2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)最新文献

Design of a Precise Axial Adjusting Mechanism with Three Guiding Flexures for Optical Element 光学元件三导曲精密轴向调节机构的设计

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552203

K. Guo, Defu Zhang, Huanan Chen, M. Ni, Y. Sui

{"title":"Design of a Precise Axial Adjusting Mechanism with Three Guiding Flexures for Optical Element","authors":"K. Guo, Defu Zhang, Huanan Chen, M. Ni, Y. Sui","doi":"10.1109/3M-NANO.2018.8552203","DOIUrl":"https://doi.org/10.1109/3M-NANO.2018.8552203","url":null,"abstract":"The guiding flexure is generally used in the positioning mechanism for in-plane movement and nanometer level adjustment accuracy. In this paper, an axial adjusting mechanism for regulating optical element in ultra-precision optical system is designed utilizing the guiding flexures which are arranged in space so that the mechanism can obtain out of plane movement with high adjustment precision. The structure and working principle of the axial adjusting mechanism are described. The stiffness analysis model is established. The adjusting and guiding capabilities of the adjusting mechanism owing to the spatial arranged guiding flexures are analyzed by finite element analysis (FEA). And the relationships between the key dimensions of the guiding flexures and the characteristics of the adjusting mechanism are investigated. The results show that the compliance in Z-direction which characterizes the adjusting capability of the adjusting mechanism and the axial/lateral compliance ratio which characterizes the guiding capability are mainly influenced by the thickness and length of flexible hinges in the guiding flexure. Under the premise of the stress within 150 MPa, the compliance in Z-direction can reach 19.8 μm/N, and the axial/lateral compliance ratio can achieve about 170.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"1 1","pages":"96-100"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74712517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Precisely Lateral Alignment of Gold Nanorods Array via Hydrophilic-Hydrophobic Pattern 亲疏水模式下金纳米棒阵列的精确横向排列

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552205

Shuang Wang, Chang Liu, Yanyan Wang

引用次数: 0

Sensing Characteristics of Fano Resonance in Y-shaped Gold Nanorods Array y型金纳米棒阵列Fano共振传感特性研究

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552191

Li Wang, Y. Leng, Yanjun Sun, Lianhe Dong

引用次数: 0

Rheological Properties of Corn Starch Dispersions in Pregelatinized Starch Solution 玉米淀粉分散体在预糊化淀粉溶液中的流变性能

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552207

Yunhai Ma, Siyang Wu, J. Tong, Xin Zhang, Jie-gang Peng, Xianping Liu

引用次数: 2

Structure, Topology, Vibrational Frequency, Frontier Molecular Orbital Gaps, Stability, Charge, NICS, and Conductivity of Non-segregated Silicon Heterofullerenes: A DFT Approach 非分离硅杂富勒烯的结构、拓扑、振动频率、前沿分子轨道间隙、稳定性、电荷、NICS和电导率:一种DFT方法

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552174

Somayeh Soleimam-Amin, M. Koohi

{"title":"Structure, Topology, Vibrational Frequency, Frontier Molecular Orbital Gaps, Stability, Charge, NICS, and Conductivity of Non-segregated Silicon Heterofullerenes: A DFT Approach","authors":"Somayeh Soleimam-Amin, M. Koohi","doi":"10.1109/3M-NANO.2018.8552174","DOIUrl":"https://doi.org/10.1109/3M-NANO.2018.8552174","url":null,"abstract":"Silicon doped heterofullerenes of C20, I-VIII, are compared and contrasted by density functional theory (DFT) calculations. All studied species are known as true minima by vibrational frequency analysis. Heterofullerenes included alternating heteroatoms in equatorial position are introduced as stable highly-doped heterofullerenes due to lack of weak silicon―silicon single bonds. No deformation was seen for eight isolated heterofullerenes and all are the isolated-pentagon fullerenic cage. The species of II with the most negative NICS, as well as the highest band gap and binding energy is distinguished as the most thermodynamically, kinetically and chemically stable heterofullerene. The calculated structure of C18Si2 (II) with C1 symmetry is included two silicon atoms in equatorial position. Heterofullerenes especially VIII with the most negative charges on carbon atoms and the most positive charges on silicon heteroatoms (3 to 5.6 times in relation to other species), display the points with different charges that make big charge transfer on the surface of them. That make it as an excellent volunteer for hydrogen storage. These computational results promote chemists to have more experimental verifications.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"34 1","pages":"51-54"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81660003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Topological Structure Synthesis of Three-Rotational-DOF Compliant Mechanisms 三转动自由度柔性机构的拓扑结构综合

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552233

Dachang Zhu, Chunliang Zhang, Yanping Feng

引用次数: 1

Deposition and Alignment of Carbon Nanotubes with Dielectrophoresis for Fabrication of Carbon Nanotube Field-Effect Transistors 电泳法制备碳纳米管场效应晶体管的沉积与取向研究

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552183

J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino

{"title":"Deposition and Alignment of Carbon Nanotubes with Dielectrophoresis for Fabrication of Carbon Nanotube Field-Effect Transistors","authors":"J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino","doi":"10.1109/3M-NANO.2018.8552183","DOIUrl":"https://doi.org/10.1109/3M-NANO.2018.8552183","url":null,"abstract":"Semiconducting carbon nanotubes (CNTs) were dispersed ultrasonically in the Nmethyl-2-pyrrolidone (NMP) solvent, and were aligned and patterned with the alternating electric field-directed dielectrophoresis (DEP) method. CNT transistors were fabricated with the DEP-patterned semiconducting CNTs. Clean room-based micro- and nanofabrication techniques such as UV lithography and lift-off process were used to fabricate the CNT devices. The patterned semiconducting carbon nanotubes and fabricated transistors were imaged using the scanning electron microscope (SEM), and the current-voltage (IV) curves were obtained. It was found that the gap between the opposite electrodes affected the patterning of CNTs in the DEP process; the CNT transistors had excellent current-voltage (IV) curves of p-channel filedeffect transistors with high ratios of on/off source-drain current values, and the semiconducting CNTs could achieve a higher yield in the device fabrication.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"7 1","pages":"308-311"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74094737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Radial Error Motion Measurements at Nanometer-level Precision Using Angle Encoder with Different Four-scanning-heads Arrangements 采用不同四扫描头排列方式的角度编码器测量纳米级精度的径向误差运动

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552247

Yang Jiao, Jiasheng Li, Pinkuan Liu

{"title":"Radial Error Motion Measurements at Nanometer-level Precision Using Angle Encoder with Different Four-scanning-heads Arrangements","authors":"Yang Jiao, Jiasheng Li, Pinkuan Liu","doi":"10.1109/3M-NANO.2018.8552247","DOIUrl":"https://doi.org/10.1109/3M-NANO.2018.8552247","url":null,"abstract":"Four-scanning-heads error separation method under optimal arrangement has proven useful for measuring the radial error motion of axis of rotation. This technique is based upon the fact that angles read by scanning heads are mainly affected by both the graduation error of the angle encoder’s scale and the spindle radial error motion. This paper presents a further validation of this method on a high-accuracy air-bearing rotary stage equipped with an angle encoder with six scanning heads. Experiments are performed to measure the radial error motion by three different four-scanning-heads arrangement schemes. The results show a nanometer-level repeatability of the measured error motion. Moreover, the error motion values obtained by these three arrangement schemes agree very well, which further confirm the effectiveness of the method. This technique is well suited for error motion measurement of rotary tables with angle encoder as the angle measuring device, since it needs no additional artifact compared with the conventional methods.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"61 1","pages":"105-109"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85123189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Nanoparticles as Co-matrix for Sensitive Detection of Nucleic Acids by Mass Spectrometry 纳米颗粒作为质谱法检测核酸的共基质

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552208

Xiaomeng Hu, Lin Wang, Qiaomei Guo, J. Lou, Lin Huang, Ru Zhang, Kun Qian

引用次数: 0

Image Analysis with the DMD in Convergent Path 收敛路径下的DMD图像分析

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Pub Date : 2018-08-01 DOI: 10.1109/3M-NANO.2018.8552188

Yong-qiang Sun, Yuan Hu, Yuegang Fu, Yueqi Wang, Qi Wang, Yu Zhao

{"title":"Image Analysis with the DMD in Convergent Path","authors":"Yong-qiang Sun, Yuan Hu, Yuegang Fu, Yueqi Wang, Qi Wang, Yu Zhao","doi":"10.1109/3M-NANO.2018.8552188","DOIUrl":"https://doi.org/10.1109/3M-NANO.2018.8552188","url":null,"abstract":"The digital micromirror device (DMD) which is one kind of Micro-Electro-Mechanical System has been widely adapted for use in lighting projection systems, and some new imaging systems such as high-dynamic range imaging, aperture-coded spectral imaging, or medical imaging. The micromirrors on the DMD surface are non-continuous distribution and capable of tilt relative to individual rotation axis, which is different from the plane mirror. Therefore, when the DMD is applied in a convergence imaging path, there is an optical path difference (OPD) between the off-axis chief ray and the on-axis chief ray, and moreover severe non-symmetric imaging on the focal plane. Based on the geometrical optics and aberration theory, this paper proposes a calculation formula that gives the OPD as a function of the image height, the incident angle, the DMD pixel size and the DMD tilt angle in the convergent imaging path. This formula can give the OPD of the system when the optical axis is vertical to the surface of the DMD in an ideal state, which has great significance to the design and adjustment of optical path using DMD devices.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"5 1","pages":"386-389"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90803397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0