G. Scott, D. Mariscal, D. Canning, R. Heeter, M. Krieger, R. Wallace, C. McGuffey, J. Peebles, R. Simpson, C. Stoeckl, T. Ma
{"title":"Demonstration of plasma mirror capability for the OMEGA Extended Performance laser system.","authors":"G. Scott, D. Mariscal, D. Canning, R. Heeter, M. Krieger, R. Wallace, C. McGuffey, J. Peebles, R. Simpson, C. Stoeckl, T. Ma","doi":"10.1063/5.0067467","DOIUrl":"https://doi.org/10.1063/5.0067467","url":null,"abstract":"A plasma mirror platform was developed for the OMEGA-EP facility to redirect beams, thus enabling more flexible experimental configurations as well as a platform that can be used in the future to improve laser contrast. The plasma mirror reflected a short pulse focusing beam at 22.5° angle of incidence onto a 12.5 μm thick Cu foil, generating Bremsstrahlung and kα x rays, and accelerating ions and relativistic electrons. By measuring these secondary sources, the plasma mirror key performance metrics of integrated reflectivity and optical quality are inferred. It is shown that for a 5 ± 2 ps, 310 J laser pulse, the plasma mirror integrated reflectivity was 62 ± 13% at an operating fluence of 1670 J cm-2, and that the resultant short pulse driven particle acceleration and x-ray generation indicate that the on target intensity was 3.1 × 1018 W cm-2, which is indicative of a good post-plasma mirror interaction beam optical quality. By deriving the plasma mirror performance metrics from the secondary source scalings, it was simultaneously demonstrated that the plasma mirror is ready for adoption in short pulse particle acceleration and high energy photon generation experiments using the OMEGA-EP system.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"39 1","pages":"043006"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89854553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Giudici, G. Acconcia, I. Labanca, M. Ghioni, I. Rech
{"title":"4 ns dead time with a fully integrated active quenching circuit driving a custom single photon avalanche diode.","authors":"A. Giudici, G. Acconcia, I. Labanca, M. Ghioni, I. Rech","doi":"10.1063/5.0087341","DOIUrl":"https://doi.org/10.1063/5.0087341","url":null,"abstract":"At the present time, Single Photon Avalanche Diodes (SPADs) are the enabling devices in many applications, ranging from medical imaging to laser ranging and from remote sensing to quantum key distribution. Even though they belong to different scientific domains, these applications share the need for a detector capable of attaining high count rates possibly without trading it off with other key detector's features, such as afterpulsing probability, photon detection efficiency, and dark counts. In this work, we present the characterization of a fast integrated active quenching circuit capable of driving high-performance external custom-technology SPADs for single photon detection in the visible wavelength range. Combining the prompt intervention of the electronic circuitry and the performance of a custom-technology SPAD, we attained count rates up to 250 MCps while keeping the afterpulsing probability within 2%.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"21 1","pages":"043103"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75191980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Laso Garcia, A. Hannasch, M. Molodtsova, A. Ferrari, J. P. Couperus Cadabağ, M. Downer, A. Irman, S. Kraft, J. Metzkes-Ng, L. Naumann, I. Prencipe, U. Schramm, K. Zeil, R. Zgadzaj, T. Ziegler, T. Cowan
{"title":"Calorimeter with Bayesian unfolding of spectra of high-flux broadband x rays.","authors":"A. Laso Garcia, A. Hannasch, M. Molodtsova, A. Ferrari, J. P. Couperus Cadabağ, M. Downer, A. Irman, S. Kraft, J. Metzkes-Ng, L. Naumann, I. Prencipe, U. Schramm, K. Zeil, R. Zgadzaj, T. Ziegler, T. Cowan","doi":"10.1063/5.0078443","DOIUrl":"https://doi.org/10.1063/5.0078443","url":null,"abstract":"We report the development of a multipurpose differential x-ray calorimeter with a broad energy bandwidth. The absorber architecture is combined with a Bayesian unfolding algorithm to unfold high energy x-ray spectra generated in high-intensity laser-matter interactions. Particularly, we show how to extract absolute energy spectra and how our unfolding algorithm can reconstruct features not included in the initial guess. The performance of the calorimeter is evaluated via Monte Carlo generated data. The method accuracy to reconstruct electron temperatures from bremsstrahlung is shown to be 5% for electron temperatures from 1 to 50 MeV. We study bremsstrahlung generated in solid target interaction showing an electron temperature of 0.56 ± 0.04 MeV for a 700 μm Ti titanium target and 0.53 ± 0.03 MeV for a 50 μm target. We investigate bremsstrahlung from a target irradiated by laser-wakefield accelerated electrons showing an endpoint energy of 551 ± 5 MeV, inverse Compton generated x rays with a peak energy of 1.1 MeV, and calibrated radioactive sources. The total energy range covered by all these sources ranges from 10 keV to 551 MeV.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"10 1","pages":"043102"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81864200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Transient abnormal signal acquisition system based on approximate entropy and sample entropy.","authors":"Jun Jiang, Shulin Tian, Yu Tian, Yi Zhou, Cong Hu","doi":"10.1063/5.0073423","DOIUrl":"https://doi.org/10.1063/5.0073423","url":null,"abstract":"In the field of time domain measurement, with increasing complexity of measured signals, the periodic stationarity of signals is destroyed and the transient non-stationarity starts to stand out, specifically manifested as frequent presence of transient abnormal signals, such as burrs, harmonics, noises, and modulating waves in the periodic signals. By applying the entropy estimation of signals to the field of time domain measurement, this paper designs a transient abnormal signal acquisition system based on approximate entropy (ApEn) and sample entropy (SampEn). In the process of data acquisition, the ApEn and SampEn of sampled data are computed in real time and the complexities of measured signals are differentiated, thus realizing abnormal signal detection. The experimental results demonstrate that SampEn generally has a higher sensitivity and wider application than ApEn in the detection process of transient abnormal signals. The study can provide a new method for the design of a time-domain measuring instrument with abnormal signal detection ability.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"6 1","pages":"044702"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87739404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pengcheng He, Yiping Liang, Wei Qi, L. Bai, Quanxin Zhou, J. Zhang
{"title":"A high voltage capacitance measurement method based on alternating coupled signal injection.","authors":"Pengcheng He, Yiping Liang, Wei Qi, L. Bai, Quanxin Zhou, J. Zhang","doi":"10.1063/5.0085871","DOIUrl":"https://doi.org/10.1063/5.0085871","url":null,"abstract":"As high voltage pulse power capacitors, ceramic capacitors are widely used in high voltage pulse generators, trigger circuits, laser generators, and other fields. The capacitance of ceramic capacitors is closely related to the direct current (DC) bias voltage. However, the current capacitance measurement methods can only achieve a DC bias of 1 kV, which cannot meet the measurement requirements in high voltage environments. This paper proposes a capacitance measurement method that can accurately measure the capacitance under a DC bias of 3 kV. This method decouples the high DC bias voltage and high frequency alternating small signals and realizes low voltage calibration and high voltage isolation. The experimental results show that the proposed method measures the capacitance under a DC bias of 3 kV with a relative error within ±1%, which makes it possible to accurately quantify the capacitance hysteresis deviation in the process of increasing and decreasing back the voltage.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"13 1","pages":"044704"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85880769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Tollkühn, P. J. Ritter, M. Schilling, B. Hampel
{"title":"THz microscope for three-dimensional imaging with superconducting Josephson junctions.","authors":"M. Tollkühn, P. J. Ritter, M. Schilling, B. Hampel","doi":"10.1063/5.0084207","DOIUrl":"https://doi.org/10.1063/5.0084207","url":null,"abstract":"Superconducting Josephson junctions have a wide range of applications ranging from quantum computing to voltage standards, and they may also be employed as versatile sensors for high-frequency radiation and magnetic fields. In this work, we present a unique measurement setup utilizing a single Josephson junction on a cantilever for high-resolution spatial measurements of spectroscopically resolved THz and microwave field distributions. This THz microscope can be utilized to measure power and frequency of electromagnetic radiation from ∼1 GHz to 5 THz. It may also be used to measure static magnetic fields and provide topological scans of samples. The samples can be both actively radiating or passively irradiated at either room temperature or cryogenic temperatures. We review the measurement setup of the THz microscope and describe the evaluation of its measurement data to achieve three-dimensional visualizations of the field distributions. The diverse capabilities of this unique tool are demonstrated by its different measurement modes with measurements of field distributions at 20 GHz and 1.4 THz, spectroscopically resolved THz measurements, and magnetic field measurements.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"15 1","pages":"043708"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86644804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ricardo Javier Peña Román, Y. Auad, Lucas Grasso, L. Padilha, F. Alvarez, I. Barcelos, M. Kociak, L. Zagonel
{"title":"Design and implementation of a device based on an off-axis parabolic mirror to perform luminescence experiments in a scanning tunneling microscope.","authors":"Ricardo Javier Peña Román, Y. Auad, Lucas Grasso, L. Padilha, F. Alvarez, I. Barcelos, M. Kociak, L. Zagonel","doi":"10.1063/5.0078423","DOIUrl":"https://doi.org/10.1063/5.0078423","url":null,"abstract":"We present the design, implementation, and illustrative results of a light collection/injection strategy based on an off-axis parabolic mirror collector for a low-temperature Scanning Tunneling Microscope (STM). This device allows us to perform STM induced Light Emission (STM-LE) and Cathodoluminescence (STM-CL) experiments and in situ Photoluminescence (PL) and Raman spectroscopy as complementary techniques. Considering the Étendue conservation and using an off-axis parabolic mirror, it is possible to design a light collection and injection system that displays 72% of collection efficiency (considering the hemisphere above the sample surface) while maintaining high spectral resolution and minimizing signal loss. The performance of the STM is tested by atomically resolved images and scanning tunneling spectroscopy results on standard sample surfaces. The capabilities of our system are demonstrated by performing STM-LE on metallic surfaces and two-dimensional semiconducting samples, observing both plasmonic and excitonic emissions. In addition, we carried out in situ PL measurements on semiconducting monolayers and quantum dots and in situ Raman on graphite and hexagonal boron nitride (h-BN) samples. Additionally, STM-CL and PL were obtained on monolayer h-BN gathering luminescence spectra that are typically associated with intragap states related to carbon defects. The results show that the flexible and efficient light injection and collection device based on an off-axis parabolic mirror is a powerful tool to study several types of nanostructures with multiple spectroscopic techniques in correlation with their morphology at the atomic scale and electronic structure.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"357 1","pages":"043704"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76340266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Lalande, P. Salou, A. Houel, T. Been, Thierry Birou, C. Bourin, A. Cassimi, A. Keizer, Jean-Baptiste Mellier, J. Ramillon, A. Sineau, A. Delobbe, S. Guillous
{"title":"Nanoscale multiply charged focused ion beam platform for surface modification, implantation, and analysis.","authors":"M. Lalande, P. Salou, A. Houel, T. Been, Thierry Birou, C. Bourin, A. Cassimi, A. Keizer, Jean-Baptiste Mellier, J. Ramillon, A. Sineau, A. Delobbe, S. Guillous","doi":"10.1063/5.0078914","DOIUrl":"https://doi.org/10.1063/5.0078914","url":null,"abstract":"The PELIICAEN (Platform for the Study of Ion Implantation Controlled and Analyzed at the Nanometric Scale) setup is a unique device, both for all of its in situ ultra-high vacuum equipment (focused ion beam column, secondary electron microscope, atomic force microscope, and scanning tunneling microscope) and for its nanostructuration performances on materials. The setup has been recently equipped with its own electron cyclotron resonance ion sources, a new position-controlled platform using pneumatic vibration insulators, and a fast pulsing device. Its performances were then deeply improved, providing access to a large choice of ions, an adjustable ion implantation depth up to a few hundred nanometers, an image resolution down to 25 nm, and an ion beam size on the sample down to 100 nm. With all this equipment, the PELIICAEN setup is in the international foreground to perform and analyze ion implantation and surface modification.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"150 1","pages":"043703"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75768672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lost electron energy distribution of electron cyclotron resonance ion sources.","authors":"I. Izotov, V. Skalyga, O. Tarvainen","doi":"10.1063/5.0075464","DOIUrl":"https://doi.org/10.1063/5.0075464","url":null,"abstract":"To ensure further progress in the development of electron cyclotron resonance ion sources (ECRISs), deeper understanding of the underlying physics is required. The electron energy distribution (EED), which is crucial for the performance of an ECRIS, still remains obscure. The present paper focuses on the details of a well-developed technique of measuring the EED of electrons escaping axially from the magnetically confined plasma of an ECRIS. The method allows for better than 500 eV energy resolution over a range of electron energies from 4 keV to over 1 MeV. We present detailed explanation of the experimental procedure and the following data processing peculiarities with examples and discuss possible reasons of energetic electron losses from the magnetic trap, in particular the role of RF pitch angle scattering. Finally, an experimental method of approximating the confined EED based on the measurement of escaping electrons is described.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"286 1","pages":"043501"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80291366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ya Huang, Li Jiang, H. Lei, G. Gao, Peng Wu, J. Zhang, Zhengyi Huang
{"title":"Magnetic field influence analysis on the large-caliber steady-state magnetic field testing system.","authors":"Ya Huang, Li Jiang, H. Lei, G. Gao, Peng Wu, J. Zhang, Zhengyi Huang","doi":"10.1063/5.0082972","DOIUrl":"https://doi.org/10.1063/5.0082972","url":null,"abstract":"The large-caliber steady-state magnetic field testing system is an important device for the International Thermonuclear Experimental Reactor, which is mainly used for electromagnetic compatibility tests in a strong magnetic field environment. Magnetic field performance is the most important parameter of equipment. In the design process, it is necessary to analyze the magnetic field performance and study the influencing factors. This paper mainly studies the axial and radial magnetic fields in the uniform region and the magnetic field characteristics in several typical cases and then analyzes the influence of external ferromagnetic materials and the environmental magnetic field in detail. Finally, an experimental platform is built for a three-dimensional hall test. The results verify the correctness of the analysis.","PeriodicalId":54761,"journal":{"name":"Journal of the Optical Society of America and Review of Scientific Instruments","volume":"74 1","pages":"044707"},"PeriodicalIF":0.0,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85818413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}