Journal of Analytical Atomic Spectrometry最新文献

{"title":"Assessment of matrix effects in boron isotope analysis using 257 nm fs-LA and 193 nm ns-LA-MC-ICP-MS with new tourmaline reference materials†","authors":"Xiaojuan Nie, Yan Zhang, Zhian Bao, Kaiyun Chen, Wenqiang Yang and Honglin Yuan","doi":"10.1039/D5JA00167F","DOIUrl":"https://doi.org/10.1039/D5JA00167F","url":null,"abstract":"<p >This study compared boron (B) isotopic compositions of six chemically diverse tourmalines (including schorl, dravite, and elbaite types) using 257 nm femtosecond (fs) and 193 nm nanosecond (ns) laser ablation coupled with multi-collector inductively coupled plasma mass spectrometry (LA-MC-ICP-MS). Significant matrix effects were observed when non-matrix-matched standards were used, leading to <em>δ</em><small>¹¹</small>B deviations of −0.70‰ to −0.41‰ for fs-LA and −0.63‰ to −0.57‰ for ns-LA when using dravite GIGT as a bracketing standard for schorl (TOUR1 and TOUR4) and elbaite (TOUR6). In contrast, using GIGT as the matrix-matched bracketing standard in the B analysis of dravites (TOUR2, TOUR3, and TOUR5) yielded significantly lower deviations of −0.22‰ to −0.18‰ for fs-LA and −0.44‰ to 0.12‰ for ns-LA. These findings necessitate matrix-matched standards for precise and accurate <em>in situ</em> measurements of B isotopes. We characterized four natural tourmaline reference materials (TOUR1, TOUR4, TOUR5, and TOUR6) for <em>in situ</em> B isotope analysis using LA-MC-ICP-MS and confirmed their isotopic homogeneity. The measured mean <em>δ</em><small>¹¹</small>B values were −11.14 ± 0.40‰ (2SD, <em>n</em> = 597), −13.42 ± 0.57‰ (2SD, <em>n</em> = 509), −9.09 ± 0.60‰ (2SD, <em>n</em> = 486), and −8.57 ± 0.17‰ (2SD, <em>n</em> = 164), respectively, agreeing well with those obtained by solution nebulizer (SN)-MC-ICP-MS. Thus, schorl (TOUR1 and TOUR4), dravite (TOUR5), and elbaite (TOUR6) are recommended as candidate matrix-matched tourmaline reference materials for <em>in situ</em> B isotope determination.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 8","pages":" 2049-2061"},"PeriodicalIF":3.1,"publicationDate":"2025-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144740043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A new orthopyroxene reference material (BL-1) for in situ microanalysis†","authors":"Peng-Li He, Xiao-Long Huang, Le Zhang, Fan Yang, Lin-Li Chen and Sheng-Ling Sun","doi":"10.1039/D5JA00069F","DOIUrl":"https://doi.org/10.1039/D5JA00069F","url":null,"abstract":"<p >Orthopyroxene is a significant mineral in both the Earth and the Moon, with its trace element composition playing a critical role in investigations of mantle conditions and magmatic evolution. Microanalysis of trace elements relies on reference materials to evaluate systematic errors and ensure data quality. This study introduces a new orthopyroxene reference material (BL-1), an aluminous enstatite, derived from peridotite xenoliths hosted by the Bailin basalt in southeastern China. The major and trace element concentrations of 16 elements (Si, Al, Fe, Mg, Ca, Na, Sc, Ti, V, Cr, Mn, Co, Ni, Zn, Ga, and Y) have been confirmed to be homogeneous at the micrometer to millimeter scale through X-ray intensity mapping, EPMA, and LA-ICP-MS <em>in situ</em> quantification. Bulk analyses conducted <em>via</em> WD-XRF, ICP-OES and solution-based ICP-MS demonstrate excellent agreement with <em>in situ</em> microanalyses performed using EPMA and LA-ICP-MS. Seven trace elements (Ca, Na, Ti, V, Cr, Mn, and Ni) exhibit concentrations exceeding 100 ppm, making BL-1 suitable as a reference material for routine trace element analyses using EPMA. Therefore, BL-1 orthopyroxene serves as an excellent complementary reference material for elemental <em>in situ</em> microanalysis. Although Ti, Zn, and Y exhibit notable deviations, the NIST SRM 612 and the USGS glasses demonstrate small fractionations for other elements and are effective for calibrating BL-1 orthopyroxene in LA-ICP-MS. EMPA analyses of BL-1 using different primary standards reveal negligible differences.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 8","pages":" 2062-2072"},"PeriodicalIF":3.1,"publicationDate":"2025-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144740045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A workflow-optimized protocol for accelerated sample preparation and automated Sr separation from natural waters for 87Sr/86Sr determination†","authors":"Grace N. Manestar, Hilary M. K. Lewis, Alex McCoy-West, Nishen Naidoo, Stefan Makart, Ondrea Thompson and Brandon Mahan","doi":"10.1039/D5JA00086F","DOIUrl":"https://doi.org/10.1039/D5JA00086F","url":null,"abstract":"<p >Radiogenic strontium (<small>⁸⁷</small>Sr/<small>⁸⁶</small>Sr) is a powerful tool for characterizing and differentiating water reservoirs (among many other applications). The development and improvement of high-precision analytical platforms (namely MC-ICP-MS) has enhanced throughput for isotope ratio determination. However, analyte purification—needed to remove isobaric interferences—continues to occur largely <em>via</em> conventional manual gravity-driven ion exchange chromatography (hereafter: manual IEC), which generally cannot match instrument throughput. This has created a persistent throughput gap that encumbers use and proliferation, emphasizing the need for rapid separation of Sr, and of comprehensive, end-to-end high throughput workflows and analytical approaches that are fit-for-purpose. Here we have developed a workflow-optimized protocol for sample preparation and separation of Sr from natural water samples using both workflow-optimized manual IEC and automated high pressure ion chromatography (HPIC), for subsequent analysis <em>via</em> MC-ICP-MS. These methods have been designed to seamlessly integrate with common international practice for water sample collection. The automated HPIC technique accommodates introduction of water samples filtered with standard 0.45 μm membranes and acidified with ultra-high purity nitric acid (HNO<small>₃</small>, to pH of 1–2, approximated as 0.09 mol per L HNO<small>₃</small>). Filtered and acidified samples are directly introduced into the HPIC system where Sr is separated from other cations (namely Ca) and collected as an isolate in a specific volume of ultrapure water. Strontium isolates, with no further preparation (<em>e.g.</em> dry-down and reflux), are then directly acidified to 0.5 mol per L HNO<small>₃</small> and analyzed by MC-ICP-MS. This technique can process 40–50 samples in a 24 hour period with mitigated potential for human error, matching current MC-ICP-MS analytical capacity, and achieving analytical precision sufficient to distinguish the variability observed in natural samples across many applications.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1666-1677"},"PeriodicalIF":3.1,"publicationDate":"2025-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2025/ja/d5ja00086f?page=search","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Layer-resolving ability and model analysis of LIBS for multilayer samples with a four-layer structure under different focusing conditions†","authors":"Shiming Liu, Cong Li, Qi He, Boliang Men, Ding Wu, Ran Hai, Xingwei Wu and Hongbin Ding","doi":"10.1039/D5JA00034C","DOIUrl":"https://doi.org/10.1039/D5JA00034C","url":null,"abstract":"<p >The depth resolution of the deposited layer on the plasma-facing components (PFCs) is essential for understanding the plasma–wall interaction (PWI) processes. Laser-induced breakdown spectroscopy (LIBS) has been proven effective for the <em>in situ</em> diagnosis of the depth profile of the deposited layer on the first wall of a fusion device. However, the effect of focusing conditions on LIBS depth profiling requires further investigation. In this study, depth profiling of multilayer samples with a four-layer structure was performed in a vacuum by adjusting the distance from the focal point to the sample surface (Δ<em>L</em>). The impact of focusing conditions on LIBS depth resolution was investigated, and the resulting depth distribution profiles were modeled. The results indicated that the laser profile factor gradually decreases with increasing Δ<em>L</em> and the resolving ability of the Ni intermediate layer gradually decreases. According to the LPIR model, the depth profiles obtained under different focusing conditions were successfully simulated, and the interface positions between layers were quantitatively identified. The correlation coefficients between the modeling and experimental results for the depth distributions under different focusing conditions were greater than 0.99. Additionally, layer thicknesses were calculated and compared under different focusing conditions. Overall, the medium spot size obtained in the defocused state is beneficial for depth profiling of a complex multilayer sample, considering the layer-resolving ability of the Ni intermediate layer and the accuracy of the layer thickness. This study will be of great significance in optimizing the experimental conditions of the <em>in situ</em> LIBS system for fusion devices.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 8","pages":" 2026-2037"},"PeriodicalIF":3.1,"publicationDate":"2025-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144740040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Assay of lead-210 in metallic copper via accelerator mass spectrometry","authors":"Doru Pacesila, Iuliana Stanciu, Razvan Gornea, William E. Kieser, Nimal De Silva, Albert Zondervan, Barbara Francisco, Michaela Froehlich, Michael Hotchkis, Marie-Cécile Piro and Guillaume Giroux","doi":"10.1039/D5JA00105F","DOIUrl":"https://doi.org/10.1039/D5JA00105F","url":null,"abstract":"<p >This study focuses on the precise quantification of <small>²¹⁰</small>Pb contamination in metallic copper, an essential construction material of ultra-sensitive detectors in astroparticle physics, by Accelerator Mass Spectrometry. For the most stable and durable anion beam current from the Cs sputter source, PbF<small>₂</small> in a mixture with fine Ag powder was found to be preferable over PbO + Ag. After tandem acceleration and electron stripping with helium, the maximum <small>²⁰⁶</small>Pb<small>³⁺</small> current was 0.11 μA, and the <small>²¹⁰</small>Pb detection efficiency was 1.3 × 10<small>⁻⁴</small>. Investigation of several methods to extract lead from copper, with HNO<small>₃</small>, NH<small>₄</small>OH, and H<small>₂</small>SO<small>₄</small>, led to chemical recovery rates up to 92%. Following the development of chemical and target preparation procedures, an upper limit of <small>²¹⁰</small>Pb = 62 mBq kg<small>⁻¹</small> was determined for the NEWS-G copper (Aurubis) sample, consistent with previous results obtained by α-spectrometry. Tests with copper plates exposed to an atmosphere of <small>²²²</small>Rn (1625 Bq m<small>⁻³</small>) for 182 hours showed significant <small>²¹⁰</small>Pb surface contamination (0.56 ± 0.16 Bq m<small>⁻²</small>), underscoring the importance of minimizing radon in spaces where metallic copper is chemically and/or physically processed.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1852-1861"},"PeriodicalIF":3.1,"publicationDate":"2025-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Correction: The occurrence and sources of Ni in ambient air particulates using synchrotron radiation based X-ray fluorescence and X-ray absorption near edge structure","authors":"Abdallah A. Shaltout, Messaoud Harfouche, Omar H. Abd-Elkader and Diane Eichert","doi":"10.1039/D5JA90024G","DOIUrl":"https://doi.org/10.1039/D5JA90024G","url":null,"abstract":"<p >Correction for ‘The occurrence and sources of Ni in ambient air particulates using synchrotron radiation based X-ray fluorescence and X-ray absorption near edge structure’ by Abdallah A. Shaltout <em>et al., J. Anal. At. Spectrom.</em>, 2025, <strong>40</strong>, 1297–1308, https://doi.org/10.1039/D5JA00043B.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1862-1862"},"PeriodicalIF":3.1,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2025/ja/d5ja90024g?page=search","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Two-stage semi-supervised machine learning for classification of Ti-rich nanoparticles and microparticles measured by spICP-TOFMS†","authors":"Raven L. Buckman Johnson, Hark Karkee and Alexander Gundlach-Graham","doi":"10.1039/D5JA00108K","DOIUrl":"https://doi.org/10.1039/D5JA00108K","url":null,"abstract":"<p >Single-particle inductively coupled plasma time-of-flight mass spectrometry (spICP-TOFMS) can be used to measure metal-containing nanoparticles (NPs) and sub-micron particles (μPs) at environmentally relevant concentrations. Multielement fingerprints measured by spICP-TOFMS can also be used to differentiate natural and anthropogenic particle types. Thus, the approach offers a promising route to classify, quantify, and track anthropogenic NPs and μPs in natural systems. However, biases in spICP-TOFMS data caused by analytical sensitivities, Poisson detection statistics, and elemental variability at the single-particle level complicate particle-type classification. To overcome the inherent bias in spICP-TOFMS data for the classification of particle types, we have developed a multi-stage semi-supervised machine learning (SSML) strategy that identifies and subsequently trains on systematic noise in spICP-TOFMS data to produce more robust particle-type classifications. Here, we apply our two-stage SSML model to classify individual Ti-containing NPs and μPs <em>via</em> spICP-TOFMS analysis. To build our model, we measure neat suspensions of anthropogenic TiO<small>₂</small> particles (E171) and natural titanium-containing particle types: rutile, ilmenite, and biotite by spICP-TOFMS. Element mass amounts recorded per particle are used to classify particle type by SSML and then systematic particle misclassifications are identified and recorded as uncertainty classes. Following, a second SSML model is trained with the addition of uncertain particle-type categories. With two-stage SSML, we demonstrate low false-positive rates (≤5%) and moderate particle recoveries (50–90%) for all anthropogenic and natural particle types. Two-stage SSML is a streamlined, hands-off method to identify and overcome bias in spICP-TOFMS training data that provides a robust particle-type classification.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1658-1665"},"PeriodicalIF":3.1,"publicationDate":"2025-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2025/ja/d5ja00108k?page=search","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"PX xenotime: a new reference material for SIMS oxygen isotopic microanalysis and potential applications†","authors":"Li-Guang Wu, Xiao-Xiao Ling, Guo-Qiang Tang, Yu Liu, Zhenyu Chen, Qiu-Li Li, Xian-Hua Li and Benita Putlitz","doi":"10.1039/D5JA00006H","DOIUrl":"https://doi.org/10.1039/D5JA00006H","url":null,"abstract":"<p >Xenotime is a common accessory mineral found in igneous, metamorphic, and sedimentary rocks, as well as hydrothermal ore deposits. Although the U–Th–Pb isotopic compositions of xenotime have been used widely to constrain host rock ages, O isotopic compositions have rarely been exploited. A major challenge is that microanalysis techniques, such as secondary ion mass spectrometry (SIMS), are required to analyze small and zoned xenotime crystals, and these techniques require matrix-matched reference materials to correct for instrumental mass fractionation and to monitor analytical accuracy. Currently, there are no reference materials for SIMS O isotopic analysis of xenotime, which impedes its application in geological studies. We present PX xenotime, a sample collected from Zagi Mountain, Pakistan, that exhibits a homogeneous O isotopic composition as confirmed through SIMS analyses. Laser fluorination–isotopic ratio mass spectrometry yielded a <em>δ</em><small>¹⁸</small>O value of 6.25‰ ± 0.13‰ (2SD, <em>n</em> = 6). Thus, we establish PX xenotime as the first reference material for SIMS xenotime O isotopic analysis. We also explore the potential applications of SIMS xenotime O isotopic analysis through O isotopic fractionation between quartz and xenotime and between xenotime and water. Our results show that the quartz–xenotime O isotope thermometer is promising for low-temperature hydrothermal systems (&lt;400 °C). Moreover, fluid <em>δ</em><small>¹⁸</small>O compositions can be directly determined by SIMS quartz–xenotime <em>δ</em><small>¹⁸</small>O analysis in a single session.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1788-1795"},"PeriodicalIF":3.1,"publicationDate":"2025-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Pb isotope ratio and trace element analysis using VUV-TOF mass spectrometry: applications to NIST 610/612 and zircon FC1†","authors":"Yixuan Li, Haoyu Shi, Peng Wang and Yuxiang Mo","doi":"10.1039/D5JA00142K","DOIUrl":"https://doi.org/10.1039/D5JA00142K","url":null,"abstract":"<p >We present a novel method for measurement of <small>²⁰⁷</small>Pb/<small>²⁰⁶</small>Pb and <small>²⁰⁸</small>Pb/<small>²⁰⁶</small>Pb isotope ratios in solid samples, employing vacuum ultraviolet (VUV) laser ablation/ionization coupled with a time-of-flight reflectron mass spectrometer (VUV-TOF). The 125.5 nm VUV laser, generated <em>via</em> four-wave mixing in an Hg cell driven by a YAG-pumped two-dye laser system, offers a simpler and more robust alternative to previous configurations. Advanced data collection and processing protocols enable calibration-free Pb isotope ratio measurements with accuracies better than 1.6% (2 times the relative standard deviations) for reference materials NIST 610, NIST 612 and zircon FC1. Notably, isotope ratios remain stable despite variations in Pb<small>⁺</small> signal intensities caused by downhole fractionation. Semi-quantitative trace element sensitivities, determined using NIST 610, further highlight the method's versatility. With an ablation spot size smaller than 2 μm, this technique is ideally suited for high-spatial-resolution applications, including the dating of zoned zircons. The combination of precision, sensitivity, and robustness establishes VUV-TOF mass spectrometry as a powerful tool for advancing isotopic analysis in geochronology and geochemistry.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 7","pages":" 1833-1844"},"PeriodicalIF":3.1,"publicationDate":"2025-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Multilayer target PIXE spectral simulation (X,X) secondary fluorescence correction algorithm","authors":"M. A. Reis","doi":"10.1039/D4JA00463A","DOIUrl":"https://doi.org/10.1039/D4JA00463A","url":null,"abstract":"<p >Simulation of particle induced X-ray emission (PIXE) spectra is not a recent subject. Still, when samples are not homogeneous, problems emerge even in the simplest case of layered samples. If it is necessary to consider the presence of the same chemical element in more than one physically distinct layer the number of available simulation codes is very small. In addition, although X-ray emission spectra from PIXE experiments are much less prone to significant secondary fluorescence issues than their X-ray fluorescence spectrometry (XRF) counterpart, cases do emerge where secondary fluorescence calculations are necessary to ensure good PIXE spectral simulations, even if corrections are small. The case of secondary fluorescence induced by primary X-rays in thick homogeneous samples was solved long ago by various authors. In the case of non-homogenous targets, the problem becomes much more complex and, although also addressed long ago, a general solution cannot be found in the standard accessible literature on the PIXE technique. In the present work we revise a secondary fluorescence correction method presented in 1996 to handle homogeneous targets and extend it to be applicable to multilayered targets. Its implementation in the DT2 code allows simulation of PIXE spectra taking into account this type of matrix effect correction in complex multilayer targets. Fluorescence between different physical layers, the possibility of the presence of one chemical element in more than one layer, and the potential “illusional” presence of a chemical element in a given layer due to secondary fluorescence effects, when its real concentration in that layer is null, are dealt with. This is the first of what is intended to be a series of three papers. In this part I work, the model is presented for the case of secondary X-rays induced by primary X-rays produced by particle collisions. Applications and potentially demanding experimental conditions will be dealt with in part II, and the case of secondary X-rays induced by primary radiation from non-radiative transitions of fast electrons will be addressed in part III.</p>","PeriodicalId":81,"journal":{"name":"Journal of Analytical Atomic Spectrometry","volume":" 9","pages":" 2507-2525"},"PeriodicalIF":3.1,"publicationDate":"2025-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2025/ja/d4ja00463a?page=search","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144909596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}