Cheng-ming Sun, Yan Yuan, Xiu-bao Zhang, Qian Wang, Zhiliang Zhou
{"title":"空间目标表面材料光谱BRDF模型研究","authors":"Cheng-ming Sun, Yan Yuan, Xiu-bao Zhang, Qian Wang, Zhiliang Zhou","doi":"10.1109/ISOT.2010.5687369","DOIUrl":null,"url":null,"abstract":"In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380–2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.","PeriodicalId":91154,"journal":{"name":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","volume":"97 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Research on the model of spectral BRDF for space target surface material\",\"authors\":\"Cheng-ming Sun, Yan Yuan, Xiu-bao Zhang, Qian Wang, Zhiliang Zhou\",\"doi\":\"10.1109/ISOT.2010.5687369\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380–2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.\",\"PeriodicalId\":91154,\"journal\":{\"name\":\"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)\",\"volume\":\"97 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISOT.2010.5687369\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optomechatronic Technologies (ISOT), 2010 International Symposium on : 25-27 Oct. 2010 : [Toronto, ON]. International Symposium on Optomechatronic Technologies (2010 : Toronto, Ont.)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOT.2010.5687369","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research on the model of spectral BRDF for space target surface material
In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380–2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.