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Journal of Electronic Testing-Theory and Applications最新文献

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Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application 基于EPRNG的物联网应用AES架构的低面积FPGA实现
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-04-01 DOI: 10.1007/s10836-022-05997-x
N. Siva Balan, B. Murugan
{"title":"Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application","authors":"N. Siva Balan, B. Murugan","doi":"10.1007/s10836-022-05997-x","DOIUrl":"https://doi.org/10.1007/s10836-022-05997-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"181 - 193"},"PeriodicalIF":0.9,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52280934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process 磁流变阻尼力学性能及微探针测试过程性能研究
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-04-01 DOI: 10.1007/s10836-022-05998-w
Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li
{"title":"Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process","authors":"Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li","doi":"10.1007/s10836-022-05998-w","DOIUrl":"https://doi.org/10.1007/s10836-022-05998-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"195 - 203"},"PeriodicalIF":0.9,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48513276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications 用于图像处理应用的硬件高效近似乘法器体系结构
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-04-01 DOI: 10.1007/s10836-022-06000-3
Shravani Chandaka, Balaji Narayanam
{"title":"Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications","authors":"Shravani Chandaka, Balaji Narayanam","doi":"10.1007/s10836-022-06000-3","DOIUrl":"https://doi.org/10.1007/s10836-022-06000-3","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"217 - 230"},"PeriodicalIF":0.9,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42087771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications FAMCroNA:用于神经形态应用的记忆横杆故障分析
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-04-01 DOI: 10.1007/s10836-022-06001-2
Dev Narayan Yadav, P. L. Thangkhiew, K. Datta, Sandip Chakraborty, R. Drechsler, I. Sengupta
{"title":"FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications","authors":"Dev Narayan Yadav, P. L. Thangkhiew, K. Datta, Sandip Chakraborty, R. Drechsler, I. Sengupta","doi":"10.1007/s10836-022-06001-2","DOIUrl":"https://doi.org/10.1007/s10836-022-06001-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"145 - 163"},"PeriodicalIF":0.9,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42056152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Test Technology Newsletter 测试技术时事通讯
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-03-22 DOI: 10.1007/s10836-011-5264-1
{"title":"Test Technology Newsletter","authors":"","doi":"10.1007/s10836-011-5264-1","DOIUrl":"https://doi.org/10.1007/s10836-011-5264-1","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"27 1","pages":"683-684"},"PeriodicalIF":0.9,"publicationDate":"2022-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s10836-011-5264-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49446047","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test Technology Newsletter 测试技术通讯
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-03-22 DOI: 10.1007/s10836-006-9390-0
T. Theocharides
{"title":"Test Technology Newsletter","authors":"T. Theocharides","doi":"10.1007/s10836-006-9390-0","DOIUrl":"https://doi.org/10.1007/s10836-006-9390-0","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"7 - 8"},"PeriodicalIF":0.9,"publicationDate":"2022-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s10836-006-9390-0","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44241813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies 再论ADC线性度测试的直方图法:输入信号和输入频率与采样频率之比的检验
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-02-01 DOI: 10.1007/s10836-022-05988-y
Yujie Zhao, Kentaroh Katoh, A. Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, K. Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
{"title":"Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies","authors":"Yujie Zhao, Kentaroh Katoh, A. Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, K. Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa","doi":"10.1007/s10836-022-05988-y","DOIUrl":"https://doi.org/10.1007/s10836-022-05988-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"21 - 38"},"PeriodicalIF":0.9,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52280890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
New Editors – 2022 新编辑–2022
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-02-01 DOI: 10.1007/s10836-022-05992-2
Jie Han
{"title":"New Editors – 2022","authors":"Jie Han","doi":"10.1007/s10836-022-05992-2","DOIUrl":"https://doi.org/10.1007/s10836-022-05992-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"3 - 4"},"PeriodicalIF":0.9,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48647224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Hardware Obfuscation for IP Protection of DSP Applications DSP应用程序IP保护的硬件困惑
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-02-01 DOI: 10.1007/s10836-022-05984-2
N. R, N. M. Sivamangai, N. A, G. A. Nissi
{"title":"Hardware Obfuscation for IP Protection of DSP Applications","authors":"N. R, N. M. Sivamangai, N. A, G. A. Nissi","doi":"10.1007/s10836-022-05984-2","DOIUrl":"https://doi.org/10.1007/s10836-022-05984-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"9 - 20"},"PeriodicalIF":0.9,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49107295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design 一种低功耗三节点容扰锁存器设计
IF 0.9 4区 工程技术
Journal of Electronic Testing-Theory and Applications Pub Date : 2022-02-01 DOI: 10.1007/s10836-022-05989-x
Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang
{"title":"A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design","authors":"Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang","doi":"10.1007/s10836-022-05989-x","DOIUrl":"https://doi.org/10.1007/s10836-022-05989-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"63 - 76"},"PeriodicalIF":0.9,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43092523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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