J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino
{"title":"电泳法制备碳纳米管场效应晶体管的沉积与取向研究","authors":"J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino","doi":"10.1109/3M-NANO.2018.8552183","DOIUrl":null,"url":null,"abstract":"Semiconducting carbon nanotubes (CNTs) were dispersed ultrasonically in the Nmethyl-2-pyrrolidone (NMP) solvent, and were aligned and patterned with the alternating electric field-directed dielectrophoresis (DEP) method. CNT transistors were fabricated with the DEP-patterned semiconducting CNTs. Clean room-based micro- and nanofabrication techniques such as UV lithography and lift-off process were used to fabricate the CNT devices. The patterned semiconducting carbon nanotubes and fabricated transistors were imaged using the scanning electron microscope (SEM), and the current-voltage (IV) curves were obtained. It was found that the gap between the opposite electrodes affected the patterning of CNTs in the DEP process; the CNT transistors had excellent current-voltage (IV) curves of p-channel filedeffect transistors with high ratios of on/off source-drain current values, and the semiconducting CNTs could achieve a higher yield in the device fabrication.","PeriodicalId":6583,"journal":{"name":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"7 1","pages":"308-311"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Deposition and Alignment of Carbon Nanotubes with Dielectrophoresis for Fabrication of Carbon Nanotube Field-Effect Transistors\",\"authors\":\"J. Kimbrough, S. Chance, B. Whitaker, Z. Duncan, Kenneth Davis, Alandria Henderson, Zhigang Xiao, Qunying Yuan, F. Camino\",\"doi\":\"10.1109/3M-NANO.2018.8552183\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Semiconducting carbon nanotubes (CNTs) were dispersed ultrasonically in the Nmethyl-2-pyrrolidone (NMP) solvent, and were aligned and patterned with the alternating electric field-directed dielectrophoresis (DEP) method. CNT transistors were fabricated with the DEP-patterned semiconducting CNTs. Clean room-based micro- and nanofabrication techniques such as UV lithography and lift-off process were used to fabricate the CNT devices. The patterned semiconducting carbon nanotubes and fabricated transistors were imaged using the scanning electron microscope (SEM), and the current-voltage (IV) curves were obtained. It was found that the gap between the opposite electrodes affected the patterning of CNTs in the DEP process; the CNT transistors had excellent current-voltage (IV) curves of p-channel filedeffect transistors with high ratios of on/off source-drain current values, and the semiconducting CNTs could achieve a higher yield in the device fabrication.\",\"PeriodicalId\":6583,\"journal\":{\"name\":\"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)\",\"volume\":\"7 1\",\"pages\":\"308-311\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/3M-NANO.2018.8552183\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/3M-NANO.2018.8552183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Deposition and Alignment of Carbon Nanotubes with Dielectrophoresis for Fabrication of Carbon Nanotube Field-Effect Transistors
Semiconducting carbon nanotubes (CNTs) were dispersed ultrasonically in the Nmethyl-2-pyrrolidone (NMP) solvent, and were aligned and patterned with the alternating electric field-directed dielectrophoresis (DEP) method. CNT transistors were fabricated with the DEP-patterned semiconducting CNTs. Clean room-based micro- and nanofabrication techniques such as UV lithography and lift-off process were used to fabricate the CNT devices. The patterned semiconducting carbon nanotubes and fabricated transistors were imaged using the scanning electron microscope (SEM), and the current-voltage (IV) curves were obtained. It was found that the gap between the opposite electrodes affected the patterning of CNTs in the DEP process; the CNT transistors had excellent current-voltage (IV) curves of p-channel filedeffect transistors with high ratios of on/off source-drain current values, and the semiconducting CNTs could achieve a higher yield in the device fabrication.