Kovac, M. Munih","doi":"10.1109/ISOT.2010.5687319","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687319","url":null,"abstract":"The paper is dealing with Coordinate Measuring Arm (CMA) accuracy. Error sources contributing to the measurement uncertainty of CMAs are summarized. In sequence, the focus is on elastic deformations as one of the main error sources. A novel system is presented, developed specifically for measuring link deflections. A detailed evaluation of the system was performed. The results confirmed suitability of the system, which was subsequently mounted on a CMA segment for measurements of 1. external force influence on segment deflection, 2. dynamic measurements of link deflection and 3. compensation of CMA deformations. Vertical deformation in the segment was measured at 30 µm, the dynamic deformations were measured at 40 µm, while the improvement with compensation was found in order of 11% to 16%.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"89 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73862099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A dual wafer prealigner and a multiple level structure","authors":"HyungTae Kim, Sungbok Kang, Youngjune Cho","doi":"10.1109/ISOT.2010.5687323","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687323","url":null,"abstract":"The purpose of this study is to examine the means by which multiple wafers may be aligned in order to reduce wafer handling time in wafer processes. We designed a multilevel structure for a prealigner which can simultaneously handle multiple wafers within a system. The system consists of gripping parts, kinematic parts, vacuum chucks, pneumatic units, hall sensors and a DSP controller. The procedure through which the wafers were aligned consists of two steps: mechanical gripping and notch finding. The first step comprises aligning a wafer along the XY direction using 4-point mechanical contact. The rotational error can be found by detecting a signal in the notch using hall sensors. A dual prealigner was designed for 300mm wafers and constructed for a performance test. The accuracy was monitored by checking the movement of a notch in a machine vision which is separated from the prealigner. The result indicates that the dual prealigner exhibits sufficient performance comparable to existing commercial products.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":" 14","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72560941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Liquid crystal lens with two divided and double circularly hole-patterned electrodes","authors":"M. Kawamura, H. Goto","doi":"10.1109/ISOT.2010.5687393","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687393","url":null,"abstract":"We propose a liquid crystal lens with two divided and do uble circularly hole-patterned electrodes for controlling the focal length with negative and positive lens properties. The radially and axial symmetrically distributed refractive index of the hole-patterned aperture can be obtained by controlling the two divided circularly hole-patterned electrodes in addition to the double circularly hole-patterned electrodes.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"141 1","pages":"1-5"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76184685","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Saturation avoidance by adaptive fringe projection in phase-shifting 3D surface-shape measurement","authors":"C. Waddington, J. Kofman","doi":"10.1109/ISOT.2010.5687390","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687390","url":null,"abstract":"Fringe-pattern projection systems are capable of non-contacting 3D surface full-field measurement with high accuracy. However, the systems are prone to intensity saturation and low signal-to-noise ratio (SNR) when measuring objects with a large range of reflectivity across the surface. Intensity saturation occurs when the light intensity directed to the camera exceeds the maximum intensity quantization level. A low SNR occurs when there is a low intensity modulation compared to the amount of noise in the image. Saturation and low SNR can result in significant measurement error. This paper presents a method for saturation avoidance during object-surface measurement, by adaptively adjusting the projected fringe-pattern intensities, through the maximum input gray level (MIGL). A high SNR can be maintained while avoiding saturation by combining the intensities from phase-shifted images captured at different MIGL, into a set of composite phase-shifted images. In measurement of a black and white checkerboard at different depths, the newly developed method reduced errors by an average 0.25 mm compared to the highest accuracy measurement using a uniform MIGL.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"42 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77640994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Thermal diffusion simulations for photothermal oscillators","authors":"Kotomi Kawakami, H. Okamura, A. Mitani","doi":"10.1109/ISOT.2010.5687335","DOIUrl":"https://doi.org/10.1109/ISOT.2010.5687335","url":null,"abstract":"The effect of material parameters on the oscillation amplitude of a photothermal actuator/oscillator was discussed, and a criterion to maximize the amplitude was derived. The bending stress is inversely proportional to the thickness of the irradiated portion, while a certain thickness is necessary for a temperature gradient to be created. Numerical simulations suggested the bending effect becomes largest when the thickness is about the thermal diffusion length of the substance. Experiment using Cu samples with thickness ranging from 0.05 to 0.5mm confirmed the theoretical predictions.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"3 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73734335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}