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EPF-FDA: Efficient Pairing Free and Confidentiality Preserving Fog-Based Data Aggregation Scheme for WBANs EPF-FDA:一种有效的基于无配对和保密的雾的wban数据聚合方案
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292620
Jegadeesan Subramani, Maria Azees, Arun Sekar Rajasekaran, Fadi Al-Turjman
{"title":"EPF-FDA: Efficient Pairing Free and Confidentiality Preserving Fog-Based Data Aggregation Scheme for WBANs","authors":"Jegadeesan Subramani, Maria Azees, Arun Sekar Rajasekaran, Fadi Al-Turjman","doi":"10.1109/mim.2023.10292620","DOIUrl":"https://doi.org/10.1109/mim.2023.10292620","url":null,"abstract":"In remote health care monitoring systems, Wireless Body Area Networks (WBANs) play an important role. The recent COVID-19 pandemic situation reinforces the importance of such a system. In addition, sensitive Biological Information (BI) of the patient needs to be collected and processed securely in real-time. However, sharing BI through wireless channels creates privacy and security challenges. Many public key cryptography-based schemes are available in the literature to overcome these challenges. However, they are not efficient due to their expensive paring computation. Here we report a pairing-free and confidentiality-preserving fog-based data aggregation scheme to support delay-sensitive monitoring applications. Further, patients' BI can be analyzed at the Fog Nodes (FNs) securely to facilitate decision making. The comparisons of security and performance shows that the suggested scheme outperforms conventional methods by consuming less computational and communication overhead and provides essential security attributes.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"401 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135111839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
November Calendar 11月日历
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292597
{"title":"November Calendar","authors":"","doi":"10.1109/mim.2023.10292597","DOIUrl":"https://doi.org/10.1109/mim.2023.10292597","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"400 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135111842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Self-Powered Wireless Thermal Energy Meter Based on Piezoelectric Energy Harvester for Thermal Energy Measurement in a Residential Area 基于压电能量采集器的自供电无线热能计用于小区热能测量
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292618
Mehrdad Asadi, Hossein Sarabadani, Payam Qaderi-Baban
{"title":"Self-Powered Wireless Thermal Energy Meter Based on Piezoelectric Energy Harvester for Thermal Energy Measurement in a Residential Area","authors":"Mehrdad Asadi, Hossein Sarabadani, Payam Qaderi-Baban","doi":"10.1109/mim.2023.10292618","DOIUrl":"https://doi.org/10.1109/mim.2023.10292618","url":null,"abstract":"This paper presents a platform for a self-powered wireless energy meter device using piezoelectric energy harvesters. This device can be used for measuring the share of thermal energy consumption in a fair manner in a residential area with a central thermal energy system. In the suggested device, the piezoelectric energy harvester is also used as a flow meter to reduce the power consumption of the device which facilitates power self-powered operation of the device. The performance of the device is investigated based on a prototype which is used under a test condition with flow rate from 100 up to 200 liters per hour. Comparing the test results with those of recorded based on a standard Hall Effect flow meter as a reference sensor verifies the multi-function operation of piezoelectric energy harvester as a flow sensor within the device.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"402 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135112057","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Industrial Visual Inspection with TinyML for High-Performance Quality Control 工业视觉检测与TinyML高性能质量控制
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292593
Andrea Albanese, Davide Brunelli
{"title":"Industrial Visual Inspection with TinyML for High-Performance Quality Control","authors":"Andrea Albanese, Davide Brunelli","doi":"10.1109/mim.2023.10292593","DOIUrl":"https://doi.org/10.1109/mim.2023.10292593","url":null,"abstract":"In industrial processes, predictive maintenance or automated optical analysis of artifacts is fundamental to ensure high-quality products with low costs. However, this step is still done by sophisticated systems or human operators. Automating this process with low-cost solutions while keeping high product quality is one of the most challenging goals of the Industrial Internet of Things (IIoT). IIoT fosters an automation-based production model that uses machine data to enable faster, more flexible, and more efficient production lines [1], leading companies to produce higher-quality goods at lower costs.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"402 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135112059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research on the Recognition Algorithm of Circuit Board Welding Defects Based on Machine Vision 基于机器视觉的线路板焊接缺陷识别算法研究
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292622
Rui Wang, Peng Wang, Nan Chen, Yaoyuan Wang
{"title":"Research on the Recognition Algorithm of Circuit Board Welding Defects Based on Machine Vision","authors":"Rui Wang, Peng Wang, Nan Chen, Yaoyuan Wang","doi":"10.1109/mim.2023.10292622","DOIUrl":"https://doi.org/10.1109/mim.2023.10292622","url":null,"abstract":"To improve the defect detection ability of circuit boards and reduce the missed detection rate and false detection rate, a circuit board welding defect recognition algorithm based on machine vision is proposed. The system obtains the grayscale image of the circuit board to be tested through X-ray source, image intensifier and a Charge Coupled Device (CCD). Noise suppression is performed on all test images using a cumulative sampling noise reduction algorithm. The defect recognition algorithm is realized by using a standard template matching model with multi-angle image acquisition. By setting the best template matching parameter (BTM), the difference area extraction between the test image and the standard image is completed. Then, the calibration transformation of different perspectives is used to complete the iteration of the feature information of the defect area, and the ability of defect detection and identification is improved. The experiment is tested on 15 circuit board images with different types of defects. The results show that the missed detection rates of this algorithm for bridge defects, eccentric defects and solder joint bubble defects are 0.58%, 1.18%, 1.95%, and the false detection rates were 0.12%, 0.86%, 2.34%, respectively. It is significantly better than traditional algorithms. In terms of processing speed and maximum fitness, this algorithm is also slightly better than the two traditional algorithms. In conclusion, this algorithm can better complete the rapid identification of circuit board defect locations.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"401 9","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135112061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental Research on the Stability of Negative Temperature Coefficient Thermistors 负温度系数热敏电阻稳定性的实验研究
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292623
Haitao Wang
{"title":"Experimental Research on the Stability of Negative Temperature Coefficient Thermistors","authors":"Haitao Wang","doi":"10.1109/mim.2023.10292623","DOIUrl":"https://doi.org/10.1109/mim.2023.10292623","url":null,"abstract":"Four different types of negative temperature coefficient thermistors were tested at high temperatures for more than 1000 h to test their thermal stability. Moreover, these four types of negative temperature coefficient thermistors underwent up to 60 times for thermal shock testing. The thermistor temperature drift and change in B-value were observed throughout the testing. The findings reveal that adequate annealing can eliminate the stress of these newly designed thermistors. Additionally, long-term annealing produces sustained temperature drift in particular types of thermistors. The thermistors' temperature drift during the annealing process is typically less than 10 mK every 100 h. Thermal resistance drifts less than 5 mK after 60 instances of thermal shocks. The study makes manufacturing high-precision thermometers feasible, with test data ranging from 273.15 to 373.15 K.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"401 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135112060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Society Officers 社会人员
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI: 10.1109/mim.2023.10292594
{"title":"Society Officers","authors":"","doi":"10.1109/mim.2023.10292594","DOIUrl":"https://doi.org/10.1109/mim.2023.10292594","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"401 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135112062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cover Page 封面页
4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-10-01 DOI: 10.1109/mim.2023.10238375
{"title":"Cover Page","authors":"","doi":"10.1109/mim.2023.10238375","DOIUrl":"https://doi.org/10.1109/mim.2023.10238375","url":null,"abstract":"","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135170465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement Methodology 测量方法
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-10-01 DOI: 10.1109/MIM.2023.10238364
Ankita Dey, S. Rajan, G. Xiao, Jianping Lu
{"title":"Measurement Methodology","authors":"Ankita Dey, S. Rajan, G. Xiao, Jianping Lu","doi":"10.1109/MIM.2023.10238364","DOIUrl":"https://doi.org/10.1109/MIM.2023.10238364","url":null,"abstract":"With an increase in the population of older adults in developed nations globally, research on radar-based human activity recognition for reliable and accurate fall event detection has accelerated exponentially. Radars are safe, contactless, and privacy-preserving sensors that facilitate ‘aging in place.’ A plethora of research papers have been published in this field in the last five years. The primary goal of all research works is to recognize the human activities from the backscattered radar returns. Despite being a well-researched field, technology-transfer from lab to market is implausible due to several underlying issues that are yet to be addressed. These issues will serve as potential barriers when implementing the developed technologies in real-life. This article aims to reveal some of these issues that are important for successful technology-transfer of radar-based human activity recognition systems, and potential solutions to mitigate these issues are proposed.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"12-19"},"PeriodicalIF":2.1,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48216460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Instrumentation and Measurement Systems 仪器及测量系统
IF 2.1 4区 工程技术
IEEE Instrumentation & Measurement Magazine Pub Date : 2023-10-01 DOI: 10.1109/MIM.2023.10238387
S. Bader
{"title":"Instrumentation and Measurement Systems","authors":"S. Bader","doi":"10.1109/MIM.2023.10238387","DOIUrl":"https://doi.org/10.1109/MIM.2023.10238387","url":null,"abstract":"Technological development has through time changed and improved the way measurements are being performed. Starting from entirely mechanical designs, today's measurement instruments are electronic, computerized and, in many cases, connected. This has enabled a largely automated collection of physical quantities with high resolution and reliability. The recorded data may be used as the basis for decision making or may be utilized in closed-loop process control.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":"26 1","pages":"28-33"},"PeriodicalIF":2.1,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48228420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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